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Simplifying X-ray spectroscopy
TOOLS & TECHNIQUES UPDATE
X-ray detector with wide dynamic range The PIXcel detector from PANalytical is designed for the most advanced X-ray diffraction applications in materials research. The high-end photon counting device incorporates new solid-state detector technology to provide superior resolution, a large dynamic range, and high count rate linearity. The PIXcel detector’s performance comes from over 65 000 pixels, each 55 µm x 55 µm in size. Every pixel has its own readout circuitry to give a dynamic range of >25 million counts per second per pixel row. As a result, beam attenuators are no longer necessary. Contact: www.panalytical.com
SEM pairs up with FIB A new dual-beam microscope combining a focused ion beam (FIB) system with a scanning electron microscope (SEM) has been launched by FEI Company. The Helios NanoLab™ DualBeam™ instrument allows the three-dimensional characterization, analysis, and image reconstruction of samples at very high resolution. It can also be used in nanofabrication and testing applications or in preparation of samples for analysis by transmission electron microscopy. The microscope features a new field-emission SEM column offering high-resolution imaging along with FEI’s existing Sidewinder™ FIB column and gas chemistries. Contact: www.fei.com
Simplifying X-ray spectroscopy EDAX has introduced TEXS HP, a new parallel beam X-ray spectrometer (PBS) for wavelength-dispersive X-ray microanalysis. PBSs offer greater sensitivity than curved crystal X-ray spectrometers but have tended to be difficult to use and often face problems in positioning the optics and sample accurately. TEXS HP is operated as if it were an energy-dispersive system, making it easier and more familiar for most users. An xyz optic positioner has also been developed to move the optic accurately and reproducibly to within 1 µm of the optimal position using software with an autofocus routine. Contact: www.edax.com
Detectors offer fast microanalysis Two new detectors from Oxford Instruments are designed for microanalysis applications. INCAPentaFET-x3 is a Si(Li) detector with a 30 mm2 detecting crystal that has the same resolution as a conventional 10 mm2 crystal. It gives faster results, or better quality data for the same analysis time, without compromising resolution or performance. INCAx-act is the first available analytical drift detector. It combines the speed of a Si drift detector with the precision and accuracy of an external field-effect transistor and digital pulse processing. Where high count rates are generated, INCAx-act can provide energydispersive X-ray data in seconds. Contact: www.oxford-instruments.com
Peaks and troughs in surface analysis Alicona Imaging has updated its InfiniteFocus optical system for making three-dimensional surface measurements. Version 2 includes new software and hardware features that improve measurements of surface profiles and roughness. InfiniteFocus works by combining the small depth of focus of an optical system with vertical scanning to create a single three-dimensional picture of the sample with accurate topographical and color information. The resolution in the z-axis can be as low as 20 nm. Defining a profile path on a sample image allows roughness values to be calculated, virtual cross sections to be generated, and angles, circles, and height to be measured. Surface areas and texture can be defined, and peaks and troughs analyzed.
Combined expertise in a nanotechnology workstation The NVision 40 is the latest addition to the range of CrossBeam® workstations that combine scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities. Suitable for nanoscale imaging, structuring, and analysis, NVision 40 has been developed jointly by Carl Zeiss SMT and SII NanoTechnology. The system is based on Carl Zeiss’ ULTRA platform with a GEMINI® e-beam column. Two in-lens detectors can record secondary and backscattered electrons simultaneously, even at low acceleration voltages and short working distances. The workstation is also equipped with SII’s zeta FIB column and a single-injector, multichannel gas injection system for subsurface defect analysis and nanostructuring applications. It offers a resolution of 4 nm and high current densities.
Version 2 of InfiniteFocus is supplied as standard with new instruments and is available as an update for existing systems. Contact: www.alicona.com
Perpendicular indentation with AFM precision Asylum Research has introduced a new NanoIndenter module for use with its MFP-3D atomic force microscope (AFM) system. The module is designed to bridge the gap between conventional nanoindenters and AFMs. Unlike cantilever-based indenters used in other AFMs, the NanoIndenter drives the indenting tip perpendicular to the sample. This avoids nonorthogonality issues associated with this type of measurement. In contrast to standard nanoindentation systems, the tip displacement and force are measured with near-AFM precision.
The design of the e-beam column allows SEM imaging during FIB milling for better control of the process. NVision 40 also supports the automated preparation of samples for transmission electron microscopy.
The NanoIndenter can be used to analyze elastic and inelastic behavior, dislocation phenomena, fractures, residual stresses, and time-dependent mechanical characteristics in a range of hard and soft materials and thin films.
Contact: www.smt.zeiss.com and www.siint.com/en
Contact: www.asylumresearch.com
OCTOBER 2006 | VOLUME 9 | NUMBER 10
63
X-ray detector with wide dynamic range The PIXcel detector from PANalytical is designed for the most advanced X-ray diffraction applications in materials research. The high-end photon counting device incorporates new solid-state detector technology to provide superior resolution, a large dynamic range, and high count rate linearity. The PIXcel detector’s performance comes from over 65 000 pixels, each 55 µm x 55 µm in size. Every pixel has its own readout circuitry to give a dynamic range of >25 million counts per second per pixel row. As a result, beam attenuators are no longer necessary. Contact: www.panalytical.com
SEM pairs up with FIB A new dual-beam microscope combining a focused ion beam (FIB) system with a scanning electron microscope (SEM) has been launched by FEI Company. The Helios NanoLab™ DualBeam™ instrument allows the three-dimensional characterization, analysis, and image reconstruction of samples at very high resolution. It can also be used in nanofabrication and testing applications or in preparation of samples for analysis by transmission electron microscopy. The microscope features a new field-emission SEM column offering high-resolution imaging along with FEI’s existing Sidewinder™ FIB column and gas chemistries. Contact: www.fei.com
Simplifying X-ray spectroscopy EDAX has introduced TEXS HP, a new parallel beam X-ray spectrometer (PBS) for wavelength-dispersive X-ray microanalysis. PBSs offer greater sensitivity than curved crystal X-ray spectrometers but have tended to be difficult to use and often face problems in positioning the optics and sample accurately. TEXS HP is operated as if it were an energy-dispersive system, making it easier and more familiar for most users. An xyz optic positioner has also been developed to move the optic accurately and reproducibly to within 1 µm of the optimal position using software with an autofocus routine. Contact: www.edax.com
Detectors offer fast microanalysis Two new detectors from Oxford Instruments are designed for microanalysis applications. INCAPentaFET-x3 is a Si(Li) detector with a 30 mm2 detecting crystal that has the same resolution as a conventional 10 mm2 crystal. It gives faster results, or better quality data for the same analysis time, without compromising resolution or performance. INCAx-act is the first available analytical drift detector. It combines the speed of a Si drift detector with the precision and accuracy of an external field-effect transistor and digital pulse processing. Where high count rates are generated, INCAx-act can provide energydispersive X-ray data in seconds. Contact: www.oxford-instruments.com
Peaks and troughs in surface analysis Alicona Imaging has updated its InfiniteFocus optical system for making three-dimensional surface measurements. Version 2 includes new software and hardware features that improve measurements of surface profiles and roughness. InfiniteFocus works by combining the small depth of focus of an optical system with vertical scanning to create a single three-dimensional picture of the sample with accurate topographical and color information. The resolution in the z-axis can be as low as 20 nm. Defining a profile path on a sample image allows roughness values to be calculated, virtual cross sections to be generated, and angles, circles, and height to be measured. Surface areas and texture can be defined, and peaks and troughs analyzed.
Combined expertise in a nanotechnology workstation The NVision 40 is the latest addition to the range of CrossBeam® workstations that combine scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities. Suitable for nanoscale imaging, structuring, and analysis, NVision 40 has been developed jointly by Carl Zeiss SMT and SII NanoTechnology. The system is based on Carl Zeiss’ ULTRA platform with a GEMINI® e-beam column. Two in-lens detectors can record secondary and backscattered electrons simultaneously, even at low acceleration voltages and short working distances. The workstation is also equipped with SII’s zeta FIB column and a single-injector, multichannel gas injection system for subsurface defect analysis and nanostructuring applications. It offers a resolution of 4 nm and high current densities.
Version 2 of InfiniteFocus is supplied as standard with new instruments and is available as an update for existing systems. Contact: www.alicona.com
Perpendicular indentation with AFM precision Asylum Research has introduced a new NanoIndenter module for use with its MFP-3D atomic force microscope (AFM) system. The module is designed to bridge the gap between conventional nanoindenters and AFMs. Unlike cantilever-based indenters used in other AFMs, the NanoIndenter drives the indenting tip perpendicular to the sample. This avoids nonorthogonality issues associated with this type of measurement. In contrast to standard nanoindentation systems, the tip displacement and force are measured with near-AFM precision.
The design of the e-beam column allows SEM imaging during FIB milling for better control of the process. NVision 40 also supports the automated preparation of samples for transmission electron microscopy.
The NanoIndenter can be used to analyze elastic and inelastic behavior, dislocation phenomena, fractures, residual stresses, and time-dependent mechanical characteristics in a range of hard and soft materials and thin films.
Contact: www.smt.zeiss.com and www.siint.com/en
Contact: www.asylumresearch.com
OCTOBER 2006 | VOLUME 9 | NUMBER 10
63