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Some aspects of component reliability
Eh'ctronic~ Relhzbility & 31icrominiaturizatwn
Pergamon Press 1963. Vol. 2, pp. 77-80. Printed in Great Britain
ABSTRACTS ON E L E C T R O N I C S R E L I A B I L I T Y AND MICROMINIATURIZATION
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS
Electrolytic capacitors and their reliability. A. A. NEw, P.O. Elect. Engrs'. J. 55, No. 2, I15-124 (1961). The principles of operation of electrolytic capacitors are discussed, and the various types at present available are described and their properties considered. Failure rates, calculated from accelerated life tests, are given for certain types of capacitors, and recommendations are made for improving the reliability of electrolytic capacitors in telecommunications equipment. S o m e aspects of c o m p o n e n t reliability. J. G. ASSENHEIM,Brit. Communicat. Electron. 8, 179-IS2 (1961.) Discusses component failures and their relationship to life tests. The paper stresses the importance of operating conditions in component reliability. The types of components (and typical failure rate ranges) discussed are transistors (0.04-0.4 per cent per 1000 hr), semiconductor diodes (0-02-0"1 per cent per 1000 hr), capacitors (0"003-0"3 per cent per 1000 hr) and resistors (0"002-0-01 per cent per 1000 hr). The "Rate-of-Change" factor in reliability. P. HOLDEN, Electro-Technology, 69, No. 1, 53-63 (1962). Reliability tests of components yield data consisting of parameter values before and after the tests. A method is described for studying the significant rates of change in addition to the absolute values of these parameters.
Significance of selection methods for obtaining electronic components for industrial purposes. W. RICHTER, Nachrichtentechnik 12, No. 3, 90-94 (1962). A general discussion on reliability of active components (tubes and transistors) for industrial equipment and particularly for nuclear instrumentation. A number of specific examples of tube and transistor choices and tests is quoted, and some current practices in U.S.A. and U.K. are briefly discussed. (In German.) Component reliability in Post Office e q u i p m e n t . A. A. NEW, P.O. Elect. Engrs'. J. 54, 40-47 (196l). If component parts are to be improved by re-design or a new start, the failure mechanisms must be known. Failures may be caused by chemical, physical, mechanical, or other processes. The immediate environment of a part is very important in determining its behaviour. For many processes, a change in temperature of 10°C produces a change by a factor of 2-3 in deterioration rate. Humidity may cause chemical or galvanic corrosion. The voltage on capacitors and the current through resistors are important. For alloy transistors... Proving long-term reliability. J. H. SCRIVNER and J. R. WILLEY, Electr. Ind. 21, No. 5, 102-106 (1962). At the start of 1959, long term life tests were commenced on two types of transistors--the 2N396 and 2N397. The number tested was 10,050 and the test duration was 10,000 hr. Results show that the 2N397 failure rate was essentially constant after a 1000 hr interval, with a slight peaking at 3000 hr. The 2N396 showed one failure per 1000 hr for the 10,000 units after a 3000 hr interval. "Second Breakdown" in transistors. H. A. SCHAFFT and J. C. FRENCH, I R E Trans. on Electron Dec'ices, ED-9, No. 2, 129-136 (1962). "Second breakdown" in transistors has been characterized as an abrupt reduction in Vee, at a collector current designated by Ira, when the transistor is swept through its Vee versus lee characteristics. A critical review of the literature concerning this phenomenon and a more complete description of its characteristics are given. Evaluation of electron tubes reliability based upon frequency of damages being equivalent to relative changes of characteristics. S. FIRKOWlCZ, Bull. Acad. Polonaise Sci. (Distribution Centre for Scientific Publications, Palac Kultury i Nauki, Warsaw, Poland) 9, No. 10, 571-575 (1961). Tube performances can be considered in two classes. In the first class, the tube is permanently damaged, 77
Eh'ctronic~ Relhzbility & 31icrominiaturizatwn
Pergamon Press 1963. Vol. 2, pp. 77-80. Printed in Great Britain
ABSTRACTS ON E L E C T R O N I C S R E L I A B I L I T Y AND MICROMINIATURIZATION
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS
Electrolytic capacitors and their reliability. A. A. NEw, P.O. Elect. Engrs'. J. 55, No. 2, I15-124 (1961). The principles of operation of electrolytic capacitors are discussed, and the various types at present available are described and their properties considered. Failure rates, calculated from accelerated life tests, are given for certain types of capacitors, and recommendations are made for improving the reliability of electrolytic capacitors in telecommunications equipment. S o m e aspects of c o m p o n e n t reliability. J. G. ASSENHEIM,Brit. Communicat. Electron. 8, 179-IS2 (1961.) Discusses component failures and their relationship to life tests. The paper stresses the importance of operating conditions in component reliability. The types of components (and typical failure rate ranges) discussed are transistors (0.04-0.4 per cent per 1000 hr), semiconductor diodes (0-02-0"1 per cent per 1000 hr), capacitors (0"003-0"3 per cent per 1000 hr) and resistors (0"002-0-01 per cent per 1000 hr). The "Rate-of-Change" factor in reliability. P. HOLDEN, Electro-Technology, 69, No. 1, 53-63 (1962). Reliability tests of components yield data consisting of parameter values before and after the tests. A method is described for studying the significant rates of change in addition to the absolute values of these parameters.
Significance of selection methods for obtaining electronic components for industrial purposes. W. RICHTER, Nachrichtentechnik 12, No. 3, 90-94 (1962). A general discussion on reliability of active components (tubes and transistors) for industrial equipment and particularly for nuclear instrumentation. A number of specific examples of tube and transistor choices and tests is quoted, and some current practices in U.S.A. and U.K. are briefly discussed. (In German.) Component reliability in Post Office e q u i p m e n t . A. A. NEW, P.O. Elect. Engrs'. J. 54, 40-47 (196l). If component parts are to be improved by re-design or a new start, the failure mechanisms must be known. Failures may be caused by chemical, physical, mechanical, or other processes. The immediate environment of a part is very important in determining its behaviour. For many processes, a change in temperature of 10°C produces a change by a factor of 2-3 in deterioration rate. Humidity may cause chemical or galvanic corrosion. The voltage on capacitors and the current through resistors are important. For alloy transistors... Proving long-term reliability. J. H. SCRIVNER and J. R. WILLEY, Electr. Ind. 21, No. 5, 102-106 (1962). At the start of 1959, long term life tests were commenced on two types of transistors--the 2N396 and 2N397. The number tested was 10,050 and the test duration was 10,000 hr. Results show that the 2N397 failure rate was essentially constant after a 1000 hr interval, with a slight peaking at 3000 hr. The 2N396 showed one failure per 1000 hr for the 10,000 units after a 3000 hr interval. "Second Breakdown" in transistors. H. A. SCHAFFT and J. C. FRENCH, I R E Trans. on Electron Dec'ices, ED-9, No. 2, 129-136 (1962). "Second breakdown" in transistors has been characterized as an abrupt reduction in Vee, at a collector current designated by Ira, when the transistor is swept through its Vee versus lee characteristics. A critical review of the literature concerning this phenomenon and a more complete description of its characteristics are given. Evaluation of electron tubes reliability based upon frequency of damages being equivalent to relative changes of characteristics. S. FIRKOWlCZ, Bull. Acad. Polonaise Sci. (Distribution Centre for Scientific Publications, Palac Kultury i Nauki, Warsaw, Poland) 9, No. 10, 571-575 (1961). Tube performances can be considered in two classes. In the first class, the tube is permanently damaged, 77
Pergamon Press 1963. Vol. 2, pp. 77-80. Printed in Great Britain
ABSTRACTS ON E L E C T R O N I C S R E L I A B I L I T Y AND MICROMINIATURIZATION
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS
Electrolytic capacitors and their reliability. A. A. NEw, P.O. Elect. Engrs'. J. 55, No. 2, I15-124 (1961). The principles of operation of electrolytic capacitors are discussed, and the various types at present available are described and their properties considered. Failure rates, calculated from accelerated life tests, are given for certain types of capacitors, and recommendations are made for improving the reliability of electrolytic capacitors in telecommunications equipment. S o m e aspects of c o m p o n e n t reliability. J. G. ASSENHEIM,Brit. Communicat. Electron. 8, 179-IS2 (1961.) Discusses component failures and their relationship to life tests. The paper stresses the importance of operating conditions in component reliability. The types of components (and typical failure rate ranges) discussed are transistors (0.04-0.4 per cent per 1000 hr), semiconductor diodes (0-02-0"1 per cent per 1000 hr), capacitors (0"003-0"3 per cent per 1000 hr) and resistors (0"002-0-01 per cent per 1000 hr). The "Rate-of-Change" factor in reliability. P. HOLDEN, Electro-Technology, 69, No. 1, 53-63 (1962). Reliability tests of components yield data consisting of parameter values before and after the tests. A method is described for studying the significant rates of change in addition to the absolute values of these parameters.
Significance of selection methods for obtaining electronic components for industrial purposes. W. RICHTER, Nachrichtentechnik 12, No. 3, 90-94 (1962). A general discussion on reliability of active components (tubes and transistors) for industrial equipment and particularly for nuclear instrumentation. A number of specific examples of tube and transistor choices and tests is quoted, and some current practices in U.S.A. and U.K. are briefly discussed. (In German.) Component reliability in Post Office e q u i p m e n t . A. A. NEW, P.O. Elect. Engrs'. J. 54, 40-47 (196l). If component parts are to be improved by re-design or a new start, the failure mechanisms must be known. Failures may be caused by chemical, physical, mechanical, or other processes. The immediate environment of a part is very important in determining its behaviour. For many processes, a change in temperature of 10°C produces a change by a factor of 2-3 in deterioration rate. Humidity may cause chemical or galvanic corrosion. The voltage on capacitors and the current through resistors are important. For alloy transistors... Proving long-term reliability. J. H. SCRIVNER and J. R. WILLEY, Electr. Ind. 21, No. 5, 102-106 (1962). At the start of 1959, long term life tests were commenced on two types of transistors--the 2N396 and 2N397. The number tested was 10,050 and the test duration was 10,000 hr. Results show that the 2N397 failure rate was essentially constant after a 1000 hr interval, with a slight peaking at 3000 hr. The 2N396 showed one failure per 1000 hr for the 10,000 units after a 3000 hr interval. "Second Breakdown" in transistors. H. A. SCHAFFT and J. C. FRENCH, I R E Trans. on Electron Dec'ices, ED-9, No. 2, 129-136 (1962). "Second breakdown" in transistors has been characterized as an abrupt reduction in Vee, at a collector current designated by Ira, when the transistor is swept through its Vee versus lee characteristics. A critical review of the literature concerning this phenomenon and a more complete description of its characteristics are given. Evaluation of electron tubes reliability based upon frequency of damages being equivalent to relative changes of characteristics. S. FIRKOWlCZ, Bull. Acad. Polonaise Sci. (Distribution Centre for Scientific Publications, Palac Kultury i Nauki, Warsaw, Poland) 9, No. 10, 571-575 (1961). Tube performances can be considered in two classes. In the first class, the tube is permanently damaged, 77
Eh'ctronic~ Relhzbility & 31icrominiaturizatwn
Pergamon Press 1963. Vol. 2, pp. 77-80. Printed in Great Britain
ABSTRACTS ON E L E C T R O N I C S R E L I A B I L I T Y AND MICROMINIATURIZATION
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS
Electrolytic capacitors and their reliability. A. A. NEw, P.O. Elect. Engrs'. J. 55, No. 2, I15-124 (1961). The principles of operation of electrolytic capacitors are discussed, and the various types at present available are described and their properties considered. Failure rates, calculated from accelerated life tests, are given for certain types of capacitors, and recommendations are made for improving the reliability of electrolytic capacitors in telecommunications equipment. S o m e aspects of c o m p o n e n t reliability. J. G. ASSENHEIM,Brit. Communicat. Electron. 8, 179-IS2 (1961.) Discusses component failures and their relationship to life tests. The paper stresses the importance of operating conditions in component reliability. The types of components (and typical failure rate ranges) discussed are transistors (0.04-0.4 per cent per 1000 hr), semiconductor diodes (0-02-0"1 per cent per 1000 hr), capacitors (0"003-0"3 per cent per 1000 hr) and resistors (0"002-0-01 per cent per 1000 hr). The "Rate-of-Change" factor in reliability. P. HOLDEN, Electro-Technology, 69, No. 1, 53-63 (1962). Reliability tests of components yield data consisting of parameter values before and after the tests. A method is described for studying the significant rates of change in addition to the absolute values of these parameters.
Significance of selection methods for obtaining electronic components for industrial purposes. W. RICHTER, Nachrichtentechnik 12, No. 3, 90-94 (1962). A general discussion on reliability of active components (tubes and transistors) for industrial equipment and particularly for nuclear instrumentation. A number of specific examples of tube and transistor choices and tests is quoted, and some current practices in U.S.A. and U.K. are briefly discussed. (In German.) Component reliability in Post Office e q u i p m e n t . A. A. NEW, P.O. Elect. Engrs'. J. 54, 40-47 (196l). If component parts are to be improved by re-design or a new start, the failure mechanisms must be known. Failures may be caused by chemical, physical, mechanical, or other processes. The immediate environment of a part is very important in determining its behaviour. For many processes, a change in temperature of 10°C produces a change by a factor of 2-3 in deterioration rate. Humidity may cause chemical or galvanic corrosion. The voltage on capacitors and the current through resistors are important. For alloy transistors... Proving long-term reliability. J. H. SCRIVNER and J. R. WILLEY, Electr. Ind. 21, No. 5, 102-106 (1962). At the start of 1959, long term life tests were commenced on two types of transistors--the 2N396 and 2N397. The number tested was 10,050 and the test duration was 10,000 hr. Results show that the 2N397 failure rate was essentially constant after a 1000 hr interval, with a slight peaking at 3000 hr. The 2N396 showed one failure per 1000 hr for the 10,000 units after a 3000 hr interval. "Second Breakdown" in transistors. H. A. SCHAFFT and J. C. FRENCH, I R E Trans. on Electron Dec'ices, ED-9, No. 2, 129-136 (1962). "Second breakdown" in transistors has been characterized as an abrupt reduction in Vee, at a collector current designated by Ira, when the transistor is swept through its Vee versus lee characteristics. A critical review of the literature concerning this phenomenon and a more complete description of its characteristics are given. Evaluation of electron tubes reliability based upon frequency of damages being equivalent to relative changes of characteristics. S. FIRKOWlCZ, Bull. Acad. Polonaise Sci. (Distribution Centre for Scientific Publications, Palac Kultury i Nauki, Warsaw, Poland) 9, No. 10, 571-575 (1961). Tube performances can be considered in two classes. In the first class, the tube is permanently damaged, 77