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The crystallographic information in localised characteristic loss electron images and diffraction patterns
A hstraets
107
been developed to permit simultaneous collection of up to three images, each selected through a different energy loss window.
THE CRYSTALLOGRAPHIC INFORMATION IN LOCALISED CHARACTERISTIC LOSS ELECTRON IMAGES AND D I F F R A C T I O N PATTERNS
H I G H RESOLUTION S T E M - - S O M E NOTES A N D APPLICATIONS
J.C.H. Spence
P. Bovey, I.R.M. Wardell and N.J. Long V.G. Microscopes Ltd., East Grinstead, Sussex, UK
The current trend in analytical electron microscopy is towards the chemical and structural analysis of smaller and smaller volumes of material. The high resolution STEM is ideally suited to meet these increasingly exacting requirements. Examples wilt be given of the range of techniques available on current instruments and recent improvements in the X-ray mlcroanalysis capability.
D~Tartment of Physics, Arizona State Universi(v, Tempe, Arizona 85281, USA
The intensity distribution of energy-filtered intermediate and large energy loss images and diffraction patterns has been calculated. It is concluded that satisfactory interpretation of experimentally obtained images and diffraction patterns can only be achieved by matching with the calculated ones and that, in favorable cases, the local projected symmetry of coordination polyhedra may be determined from the observed symmetry of characteristic loss energy-filtered diffraction patterns.
T H E POTENTIAL O F E N E R G Y LOSS SPECTROSCOPY FOR ELECTRONIC CHARA C T E R I Z A T I O N OF STRUCTURES ON T H E N A N O M E T E R SCALE M.S. Isaacson School of Applied and Engineering Physics, Cornell Uniuersi(v, hhaca, New York 14853, USA
The last few years have seen a dramatic increase in the use of electron spectroscopy coupled with microscopy. Though dominant consideration has been aimed at elemental analysis and the use of ELS as a complementary tool with EDX for elemental determination, much less consideration has been given to one of the more po~kerful aspects of this spectroscopy, namely, electronic structure determination on the nanometer scale. It is the purpose here to consider certain aspects of such determination on the nanometer scale (with reference to elucidation and evaluation of man-made nanostructures) and to'discuss some aspects of spectrometer design relevant to such determinations.
T R I O D E AND T E T R O D E G U N S FOR F I E L D EMISSION E L E C T R O N MICROSCOPES M. Denizart, S. Roques, F. Sonier, B. Jouffrey and J. Trinquier Laboratoire d'Optique Electronique du CNRS, Laboratoire Propre assoei~ h l'Universit~ Paul Sabatier, BP 4347, F-31055 Toulouse C~dex, France
Results of an extensive study of optical properties of triode field emission gun are presented. Particular attention has been paid to the stability of the position and to the dimension of the source given by the gun. In regard to the use in STEM or CTEM, comparisons are made for the two situations, By this time a gun has been adapted experimentally onto a fixed beam electron microscope equipped with a Castaing-Henry filter. Some resuits are presented.
107
been developed to permit simultaneous collection of up to three images, each selected through a different energy loss window.
THE CRYSTALLOGRAPHIC INFORMATION IN LOCALISED CHARACTERISTIC LOSS ELECTRON IMAGES AND D I F F R A C T I O N PATTERNS
H I G H RESOLUTION S T E M - - S O M E NOTES A N D APPLICATIONS
J.C.H. Spence
P. Bovey, I.R.M. Wardell and N.J. Long V.G. Microscopes Ltd., East Grinstead, Sussex, UK
The current trend in analytical electron microscopy is towards the chemical and structural analysis of smaller and smaller volumes of material. The high resolution STEM is ideally suited to meet these increasingly exacting requirements. Examples wilt be given of the range of techniques available on current instruments and recent improvements in the X-ray mlcroanalysis capability.
D~Tartment of Physics, Arizona State Universi(v, Tempe, Arizona 85281, USA
The intensity distribution of energy-filtered intermediate and large energy loss images and diffraction patterns has been calculated. It is concluded that satisfactory interpretation of experimentally obtained images and diffraction patterns can only be achieved by matching with the calculated ones and that, in favorable cases, the local projected symmetry of coordination polyhedra may be determined from the observed symmetry of characteristic loss energy-filtered diffraction patterns.
T H E POTENTIAL O F E N E R G Y LOSS SPECTROSCOPY FOR ELECTRONIC CHARA C T E R I Z A T I O N OF STRUCTURES ON T H E N A N O M E T E R SCALE M.S. Isaacson School of Applied and Engineering Physics, Cornell Uniuersi(v, hhaca, New York 14853, USA
The last few years have seen a dramatic increase in the use of electron spectroscopy coupled with microscopy. Though dominant consideration has been aimed at elemental analysis and the use of ELS as a complementary tool with EDX for elemental determination, much less consideration has been given to one of the more po~kerful aspects of this spectroscopy, namely, electronic structure determination on the nanometer scale. It is the purpose here to consider certain aspects of such determination on the nanometer scale (with reference to elucidation and evaluation of man-made nanostructures) and to'discuss some aspects of spectrometer design relevant to such determinations.
T R I O D E AND T E T R O D E G U N S FOR F I E L D EMISSION E L E C T R O N MICROSCOPES M. Denizart, S. Roques, F. Sonier, B. Jouffrey and J. Trinquier Laboratoire d'Optique Electronique du CNRS, Laboratoire Propre assoei~ h l'Universit~ Paul Sabatier, BP 4347, F-31055 Toulouse C~dex, France
Results of an extensive study of optical properties of triode field emission gun are presented. Particular attention has been paid to the stability of the position and to the dimension of the source given by the gun. In regard to the use in STEM or CTEM, comparisons are made for the two situations, By this time a gun has been adapted experimentally onto a fixed beam electron microscope equipped with a Castaing-Henry filter. Some resuits are presented.