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WORLD ABSTRACTS ON M I C R O E L E C T R O N I C S AND R E L I A B I L I T Y
Quality and reliability. F. NIXON, Engineering 207, No. 5372, 11 April (1968), p. 585. Terms of reference are defined, and the need for quality and reliability is considered. The activities necessary to the achievement of a reliable product are discussed, and the common causes of poor reliability and techniques of quality control are considered. *Reliability--ll0 years of increasing complexity and value. L. R. WEBSTER.Ann. Assurance Sci.; Proc. 7th Reliab. Maintainability Conf., San Francisco, Calif., 14-17 July (1968), p. 90. The evolution of the system approach is discussed, with this approach defined as a process used in generating a completely integrated system design to accomplish objectives which, in turn, result from needs. As the trend of technological development is clearly toward an increasing integration of the engineering and management functions, the use of the system approach can be considered the first major milestone in this trend. With the formalization of the system approach, the role of reliability engineering has taken on a more centralized role in the system design function. It appears that the system reliability and/or cost effectiveness model, supported by reliability engineering, can be made to function as an analytical tool which accurately presents the engineering and management status of a design effort. The view is offered that in the future reliability will remain a regulatory function in the sense of formulating and implementing an optimum system design and management strategy.
The need to teach reliability. R. C. WINTON,Electron. Pwr 15, January (1969), p. 8. The case is made out for teaching reliability in engineer and technicians courses, in view of the increasing importance of reliability considerations in modern electronic systems. Such courses should include basic concepts at a non-mathematical level, and cover operability and maintainability. *The role of reliability and quality assurance in program management. M. N. OLSEN and W. H. SHAW, Ann. Assurance Sd.; Proc. 7th Reliab. Maintainability Conf., San Francisco, Calif., 14-17 July (1968), p. 100 (A68-37604). For maximum effectiveness, line reliability and quality assurance activities require coordinated central management from the program office just as do the other line functions more commonly associated with program office direction. To understand this, the paper first traces in the broadest terms the place of the assurance disciplines in the life cycle of a typical product. The focus is then narrowed to examine the work-package concept which brings the efforts of skill centers to bear on the program objectives. These objectives, generally stated, are the creation and supply of an end product which inherently and in fact satisfies expressed customer needs. The paper describes the work package mechanism whereby the reliability and quality assurance effort throughout the program is coordinated, budgeted and directed. *Survey of reliability prediction techniques. C. M. RYERSON, Ann. Assurance Sci.; Proc. 7th Reliab. Maintainability Conf., San Francisco, Calif., 14-17 July (1968), p. 70 (A68-37601). Discussion of the accuracy that can be expected from various types of reliability prediction techniques and the timing for their optimum use. Comparison of similar systems, standardized typical system, comparison of similar circuits, active element group count, generic type part count, simulated operation, and environmental testing are among the prediction techniques discussed. Each technique has a preferred application depending on the stage of program completion, the prediction information available, and the intended uses of the prediction figures. The preferred application of each technique is described.
2. RELIABILITY OF COMPONENTS, TUBES, TRANSISTORS AND IC'S TPractical reliability, Vol. V, Parts, NASW-1448, UDC. 658.562/657.4, July (1968), 83 p. Parts reliability and associated problems which are not considered in other volumes of this series are discussed. This includes those functions--selection, specification, verification, review processes, and data sources-which are involved in a successful parts programme. Some of the costs associated with these functions are discussed and an attempt is made to define an ideal data bank. Component testing--fresh look. H. REICHE. Electron, Commun. 16, No. 7, July (1968), p. 39. The rapidly developing state-of-the-art has produced many factors which are greatly influencing the methods and indeed the underlying philosophy surrounding the testing of electronic components. Electronic