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Simple full spectral analysis
Materials Today Volume 16, Number 4 April 2013
TOOLS AND TECHNIQUES
Tools and Techniques Introducing StrobeLock, for time-resolved measurements WITec has recently launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the WITec alpha300 and alpha500 microscope series. StrobeLock facilitates the acquisition of additional material contrasts hidden in the time function of a fluorescence or luminescence signal and allows them to be perfectly linked with Raman, SNOM or AFM imaging. It enables a variety of measurement possibilities for an improved and more comprehensive understanding of a sample’s properties and is specifically suited for materials science. The modular design of the WITec microscopes facilitates userfriendly combination of the StrobeLock module with the WITec confocal microscope series. StrobeLock is comprised of a pulsed excitation laser system combined with a Time-Correlated SinglePhoton Counting (TCSPC) detector. The possibility to switch between time-resolved and conventional mode enables the microscope user to conveniently choose the preferred measurement technique. ‘StrobeLock complements the modular WITec microscope systems with customized solutions for the most accurate Fluorescence Lifetime Imaging and Time-Resolved Luminescence Microscopy.’ said Dr. Joachim Koenen, WITec co-founder and Managing Director ‘This exceptional development significantly extends the capabilities of the WITec microscope series and opens a new field of application for a more comprehensive sample characterization.’
Visit: http://www.witec.de 1369-7021/06/$ - see front matter http://dx.doi.org/10.1016/j.mattod.2013.04.022
Simple full spectral analysis Horiba Scientific has announced the launch of its new XploRA ONE Raman microscope. XploRA ONE offers simplicity, sensitivity and reliability for budget-conscious QA/QC and analytical labs in the industrial and routine analytical sectors. XploRA ONE offers ‘One-Shot’ full spectral analysis and programmable measurement templates for the Raman analysis and identification of samples. The intuitive interface enables a logical experiment workflow, from sample acquisition and visualization, measurement set up, data interpretation and final reports. The end result is a Raman microscope designed to optimize productivity and efficiency at the push of a button, without compromising features or results. The system includes auto-calibration and validation software to ensure data accuracy with ‘one shot’ operation. Spectral databases are also included for simple interpretation of results. Laser options are integrated internally (532 nm or 785 nm CLS high brightness) for optimized sub micron-resolved measurements. ‘‘XploRA One is ideally suited to routine and QC measurements of a host of applications, including polymers, pharmaceuticals, carbon nanotubes and coatings, graphene, semiconductors, geological and forensic samples,’’ said Andrew Whitley, VP of Sales for HORIBA Scientific. ‘‘As both a high performing microscope and Raman micro-spectrometer, the price tag makes it an especially attractive instrument for QA/QC chemists and analytical scientists who previously were not able to access this attractive technique.’’ Visit: http://www.horiba.com.
New AFM semiconductor characterization solution Bruker has announced the release of the Dimension Icon1 SSRMHR, a new atomic force microscope (AFM) configuration including the Scanning Spreading Resistance Microscopy (SSRM) module, designed specifically for high-resolution (HR) semiconductor characterization. Integrating Bruker’s Dimension Icon AFM platform with an environmental control system capable of 1 ppm gas purity and high-vacuum control, the Dimension Icon SSRM-HR system provides vastly improved repeatability and spatial resolution in semiconductor carrier profiling. As confirmed by Imec, buried gate ˚ are detected routinely. oxide layers as thin as 5 A ‘‘As our customers continue to improve their products to follow the semiconductor roadmap, higher spatial resolution electrical 147
TOOLS AND TECHNIQUES
Tools and Techniques Introducing StrobeLock, for time-resolved measurements WITec has recently launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the WITec alpha300 and alpha500 microscope series. StrobeLock facilitates the acquisition of additional material contrasts hidden in the time function of a fluorescence or luminescence signal and allows them to be perfectly linked with Raman, SNOM or AFM imaging. It enables a variety of measurement possibilities for an improved and more comprehensive understanding of a sample’s properties and is specifically suited for materials science. The modular design of the WITec microscopes facilitates userfriendly combination of the StrobeLock module with the WITec confocal microscope series. StrobeLock is comprised of a pulsed excitation laser system combined with a Time-Correlated SinglePhoton Counting (TCSPC) detector. The possibility to switch between time-resolved and conventional mode enables the microscope user to conveniently choose the preferred measurement technique. ‘StrobeLock complements the modular WITec microscope systems with customized solutions for the most accurate Fluorescence Lifetime Imaging and Time-Resolved Luminescence Microscopy.’ said Dr. Joachim Koenen, WITec co-founder and Managing Director ‘This exceptional development significantly extends the capabilities of the WITec microscope series and opens a new field of application for a more comprehensive sample characterization.’
Visit: http://www.witec.de 1369-7021/06/$ - see front matter http://dx.doi.org/10.1016/j.mattod.2013.04.022
Simple full spectral analysis Horiba Scientific has announced the launch of its new XploRA ONE Raman microscope. XploRA ONE offers simplicity, sensitivity and reliability for budget-conscious QA/QC and analytical labs in the industrial and routine analytical sectors. XploRA ONE offers ‘One-Shot’ full spectral analysis and programmable measurement templates for the Raman analysis and identification of samples. The intuitive interface enables a logical experiment workflow, from sample acquisition and visualization, measurement set up, data interpretation and final reports. The end result is a Raman microscope designed to optimize productivity and efficiency at the push of a button, without compromising features or results. The system includes auto-calibration and validation software to ensure data accuracy with ‘one shot’ operation. Spectral databases are also included for simple interpretation of results. Laser options are integrated internally (532 nm or 785 nm CLS high brightness) for optimized sub micron-resolved measurements. ‘‘XploRA One is ideally suited to routine and QC measurements of a host of applications, including polymers, pharmaceuticals, carbon nanotubes and coatings, graphene, semiconductors, geological and forensic samples,’’ said Andrew Whitley, VP of Sales for HORIBA Scientific. ‘‘As both a high performing microscope and Raman micro-spectrometer, the price tag makes it an especially attractive instrument for QA/QC chemists and analytical scientists who previously were not able to access this attractive technique.’’ Visit: http://www.horiba.com.
New AFM semiconductor characterization solution Bruker has announced the release of the Dimension Icon1 SSRMHR, a new atomic force microscope (AFM) configuration including the Scanning Spreading Resistance Microscopy (SSRM) module, designed specifically for high-resolution (HR) semiconductor characterization. Integrating Bruker’s Dimension Icon AFM platform with an environmental control system capable of 1 ppm gas purity and high-vacuum control, the Dimension Icon SSRM-HR system provides vastly improved repeatability and spatial resolution in semiconductor carrier profiling. As confirmed by Imec, buried gate ˚ are detected routinely. oxide layers as thin as 5 A ‘‘As our customers continue to improve their products to follow the semiconductor roadmap, higher spatial resolution electrical 147