SUBJECT INDEX TO VOLUMES I AND II*

SUBJECT I N D E X T O VOLUMES I A N D II *

Abbe-theory, 355, 357, 359 Aberration, 356, 359, 360 chromatic, 360, 362, 363, 391, 528 spherical, 357, 359, 360, 362, 363, 365,366,367,391 Absorbing potential, 58 Absorption

Back focal plane, 358, 359, 363, 365 scattering, 384, 503 Bain strain, 258, 287, 260 Band structure, 566, 567, 795, 798 Beam divergence, 360, 363, 391, 392 7-, 146 Bend contour, 346, 476 Berg-Barrett reflection technique, 631, 675, 736 Bethe potential, 466 Black dot contrast, 198, 185 white contrast, 186, 190, 193, 198, 199, 202, 207, 288 Bloch wave, 461, 467, 470, 496, 159, 160, 163, 169, 469, 194, 384, 566, 719, 792 Born approximation, 15, 16, 17, 6, 195 Borrmann effect, 62, 635, 722, 724, 749 triangle, 729 Bragg conditions, 9, 46, 55, 153, 384, 465, 566, 594, 720, 723, 724, 726,731 peaks, 565 Williams, 576, 582 Brillouin zone boundaries, 463, 496 Burgers vector, 94, 180, 666, 675

coefficient, 718,41 effect, 471, 14 function, 364 topography, 690 Activation energy, 837, 800, 801 Adatoms, 560, 571,572, 573, 575, 581, 582 Adsorption, 41, 56, 557, 566, 569, 572, 573, 574, 575, 576, 579, 580, 581, 582,583,585, 797 Anomalous absorption, 60, 474 transmission method, 740, 633 transmission topography, 743 Antiferromagnets, 576, 620 Antiphase boundary, 108 domains, 574, 575, 583 Aperture effective, 363 Atomic scattering amplitude, 45, 460 factor, 562 Atom-probe analysis, 821, 826, 842, 843, 844 Auger electrons, 557, 808 electron spectroscopy (AES), 553, 557, 580

Catalytic phenomena, 583, 827 Cavity, 133 small-, 211 Channeling effect, 62, 481 Charge density, 368 exchange model, 820

* Diffraction and Imaging Techniques in Material Science is published in two volumes: page numbers 1-454 refer to Volume I and page numbers 455-848 refer to Volume II. xi

xii

SUBJECT INDEX

Chemisorption, 581, 583, 584, 827, 842 Ouster, 177, 178,439 centro-symmetric, 441 model, 177, 178, 439 non-centro-symmetric, 441 predominant, 440 relation, 439,441 small-defect, 185, 215 Co-adsorption, 583, 584 Coherence, 360 Coherent particle, 224 Coincidence lattice, 842 structure, 570, 571 Column approximation, 30, 74, 169, 170, 484,492 Complex faults, 109 Computed image, 352 micrographs, 315-353 Continuous radiation methods, 628, 629 Contrast calculation, 190, 193 formation, 764 Converging beam method, 425, 478 Critical voltage effect, 542, 425, 479 Crystal defects, 70, 355 growth, 672 potential, 13 Crystallographic shear plane, 108 Dauphine twins, 112, 141 Dark field imaging, 220, 321, 153 de Broglie wavelength, 355, 554, 797, 811, 813 Debeye model, 576 scattering, 436 temperature, 577, 578, 569 -Waller factor, 577, 578, 460 Defect identification, 315-353 Defocus, 212, 360, 361, 363, 365, 366, 367, 391 Deformable ion approximation, 484 Desorption, 585 Deviation parameter, 404, 36, 43, 49

Diffraction amplitude, 383, 386, 387, 390 pattern, 355, 357, 359, 368, 370, 556 Diffusion coefficient, 830 Diffuse scattering, 243, 429, 494, 495, 607 thermal - - , 4 9 9 , 576 Direct image, 373, 743 integrating method, 389, 390, 391 structure imaging, 355-393 Disc of confusion, 360 Dislocation, 32, 74, 88, 155, 161, 319, 664, 665, 731, 837 edge, 163, 170, 174, 177 contrast, 751 core, 155, 158, 170, 179 density, 672 dipole, 326 dissociation, 172, 180 image, 155, 751 in organic crystals, 678 in refractory oxides and in semiconductors, 675 loops, 341, 155, 186, 190, 207 loops (small-), 193, 199, 202 modes, 172 partial, 98,153, 155, 172, 180, 839 screw, 162, 170 stair-rod, 329 superlattice, 155, 323 Dispersion surface, 50, 462, 467, 489, 721, 722, 723,724, 731 Displacement disorder, 429, 435, 610 field, 316, 344 function, 29 vector, 108, 146, 149 Domain boundaries, 110, 121, 685 contrast, 148 Double -crystal methods, 631 -diffraction, 222 Dynamical calculation, 391 interaction, 14, 15, 29

SUBJECT INDEX two-beam theory, 40, 209 theory, 43-106, 715, 716, 457, 462, 469,27 Dynamic images, 748, 749 Edge loop, 177 Elasticity anisotropic, 316 isotropic, 162 Electron π-, 808 attenuation length, 554 core scattering, 567 damping, 568 gun design, 513, 779 impact desorption, 572 irradiation damage, 181, 206 multiplier detector, 821, 823 transmission, 519, 523 Electronic intensification, 699 mirror surface, 791, 814, 825 Electrostatic contrast, 770 Coulomb force, 13 perturbation, 775 Emission electron microscope, 762 pattern, 795 Emulsion sensitivity, 513 Energy loss, 518, 525 spectroscopy, 557 Energy resolution, 578, 795 spectrum, 823 Ewald sphere, 10, 368, 385, 469, 558, 559, 722 waves, 719 Excitation error, 15, 385, 389 of plasmons, 557 Extinction, 55 contrast, 625, 626, 628 distance, 21, 25, 33, 35, 36, 46, 348, 465,466,479,662 effect, 716 thickness contour, 37

xiii

Faraday collector, 555, 556, 798 Fault surfaces, 679 vector, 679 7Γ-, 81 see also stacking fault Fermi gas, 811 level, 791, 826 surface, 452, 826 Ferrimagnetic crystal, 689 Ferroelectric domain walls, 731 Ferromagnetic crystals, 620 domain walls, 731 Field emission, 791, 795, 799 emission microscope, 811, 819, 791-810 evaporation, 81 1, 818, 824, 825, 831 ionisation, 81 1, 812, 815, 824, 826, 827 ion microscopy, 234, 802, 811 -847 ion pattern, 816 Film growth, 579 Focused mirror microscope, 781 Fourier components, 357 inversion techniques, 570 transform, 358, 359, 363, 365, 597 Frank dislocation loop, 193, 197, 202, 207,329 Fraunhofer diffraction, 748, 358 Free electron approximation, 792 Fresnel diffraction, 748 Friedel's law, 139 Fringe pattern, 124, 125 Fringes π-, 129 α-, 125 δ-, 129, 149, 87 mixed, 133 Gas-surface interactions, 831 Gaussian image plane, 360, 367 Goniometer stage, 368 Grain boundaries, 240, 839 Green's function, 807 Gun brightness, 514

xiv

SUBJECT INDEX

Half-tone pictures, 356, 392 Hartree-Fock approximation, 807 Heisenberg uncertainty principle, 797 Heterogeneous catalysis, 597 High resolution electron microscopy, 153, 356,363,377,647 High voltage electron microscopy, 511-549, 247, 300,425 High energy electron diffraction, 457-509 High voltage supply, 513 Howie-Whelan system, 114, 318, 385 Huang scattering, 436 Huyghens principle, 358 Inclusion, 74, 100 Incommensurate structure, 570 Inelastic collision, 566 electron spectroscopy, 578 Infinitesimally small loop approximation, 192, 208 Infra-red absorption spectroscopy, 557 Illuminating system, 777 Inner potential, 566, 569 Inside-outside contrast, 209 Integrated intensity, 716, 732 Intensity distribution, 556 profile, 335, 556 Interbranch scattering, 736, 751, 752 Interband scattering, 160 Interfaces, 107 planar - , 107-151 Intermediary image, 752 Intermediate lens, 779 Interstitials, 832, 833, 835, 837, 842 Invariant plane strain, 260 Inversion boundaries, 107, 111, 115, 120 contrast, 139 Image distortion, 781 formation, 5, 357, 363, 366 force theory, 819, 824 intensification, 513, 822 matching, 330, 331

Imaging code, 356, 373, 374, 379, 381, 382 process, 358 system, 779 Ion core scattering, 566, 568, 569 detector, 823 irradiation, 205 neutralisation spectroscopy, 557 Irradiated crystal, 185-215 Ising model, 576 Jogs, 155 Kelvin method, 557 Kikuchi band, 416 electron diffraction, 399-427 line, 97, 399, 400,425, 481, 493 map, 408, 409,410,417 pattern, 17, 169, 172, 401 Kinematical condition, 15, 210, 563 diffraction theory, 7-41, 558 image, 162, 669 theory, 6, 25, 26, 27, 29, 32, 43, 53, 156, 158, 162, 170, 171, 387, 429,565,569,576,577, 715, 716 Lang's method, 738, 740 Lattice imaging, 144, 245, 346 imperfection, 832 vibration, 309, 566 Laue case, 12,46, 51, 724, 726 conditions, 558, 564 Leed (Low energy electron diffraction), 501,831,553-589 Line images, 142 of no contrast, 200 Long period superstructure, 109 Long-range interaction, 583

SUBJECT INDEX order, 433, 580 strain, 731, 732 Lorentz point, 722 Low angle boundary, 679, 839 energy electron diffraction (LEED), 553-589 Magnetic domain boundaries, 679 scattering, 617 transitions, 559 Many beam diffraction, 158, 386 dynamical theory, 161, 162, 466 Martensitic transformation, 251-314 Marmen effect, 252 Mass spectrometer, 821, 824 Micro-analysis, 147 Microdiffraction, 304, 543 Microdomain, 245 Microfocus X-ray tubes, 628 Micro precipitates, 677 Microtwin, 134 Mirror electron microscope, 761-788 projection microscope, 764 Misfit dislocation, 237 Misorientation (effective - ) , 733 Mixed interfaces, 111 layers compounds, 143 Moire fringes, 87, 180, 346,693 topography, 693,695 Molecular images, 807 Monochromator, 401 Muffin-tin potential, 569 Multi domain crystal, 686 Multiphase structure, 218 Multiple diffraction, 29, 346, 572 diffraction kinematical, 33 scattering, 567, 568, 569, 577 Multislice method, 386, 390, 391 Neutron diffraction, 593-621 irradiation, 205

xv

Non-centro symmetrical crystal, 117 Nuclear scattering, 615 Objective lens, 779 Occupation vector, 432 One-beam kinematical theory, 29, 33, 40 One-electron excitation, 554 Oppenheimer's perturbation theory, 804 Optical diffraction simulation, 356, 381, 585 Order-disorder transitions, 567, 582, 429-453 Ordering temperature, 433 Orientation contrast, 625, 626 determination, 407 variants, 107, 148 Oscillating crystal, 691 Overlapping domain boundaries, 139 stacking faults, 337 translation interfaces, 136 Overlayer structures, 581 Oxidation, 579, 583, 584 Parallel-beam method, 645, 740 Paramgentic crystals, 614 Paraxial ray description, 360 Partially coherent phases, 23 7 Path integral formalism, 386 scattering approximation, 387, 390 Patterson analysis, 377, 382, 570, 598 Pauling's rules, 439 Peak position, 161 Penetration, 500, 518, 531, 532, 535, 511 Pendellosung effect, 54, 56, 67, 156, 465, 569, 660,661,734, 755 Phase contrast microscopy, 365 grating, 363, 367, 370, 386, 387 object, 365 shift, 360,364, 567,569 transitions, 217-249 Photographic emulsion, 649 Photomicrography, 655 Physisorption, 581 Plasmon excitations, 497, 554

xvi

SUBJECT INDEX

Point defects, 832 clusters, 155, 176, 181 Point resolution, 383 Poisson equation, 367 's ratio, 170 Polymers, 543 Polysynthetic twin structures, 143 Polytypism, 377, 381, 382, 690 Post-diffraction acceleration, 555 Precipitates, 225, 346, 731, 842 Pretransformation instabilities, 253, 309 Projected charge density, 366, 367, 370 crystal structure, 356 potential, 366 Projection topograph, 631, 635, 638, 670, 740 lens, 780 Propagation equation, 717 Pseudopotential model, 803 Quartz, 112, 141 Radiation damage, 541 Rearrangement collision theory, 804 Reciprocal lattice, 368, 556, 600 Reciprocity theorem, 485 Reconstruction, 559, 572, 579 Reflected waves, 719 Reflection electron microscope, 762 settings, 736 sphere, 10, 33 Refracted wave, 719 Renninger settings, 737 Residual fringe pattern, 145 Response matrix, 116 Resolution, 355, 359, 360, 366, 379, 518,529, 530,647,699 microscopy, 172 Resolving power, 355, 362, 363 angular, 736 spatial, 736, 737 Resonance tunneling, 802, 808 Retarding potential analysis, 795, 799, 807,814 Reversed contrast, 666 Rheed, 553

Rigid ion approximation, 488 Rocking curves, 53, 65, 476, 477, 732 Runge-Kutta-method, 390 Rutile, 143 Satellite spots, 572 Scanning electron microscopy, 761, 763 Scattering amplitude, 716 elastic, 520 inelastic, 399, 493, 494, 501, 557, 569,578,620 cross-sections, 554, 565 factor, 573, 597, 616 vector, 432 Screen response, 513 Scherzer, defocus, 364, 366, 368, 370, 379, 383 Schlieren technique, 763, 766 Schottky effect, 792 hump, 819 Schrodinger equation, 384, 458, 482, 767 Segregations, 842 Selected area diffraction, 218 Self-interstitials, 837 Shape change, 261 strain, 255 Shockley partial, 172 Short range order (S.R.O.), 229, 243, 433, 608 Shear component, 193, 207 structures, 108, 143, 382 transformation, 251, 265 Single scattering, 519, 563 Size-density distribution, 181 Size displacement effect, 436 Slip process, 261 Small angle scattering, 604 defect clusters, 185-215 Space group, 356, 373 Spinodal decomposition, 235 Stacking fault, 72, 75, 79, 85, 108, 680 681, 731, 754,839 energies, 155 tetrahedra, 177, 341

SUBJECT INDEX Stereo microscopy, 200, 202, 420, 641 Strain centre, 192, 199 field, 162, 177 Streaking, 575 Streaming, 309 Structure factor, 595 contrast, 141,488, 689 Structure images, 355-396 Sturkey, 385 Substitutional disorder, 429 Superlattice dislocation, 155, 332 Superstructure, 230, 243, 563, 570, 571, 831 Surface diffusion, 830 lattice dynamics, 577 migration, 800, 831 morphology, 580 rearrangement, 830 reflection topographs, 627 relief, 294 segregation, 580 selfdiffusion, 800, 801 strains, 691 Susceptibility, 716, 718 Syntaxy, 381 Systematic extinction, 573 Thermal vibrations, 568, 578 Thick foil approximation, 196 Thickness extinction contours, 53, 56, 60,65 Through focus series, 368 Tie-point, 719, 720, 723, 724, 726 Time-of-flight system, 821, 823 Top and bottom effect, 539 Topographic contrast, 774 methods, 736 perturbation, 775 resolution, 647 techniques, 732 Topographs direct beam - , 645 limited projection, 634, 644 section, 631, 635, 638, 640, 740 reflection, 631

xvii

Topography, 781 Transition state, 438, 439 Translation interfaces, 144 Transmission electron microscope, 185, 763, 766 function, 358, 363, 368 settings, 738 topographs, 627 Traverse topographs, 740 Tunneling, 826 Tweed structure, 242 Twin interface, 109, 120, 148, 731 Twinning, 261, 690 vector, 148 Two-beam approximation, 27, 50, 53, 113, 346, 463,465 dynamical theory, 53, 113 kinematical theory, 36 Upper-layer-lines, 387, 388, 389, 390, 391 U.V. photoemission, 553, 557, 572 Vacancies, 574, 832, 833, 835 Vacancy clusters, 100 Vacuum layer, 117 Van der Waals interactions, 581 Variant, 107 Vibrational excitation, 808 Viewing screen, 516 Voids, 133, 341 Warren-Cowley short range order parameters, 434 Wave-field, 719 Wave function, 384, 391 Wavelength spread, 647 Weak-beam technique, 210, 246,153-183 WKB approximation, 804, 792, 815, 826 Work function, 557, 572, 582, 585, 791, 793, 798, 819 X-ray diffraction, 374, 377, 382, 593-621 projection microscope, 629 radiation protection, 513 topography, 623-714, 715-757