The influence of surface oxide films on the stabilization of n-Si photoelectrode

The influence of surface oxide films on the stabilization of n-Si photoelectrode

A300 Surface Science 109 (1981) 75581 North-Holland Publishing Company 15 THE INFLUENCE OF SURFACE OXIDE FILMS ON THE STABILIZATION n-Si PHOTOELECTR...

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A300 Surface Science 109 (1981) 75581 North-Holland Publishing Company

15

THE INFLUENCE OF SURFACE OXIDE FILMS ON THE STABILIZATION n-Si PHOTOELECTRODE

OF

B.H. LOO, K.W. FRESE, Jr. and S. Roy MORRISON Materials

Research

Received

13 January

Laboratory,

SRI International,

Menlo Park, California

94025,

USA

1981

We have provided direct evidence of the enhanced effectiveness of stabilizing agents due to thin surface oxide films, ca. 15-25 A, on n-Si photoelectrode. Rotating ring disc electrode and ellipsometric experiments are combined to show the stabilization efficiency of potassium ferrocyanide improves with oxide thickness. A band model describing the observed effect is given.

82

Surface Science 109 (1981) 82-94 North-Holland Publishing Company

ADSORPTION

OF BISMUTH ON Si( 110) SURFACES

T. OYAMA, S. OHI, A. KAWAZU and G. TOMINAGA Department Japaiz Received

of Applied

16 December

P/iysics,

The Dilisersity

1980; accepted

of Tokyo,

for publication

Hongo, Bunkyo-X-u,

Tokyo

I1 3,

1 April 1981

The adsorption of bismuth on Si(ll0) surfaces has been studied by means of quadrupole mass spectrometry (QMS), LEED and AES. The existence of three main adsorption states (the first, second and third phases) were observed. Two of them (the first and second phases) are two-dimensional phases and the other (the third phase) is a three-dimensional phase. After the completion of the first phase at a high substrate temperature, the LEED pattern showed a clear Si(ll0) 2 X 3 structure. A shift of the saturation coverage of the two-dimensional phase with the change of the deposition condition was also observed.

Surface Science 109 (1981) 95 - 108 North-Holland Publishing Company

95

ANGULAR RESONANCES IN THE EMISSION FROM A DIPOLE LOCATED NEAR A GRATING P.K. ARAVIND, Department Received

Eric HOOD and Horia METIU *

of Chemistry,

13 January

University of California,

198l;accepted

for publication

Santa Barbara, 10 March

California

93106,

USA

1981

Using a simple model we predict that pronounced angular resonances will be observed in the emission from a dipole located near a silver surface having a sinusoidal profile. The result is relevant to Raman and fluorescence spectroscopy.