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Thin film analysis made easy
TOOLS & TECHNIQUES UPDATE
Bright light A continuous wave ultravioletvacuum ultraviolet (UV-VUV) light source from TuiLaser is designed for applications in semiconductor measurement, metrology, analytical instruments, and spectroscopy. The electron beam pumped lamp is available with 121-358 nm wavelengths, and features a high spectral brilliance with a small emission area and narrow emission band. It has an output power of 5-50 mW. Contact: www.tuilaser.com
Light sources for spectroscopy AvaLight is a new line of light sources from Avantes for spectroscopy applications in the ultraviolet, visible, and near infrared ranges. The light sources include deuterium, halogen, tungsten, lightemitting diode, and mercury-argon configurations for spectral ranges from 190-1700 nm. The AvaLight sources are suitable for reflectance, transmittance, absorption, and irradiation spectrometer measurements.
Image management IQbase is an intelligent database that enables users to archive, manage, and extract information from a large number of images. Media Cybernetics, Inc. hopes the new software will help those who accumulate sizeable image libraries to move away from storing the information in multiple notebooks, spreadsheets, and file formats. The software allows any number of images from various application sources to be added to an archive database. Both images and information can be viewed and managed in one place, providing accessibility from pixel to metadata level. Users can also conduct searches based on image data to locate other similar archived material. Potentially, this could help in the detection of hidden patterns and trends. Report Designer tools and a variety of e-mail and web sharing options also facilitate sharing between researchers. Contact: www.mediacy.com
Contact: www.avantes.com
Solder deposition The Jet Vapor Deposition™ (JVD™) tool is a reliable Au-Sn solder deposition process for advanced electronic and optoelectronic devices from Jet Process Corp. It enables the production of thin film solder and other critical, high-value coatings. It has the advantages of room temperature and low vacuum operation, and can combine multiple materials in a single pass. Contact: www.jetprocess.com
Erratum In the Tools and Techniques section of the February issue of Materials Today, two instruments from Princeton Applied Research, the SKP100 Scanning Kelvin Probe and the PG580 PotentiostatGalvanostat, were described as new products. It has been brought to our attention that the SKP100 has been available for seven years. We acknowledge our error and apologize for any confusion caused. The information for the PG580 is correct.
Size matters Malvern Instruments is launching two new products for measuring particle size. The compact and fully-automated Zetasizer Nano series can measure the particle size, zeta potential, and molecular weight of molecules and nano-sized particles. The use of NIBS® (noninvasive back-scatter) technology gives high sensitivity measurements of particle size for small and poorly scattering molecules, such as polymers and proteins. It also allows measurements to be made at high concentration so that emulsions, pigments, and toners require little or no dilution. Titrations to determine the effect of pH or conductivity on particle size and zeta potential can be carried out automatically using the MPT-2 autotitrator. The CGS-3 is a compact, multiangle spectrometer for the measurement of molecular weight, diffusion and virial coefficients, and particle size. Static and dynamic light scattering measurements can be made simultaneously. The instrument has been designed so that it can be used in a general laboratory setting without the need for an optical table. Contact: www.malvern.co.uk
Thin film analysis made easy Bruker AXS is introducing the D8 DISCOVER Series II for thin film analysis using X-ray reflection and X-ray diffraction. Forming part of the company’s D8 diffractometer family, this instrument includes new optics, sample-handling features, and software for improved alignment and data collection. The choice of centric Eulerian cradle, motorized reflectometry stage, tilt stage, or wafer handler is intended to improve measurement convenience and allow automated applications. The Pathfinder and four-position Rotary Absorber optics simplify alignment. Finally, XRD Wizard, XRD Commander, LEPTOS, and MULTEX Area software programs expand the measurement and data analysis options.
Automated spectrometers
Contact: www.bruker-axs.com
Contact: www.jobinyvon.co.uk
The 750S Scanning Spectrometer and 750I Imaging Spectrograph from Jobin Yvon are both fully automated and have a focal length of 750 mm . They are equipped with autocalibrating wavelength drive and grating systems. Motorized slits are continually adjustable from 0-2 mm in 2 µm steps, and kinematically mounted 110 × 110 mm gratings are designed for easy interchange. The 750S is compatible with Jobin Yvon’s lines of photomultiplier tubes (PMTs), infrared (IR) detectors, and data acquisition systems. The 750I can be used with the company’s CCDs and InGaAs arrays, giving multichannel spectral analysis.
June 2003
63
Bright light A continuous wave ultravioletvacuum ultraviolet (UV-VUV) light source from TuiLaser is designed for applications in semiconductor measurement, metrology, analytical instruments, and spectroscopy. The electron beam pumped lamp is available with 121-358 nm wavelengths, and features a high spectral brilliance with a small emission area and narrow emission band. It has an output power of 5-50 mW. Contact: www.tuilaser.com
Light sources for spectroscopy AvaLight is a new line of light sources from Avantes for spectroscopy applications in the ultraviolet, visible, and near infrared ranges. The light sources include deuterium, halogen, tungsten, lightemitting diode, and mercury-argon configurations for spectral ranges from 190-1700 nm. The AvaLight sources are suitable for reflectance, transmittance, absorption, and irradiation spectrometer measurements.
Image management IQbase is an intelligent database that enables users to archive, manage, and extract information from a large number of images. Media Cybernetics, Inc. hopes the new software will help those who accumulate sizeable image libraries to move away from storing the information in multiple notebooks, spreadsheets, and file formats. The software allows any number of images from various application sources to be added to an archive database. Both images and information can be viewed and managed in one place, providing accessibility from pixel to metadata level. Users can also conduct searches based on image data to locate other similar archived material. Potentially, this could help in the detection of hidden patterns and trends. Report Designer tools and a variety of e-mail and web sharing options also facilitate sharing between researchers. Contact: www.mediacy.com
Contact: www.avantes.com
Solder deposition The Jet Vapor Deposition™ (JVD™) tool is a reliable Au-Sn solder deposition process for advanced electronic and optoelectronic devices from Jet Process Corp. It enables the production of thin film solder and other critical, high-value coatings. It has the advantages of room temperature and low vacuum operation, and can combine multiple materials in a single pass. Contact: www.jetprocess.com
Erratum In the Tools and Techniques section of the February issue of Materials Today, two instruments from Princeton Applied Research, the SKP100 Scanning Kelvin Probe and the PG580 PotentiostatGalvanostat, were described as new products. It has been brought to our attention that the SKP100 has been available for seven years. We acknowledge our error and apologize for any confusion caused. The information for the PG580 is correct.
Size matters Malvern Instruments is launching two new products for measuring particle size. The compact and fully-automated Zetasizer Nano series can measure the particle size, zeta potential, and molecular weight of molecules and nano-sized particles. The use of NIBS® (noninvasive back-scatter) technology gives high sensitivity measurements of particle size for small and poorly scattering molecules, such as polymers and proteins. It also allows measurements to be made at high concentration so that emulsions, pigments, and toners require little or no dilution. Titrations to determine the effect of pH or conductivity on particle size and zeta potential can be carried out automatically using the MPT-2 autotitrator. The CGS-3 is a compact, multiangle spectrometer for the measurement of molecular weight, diffusion and virial coefficients, and particle size. Static and dynamic light scattering measurements can be made simultaneously. The instrument has been designed so that it can be used in a general laboratory setting without the need for an optical table. Contact: www.malvern.co.uk
Thin film analysis made easy Bruker AXS is introducing the D8 DISCOVER Series II for thin film analysis using X-ray reflection and X-ray diffraction. Forming part of the company’s D8 diffractometer family, this instrument includes new optics, sample-handling features, and software for improved alignment and data collection. The choice of centric Eulerian cradle, motorized reflectometry stage, tilt stage, or wafer handler is intended to improve measurement convenience and allow automated applications. The Pathfinder and four-position Rotary Absorber optics simplify alignment. Finally, XRD Wizard, XRD Commander, LEPTOS, and MULTEX Area software programs expand the measurement and data analysis options.
Automated spectrometers
Contact: www.bruker-axs.com
Contact: www.jobinyvon.co.uk
The 750S Scanning Spectrometer and 750I Imaging Spectrograph from Jobin Yvon are both fully automated and have a focal length of 750 mm . They are equipped with autocalibrating wavelength drive and grating systems. Motorized slits are continually adjustable from 0-2 mm in 2 µm steps, and kinematically mounted 110 × 110 mm gratings are designed for easy interchange. The 750S is compatible with Jobin Yvon’s lines of photomultiplier tubes (PMTs), infrared (IR) detectors, and data acquisition systems. The 750I can be used with the company’s CCDs and InGaAs arrays, giving multichannel spectral analysis.
June 2003
63