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Spectroscopic apparatus for exetremely faint light
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New Patents
4980640 METHOD OF AND DEVICE FOR DETERMINING SPECTRUM PARAMETERS OF A SPECTRUM RELATED TO SPECTROSCOPIC SIGNALS Dirk Van Ormondt, Ronald De Beer, Wilhelmus W F Pijnappel, Delft, Netherlands assigned to U S Philips Corporation A method of and device for the determination with high computational efficiency of spectrum parameters of a spectrum utilizes quantification and model fitting of sampling values of a signal in the time domain on the basis of a model funcdamped exponentially tion comprising sinusoids. The method starts with a coarse estimation of a number of spectrum parameters, followed by linearization of the model function and iterative estimation of the coarsely estimated parameters and further parameters, utilizing a least-squares optimization procedure where inner product terms are brought into analytic form and are preferably recursively determined.
4981357 SPECTROPHOTOMETER HAVING FUNCTIONS OF BOTH A DOUBLE-MONOCHROMATER AND A SINGLEMONOCHROMATER Sadao Minakawa, Yoshisada Ebata, Mito, Japan assigned to Hitachi Ltd A spectrophotometer having functions of both of a double-monochromator and a singlemonochromator including a light source, a first spectroscope having a first slit through which light from the light source passes and a first dispersion element for dispersing the light from the first slit, a second spectroscope having a second
slit for receiving light dispersed from the first dispersion element for dispersing the light from the second slit, and a third slit for receiving the light dispersed from the second dispersion element. A sample compartment is provided for transmitting the light from the first dispersion element or from the third slit directly to a detector or through a sample to the detector. An optical unit is provided for changing transmitting light paths between a first light path for transmitting the light from the first dispersion element to the sample compartment through a fourth slit and a second light path for transmitting the light from the third slit to the sample compartment. A length of a light path from the first dispersion element to the second slit is equal to a length of a light path from the first dispersion element to the fourth slit.
4983041 SPECTROSCOPIC APPARATUS FOR EXTREMELY FAINT LIGHT Fumio Inaba, Yagiyamaminami, Sedai shi, Miyagi ken, Japan The present invention relates to a photocounting Fourier spectroscopic apparatus which enables spectroscopic detection of extremely fine emission light seen in a living-body specimen or the like as bioluminescence, chemiluminescence, and duoroescence from a living-body specimen. A light from a specimen which emits an extremely faint light is guided to an interferometer. A two-dimensional photon counter is used as an interference fringe detector. The twodimensional photo counting device counts the number of incident photons to form an image. The obtained image is subjected to Fourier analysis to thereby obtain spectral information about the incident light. A double beam interferometer, a triangular common path interferometer, a Michelson interferometer and other interferometers are used.
For informationabout PATSEARCH Pergamon Orbit InfoLine Inc. 8000 Westpark Drive McLean, VA 22102 USA Telephone (703) 442-0900 Telex: 09-1811
Pergamon Orbit InfoLine Ltd 12 Vandy Street London EC2A 2DE UK Telephone (071) 377-4650 Telex: 8814614
New Patents
4980640 METHOD OF AND DEVICE FOR DETERMINING SPECTRUM PARAMETERS OF A SPECTRUM RELATED TO SPECTROSCOPIC SIGNALS Dirk Van Ormondt, Ronald De Beer, Wilhelmus W F Pijnappel, Delft, Netherlands assigned to U S Philips Corporation A method of and device for the determination with high computational efficiency of spectrum parameters of a spectrum utilizes quantification and model fitting of sampling values of a signal in the time domain on the basis of a model funcdamped exponentially tion comprising sinusoids. The method starts with a coarse estimation of a number of spectrum parameters, followed by linearization of the model function and iterative estimation of the coarsely estimated parameters and further parameters, utilizing a least-squares optimization procedure where inner product terms are brought into analytic form and are preferably recursively determined.
4981357 SPECTROPHOTOMETER HAVING FUNCTIONS OF BOTH A DOUBLE-MONOCHROMATER AND A SINGLEMONOCHROMATER Sadao Minakawa, Yoshisada Ebata, Mito, Japan assigned to Hitachi Ltd A spectrophotometer having functions of both of a double-monochromator and a singlemonochromator including a light source, a first spectroscope having a first slit through which light from the light source passes and a first dispersion element for dispersing the light from the first slit, a second spectroscope having a second
slit for receiving light dispersed from the first dispersion element for dispersing the light from the second slit, and a third slit for receiving the light dispersed from the second dispersion element. A sample compartment is provided for transmitting the light from the first dispersion element or from the third slit directly to a detector or through a sample to the detector. An optical unit is provided for changing transmitting light paths between a first light path for transmitting the light from the first dispersion element to the sample compartment through a fourth slit and a second light path for transmitting the light from the third slit to the sample compartment. A length of a light path from the first dispersion element to the second slit is equal to a length of a light path from the first dispersion element to the fourth slit.
4983041 SPECTROSCOPIC APPARATUS FOR EXTREMELY FAINT LIGHT Fumio Inaba, Yagiyamaminami, Sedai shi, Miyagi ken, Japan The present invention relates to a photocounting Fourier spectroscopic apparatus which enables spectroscopic detection of extremely fine emission light seen in a living-body specimen or the like as bioluminescence, chemiluminescence, and duoroescence from a living-body specimen. A light from a specimen which emits an extremely faint light is guided to an interferometer. A two-dimensional photon counter is used as an interference fringe detector. The twodimensional photo counting device counts the number of incident photons to form an image. The obtained image is subjected to Fourier analysis to thereby obtain spectral information about the incident light. A double beam interferometer, a triangular common path interferometer, a Michelson interferometer and other interferometers are used.
For informationabout PATSEARCH Pergamon Orbit InfoLine Inc. 8000 Westpark Drive McLean, VA 22102 USA Telephone (703) 442-0900 Telex: 09-1811
Pergamon Orbit InfoLine Ltd 12 Vandy Street London EC2A 2DE UK Telephone (071) 377-4650 Telex: 8814614