- Email: [email protected]
The bipolar LSI breakthrough, Part 2: Extending the limits
20
World Abstracts on Microelectronics and Reliability
encourage quality managers and engineers to re-examine the economics of their present program of lot sampling, process sampling and audits.
Reliability criteria for experimental programs. R. J. ALLEN. PrOC. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 98. This paper proposes reliability guidelines/criteria to be used on Experimental Programs. These guidelines and recommendations are based on the work of several, but in particular, two Reliability Programs: (1) The Minuteman Missile System, a large design, development and production Program; and, (2) The Integrated Propulsion Control System (IPCS), an Exploratory Research Program. Experimental Programs should have many of the same reliability criteria by which large programs are controlled. The requirements should be exacting, but specifically defined within the specialized needs of the program and encompass only those elements necessary to justify the dollar cost of reliability. The objectives of an Experimental Program may never be accomplished or at best be compromised if the Experimental System is not highly reliable. On IPCS, criteria were developed, in addition to those imposed by contract, to provide a theoretically, high reliability system.
Elimination of fault sources, an efficient aid to quality ~lbtrov~lltelllk W. ROMMERSKIRCH. Feinwerktechnik & Messtechnik 83, 212 (1975). (In German). The quality standards demanded nowadays cannot be secured any more with the conventional types of quality control. Instead, comprehensive measures vouching for high q~ a1~ty are needed at all phases of production. Nor c,~'.J the necessary degree of quality be achieved and maintained by a few single steps, for it calls for an entire range of interacting activities. A measure is described in this paper which has been adopted successfully in a Swiss company making high-precision machine tools.
A case study approach to the reliability of shipborne electronic systems. P. L. SHOVE and I. E. G. GILROY. Microelectron. and Reliab. 14, 57 (1975). This case study compares the variability between several reliability prediction techniques and failure rate lists. The results were compared against Fleet experience taking into account the anomalies of the reporting system. Maintainability is also predicted and the accuracy of the results compared with Fleet data. The study indicates that standard prediction techniques should be used for both reliability and maintainability and recommends, for reliability, the one which produces the minimum error related to the Fleet environment. The case study concludes by a comparison of the resultant availabilities.
4. M I C R O E L E C T R O N I C S - - G E N E R A L
Recent SOS technology, advances and applications. RAN. S. RONEN and FRANK B. MICHELETTI. Solid State Technology. August 1975. Current SOS technology is described and several significant developments in the past five years are highlighted. Recent interest in SOS has been high both for conventional commercial applications, such as high performance CMOS switching circuits and memories, and for many special requirements that cannot be filled by other technologies, particularly in military systems. The latter applications include radiation hardened MOS and MNOS computer electronics, and linear systems such as amplifiers and power supplies. They also include high-performance signal-processing systems utilizing high speed digital electronics or analog high-frequency Surface Acoustic Wave (SAW) Programmable Tapped Delay Lines (PTDL's) e.g. matched filters, in the commercial area, SOS circuits are mostly advocated for high speed, high performance applications. However, some projections indicate that SOS technology can be cost competitive with equivalent bulk silicon technology, due to increased packing density, easier processing, and significantly simpler topography in specific applications due to the inherent dielectric isolation. However, this has yet 5. M I C R O E L E C T R O N I C S The bipolar LSI breakthrough, Part 1: Rethinking the problem. HORST H. I BERGER and SIEGFRIED K. WIEDMANN. Electronics p~, 89 (Sept. 1975). Complex processing, extravagent use of space and excessive power dissipation impeded the bipolar transistor's move into LSI: basic redesign eliminates large resistors, simplifies gate structure, needs only four-mask process. The bipolar LSI breakthrough, Part 2: ExtendiLg the limits. HORST H. BERGER and SIEGFRIEDK. W1EDMANN. Electronics p. 99 (Oct. 1975). Now that they have the basic structure of merged-transistor logic well in hand, designers are looking for ways of boosting performance to the highest levels without complicating the process too much.
to be demonstrated. Progress in the SOS area depends heavily on improvement in the material, rather than invention of novel circuit concepts or new process technologies. Specific circuits that illustrate current applica tions at Rockwell are discussed, together with the major process technologies involved. Extensive reference material is cited.
Monoliffiics mature, passives improve. LUCINDA MAqq'ERA. Electronics. p. 116. (October, 1975). As in many areas, the major developments in components of late are due largely to improvements in integrated-circuit technology. There is, for example--to cite probably the most notable achievement of the past year---the first complete monolithic analog-to-digital converter. Without ion implantation and other refinements in IC technology, this component would not be available. To a great extent the same is true of other data converters, as well as opera~ tional amplifiers, resistor networks, and virtually the whole gamut of active and passive components. Whatever the driving technology may be. today's state of the art in components is impressive DESIGN
AND
CONSTRUCTION
Logic network synthesis using digital-summation threshold-logic gates. S. L. HURST. MicroeIectronics 6. 42 1975). The recently-developed digital-summanon threshold-logic (DSTL) gate will be introduced, and lib advantages and disadvantages briefly discussed in comparison with previous analogne-type threshold-logic gates. Some typical applications will be shown indicating package and pin savings in random-logxc networks. Consideration of optimum universal package specifications for random-logic work will be mentioned. RAM, ROM, PROM dreuits for simple imao,e processing. M. J. D. WILSON and I. ALEKSANDER.Microelectronics 6, 30 (1975). Image processing is a field which has always suffered from being technologically ahead of its time.
World Abstracts on Microelectronics and Reliability
encourage quality managers and engineers to re-examine the economics of their present program of lot sampling, process sampling and audits.
Reliability criteria for experimental programs. R. J. ALLEN. PrOC. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 98. This paper proposes reliability guidelines/criteria to be used on Experimental Programs. These guidelines and recommendations are based on the work of several, but in particular, two Reliability Programs: (1) The Minuteman Missile System, a large design, development and production Program; and, (2) The Integrated Propulsion Control System (IPCS), an Exploratory Research Program. Experimental Programs should have many of the same reliability criteria by which large programs are controlled. The requirements should be exacting, but specifically defined within the specialized needs of the program and encompass only those elements necessary to justify the dollar cost of reliability. The objectives of an Experimental Program may never be accomplished or at best be compromised if the Experimental System is not highly reliable. On IPCS, criteria were developed, in addition to those imposed by contract, to provide a theoretically, high reliability system.
Elimination of fault sources, an efficient aid to quality ~lbtrov~lltelllk W. ROMMERSKIRCH. Feinwerktechnik & Messtechnik 83, 212 (1975). (In German). The quality standards demanded nowadays cannot be secured any more with the conventional types of quality control. Instead, comprehensive measures vouching for high q~ a1~ty are needed at all phases of production. Nor c,~'.J the necessary degree of quality be achieved and maintained by a few single steps, for it calls for an entire range of interacting activities. A measure is described in this paper which has been adopted successfully in a Swiss company making high-precision machine tools.
A case study approach to the reliability of shipborne electronic systems. P. L. SHOVE and I. E. G. GILROY. Microelectron. and Reliab. 14, 57 (1975). This case study compares the variability between several reliability prediction techniques and failure rate lists. The results were compared against Fleet experience taking into account the anomalies of the reporting system. Maintainability is also predicted and the accuracy of the results compared with Fleet data. The study indicates that standard prediction techniques should be used for both reliability and maintainability and recommends, for reliability, the one which produces the minimum error related to the Fleet environment. The case study concludes by a comparison of the resultant availabilities.
4. M I C R O E L E C T R O N I C S - - G E N E R A L
Recent SOS technology, advances and applications. RAN. S. RONEN and FRANK B. MICHELETTI. Solid State Technology. August 1975. Current SOS technology is described and several significant developments in the past five years are highlighted. Recent interest in SOS has been high both for conventional commercial applications, such as high performance CMOS switching circuits and memories, and for many special requirements that cannot be filled by other technologies, particularly in military systems. The latter applications include radiation hardened MOS and MNOS computer electronics, and linear systems such as amplifiers and power supplies. They also include high-performance signal-processing systems utilizing high speed digital electronics or analog high-frequency Surface Acoustic Wave (SAW) Programmable Tapped Delay Lines (PTDL's) e.g. matched filters, in the commercial area, SOS circuits are mostly advocated for high speed, high performance applications. However, some projections indicate that SOS technology can be cost competitive with equivalent bulk silicon technology, due to increased packing density, easier processing, and significantly simpler topography in specific applications due to the inherent dielectric isolation. However, this has yet 5. M I C R O E L E C T R O N I C S The bipolar LSI breakthrough, Part 1: Rethinking the problem. HORST H. I BERGER and SIEGFRIED K. WIEDMANN. Electronics p~, 89 (Sept. 1975). Complex processing, extravagent use of space and excessive power dissipation impeded the bipolar transistor's move into LSI: basic redesign eliminates large resistors, simplifies gate structure, needs only four-mask process. The bipolar LSI breakthrough, Part 2: ExtendiLg the limits. HORST H. BERGER and SIEGFRIEDK. W1EDMANN. Electronics p. 99 (Oct. 1975). Now that they have the basic structure of merged-transistor logic well in hand, designers are looking for ways of boosting performance to the highest levels without complicating the process too much.
to be demonstrated. Progress in the SOS area depends heavily on improvement in the material, rather than invention of novel circuit concepts or new process technologies. Specific circuits that illustrate current applica tions at Rockwell are discussed, together with the major process technologies involved. Extensive reference material is cited.
Monoliffiics mature, passives improve. LUCINDA MAqq'ERA. Electronics. p. 116. (October, 1975). As in many areas, the major developments in components of late are due largely to improvements in integrated-circuit technology. There is, for example--to cite probably the most notable achievement of the past year---the first complete monolithic analog-to-digital converter. Without ion implantation and other refinements in IC technology, this component would not be available. To a great extent the same is true of other data converters, as well as opera~ tional amplifiers, resistor networks, and virtually the whole gamut of active and passive components. Whatever the driving technology may be. today's state of the art in components is impressive DESIGN
AND
CONSTRUCTION
Logic network synthesis using digital-summation threshold-logic gates. S. L. HURST. MicroeIectronics 6. 42 1975). The recently-developed digital-summanon threshold-logic (DSTL) gate will be introduced, and lib advantages and disadvantages briefly discussed in comparison with previous analogne-type threshold-logic gates. Some typical applications will be shown indicating package and pin savings in random-logxc networks. Consideration of optimum universal package specifications for random-logic work will be mentioned. RAM, ROM, PROM dreuits for simple imao,e processing. M. J. D. WILSON and I. ALEKSANDER.Microelectronics 6, 30 (1975). Image processing is a field which has always suffered from being technologically ahead of its time.