- Email: [email protected]
Spectrometric identification of organic compounds. Third edition
21,496-499(1976)
MICROCHEMICALJOURNAL
BOOK REVIEWS Spectrometric
Identification
M. SILVERSTEIN,G. CLAYTON 1974. 340 pp. $13.95.
of Organic BASSLER,
Compounds.
AND TERENCE
Third C. MORRILL.
By ROBERT Wiley, New York,
Edition.
This is the third edition of the excellent text dealing with spectrometric identification of organic compounds, the first two editions being authored by Drs. Silverstein and Bassler. The book assumes no prior knowledge of spectrometry and is primarily an introduction to the spectral interpretation for the determination of organic structures. Although the topics covered are the same as in the previous editions (namely, Mass Spectrometry, Infrared Spectrometry, Nuclear Magnetic Resonance, Ultraviolet Spectrometry, Sets of Spectra Translated into Compounds, and Sets of Spectra with Beilstein References), all sections have been expanded to clarify basic concepts. This is particularly true of the chapter on nuclear magnetic resonance, which has added sections on shift reagents and carbon-13 NMR. The chapter, previously included in the other editions, namely, “Sets of Spectra, Unidentified,” has been omitted. An Instructor’s Supplement will be made available, which will contain a new set of problems. In short, the book is a “must” for libraries and anyone dealing with organic compounds, synthesizing, or analyzing. AL
Rutgers
Physical
Aspects
sored by the
of Electron
ELECTRON
Microscopy
MICROSCOPY
ANALYSIS SOCIETY. Edited by BENJAMIN New York, 1975. xiii + 474 pp. $32.50.
Department of Chemistry, Newark, New Jersey 07102
STEYERMARK,
University,
and Microbeam SOCIETY
M.
SIEGEL
OF AMERICA
and
DONALD
Jointly sponand the MICROBEAM R. BEAMAN. Wiley,
Analysis.
The book is a collaborative effort by 30 authors, the book being divided into two parts. The first of these is entitled “Transmission Electron Microscopy” and the second is entitled “Microbeam Analysis.” Each section has subtitles to cover the fields. Actually, the contributions are expanded versions of the invited papers presented by the authors at the Thirty-first Annual Meeting of the Electron Microscopy Society of America and the Eighth National Conference of the Microbeam Analysis Society. In regard to the first part of the book, the topics covered fall under the general headings of “Resolution and Contrast,” “ Physical Applications (Materials and Metallurgical Applications) Using High Voltage, Conventional, and Scanning Microscopy,” “Biophysical: Radiation Damage,” “Engery Analysis,” and “Instrumentation: Field Emission Illuminating Systems.” Under each of these general headings is a number of articles, such as, “Resolution and Contrast in the Scanning Transmission Electron Microscope,” “The Resolution and Contrast in Biological Sections Determined by Inelastic Scattering,” “Radiation Damage in Biological Materials,” and “Dispersion of Solid-State Excitations,” to mention some. Under the general heading of “Microbeam Analysis,” are such titles as, “Electron Probe Microanalysis of Transmission Electron Microscope, ” “Some Limitations of Energy DisCopyright@ 1976by Academic Press. Inc. All rights of reproduction in any form reserved.
MICROCHEMICALJOURNAL
BOOK REVIEWS Spectrometric
Identification
M. SILVERSTEIN,G. CLAYTON 1974. 340 pp. $13.95.
of Organic BASSLER,
Compounds.
AND TERENCE
Third C. MORRILL.
By ROBERT Wiley, New York,
Edition.
This is the third edition of the excellent text dealing with spectrometric identification of organic compounds, the first two editions being authored by Drs. Silverstein and Bassler. The book assumes no prior knowledge of spectrometry and is primarily an introduction to the spectral interpretation for the determination of organic structures. Although the topics covered are the same as in the previous editions (namely, Mass Spectrometry, Infrared Spectrometry, Nuclear Magnetic Resonance, Ultraviolet Spectrometry, Sets of Spectra Translated into Compounds, and Sets of Spectra with Beilstein References), all sections have been expanded to clarify basic concepts. This is particularly true of the chapter on nuclear magnetic resonance, which has added sections on shift reagents and carbon-13 NMR. The chapter, previously included in the other editions, namely, “Sets of Spectra, Unidentified,” has been omitted. An Instructor’s Supplement will be made available, which will contain a new set of problems. In short, the book is a “must” for libraries and anyone dealing with organic compounds, synthesizing, or analyzing. AL
Rutgers
Physical
Aspects
sored by the
of Electron
ELECTRON
Microscopy
MICROSCOPY
ANALYSIS SOCIETY. Edited by BENJAMIN New York, 1975. xiii + 474 pp. $32.50.
Department of Chemistry, Newark, New Jersey 07102
STEYERMARK,
University,
and Microbeam SOCIETY
M.
SIEGEL
OF AMERICA
and
DONALD
Jointly sponand the MICROBEAM R. BEAMAN. Wiley,
Analysis.
The book is a collaborative effort by 30 authors, the book being divided into two parts. The first of these is entitled “Transmission Electron Microscopy” and the second is entitled “Microbeam Analysis.” Each section has subtitles to cover the fields. Actually, the contributions are expanded versions of the invited papers presented by the authors at the Thirty-first Annual Meeting of the Electron Microscopy Society of America and the Eighth National Conference of the Microbeam Analysis Society. In regard to the first part of the book, the topics covered fall under the general headings of “Resolution and Contrast,” “ Physical Applications (Materials and Metallurgical Applications) Using High Voltage, Conventional, and Scanning Microscopy,” “Biophysical: Radiation Damage,” “Engery Analysis,” and “Instrumentation: Field Emission Illuminating Systems.” Under each of these general headings is a number of articles, such as, “Resolution and Contrast in the Scanning Transmission Electron Microscope,” “The Resolution and Contrast in Biological Sections Determined by Inelastic Scattering,” “Radiation Damage in Biological Materials,” and “Dispersion of Solid-State Excitations,” to mention some. Under the general heading of “Microbeam Analysis,” are such titles as, “Electron Probe Microanalysis of Transmission Electron Microscope, ” “Some Limitations of Energy DisCopyright@ 1976by Academic Press. Inc. All rights of reproduction in any form reserved.