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Throughput availability in Markov systems
1424
World Abstracts on Microcleetronics and Reliability
The recursive algorithms require memory O(#vertices 2. #edges), as the recursion depth is limited to (#edges) and at each recursive node a O(#vertices 2) memory is used to represent the network. Thus, the memory requirement of R&P is approximately the same as that of PP-F2TDN and much less than that of the non-recursive Dotson & Gobein algorithm. All three algorithms compute exact numerical reliability, but they can easily be modified to produce symbolic reliability expressions. The parallel algorithms were implemented on a shared-memory parallel computer. The R&P approach should be explored to solve other network reliability problem, such as K-terminal reliability. In R&P, the greedy approach was used in selecting shortest paths in order to locally minimize the number of subproblems. This selection did not consider the effect of reductions on the subproblems to be generated. A unified mobility model for device simalation--II. Temperature dependence of carrier mobility and lifetime. D. B. M. KLAASSEN. Solid-State Electronics 35(7), 961 (1992). In Part I we presented the first physics-based analytical model that unifies the descriptions of majority and minority carrier mobility and that includes screening of the impurities by charge carriers, electron-hole scattering and cluster•ng of impurities. Here the model is extended to include the full temperature dependence of both majority and minority carrier mobility. Based on our model and experimental data on the minority carrier diffusion length as a function of temperature, the temperature dependence of the carrier lifetime is determined. The model is especially suited for device simulation purposes, because the carrier mobility is given as an analytical function of the donor, acceptor, electron and hole concentrations and of the temperature.
peripheral control units which process them and transmit appropriate instructions to the lowest level--terminal units. The following probabilities are defined, modeled, and calculated: • one particular terminal operates • the branch controlled by one peripheral control unit operates • the group (set of statistically identical branches) operates • system operates. Lower confidence bound on the percentage improvement in comparing two failure rates. JOHN E. ANGUS. I E E E Transactions on Reliability 41(2), 239 (1992). It is often necessary to determine whether a design change in a product has actually improved its failure rate, and to compute a lower confidence bound on the percentage of failure rate improvement affected by the change. This paper shows how such a bound can be computed based on certain test data.The main result of the paper is a special case of an equivalent result derived in Lehmann for hypothesis testing and used extensively in applied statistics. However, it is not well-known in its confidence interval form, nor is it extensively reported in reliability methods books, and its derivation is important in reliability testing. Bnyes attribute acceptance-sampling plan. ZHOU Srm~qG and DA-YIN FAN. I E E E Transactions on Reliability 41(2), 307 (1992). This paper briefly reviews an approach for choosing a prior distribution for a Bayes attribute (good/bad) acceptance-sampling plan. A prior is chosen from confidence levels corresponding to classical lower confidence bounds. Where a Bayes plan is acceptable, the sample size can be reduced.
Throughput availability in Markov systems. N. LIMNIOS. I E E E Transactions on Reliability 41(2), 219 On Onaga's upper botmd on the mean values of (1992). This paper develops an explicit formulation probabilistic maximum flows. HIROSHINAGAMOCHI for throughput availability, demand availability, and TOSH1HIDEInxRArd. I E E E Transactions on on-stream availability, availability at a particular Reliability 41(2), 225 (1992). The reliability of level and time, limiting throughput availability, and capacity-limited networks subject to arc failures can mean throughput to first failure, in terms of discrete be evaluated by the mean value of maximum flow. and continuous parameter Markov chains. These Calculating the mean value of maximum flow is measures are particularly adapted to continuous NP-hard. However, the Onaga upper bound some- production or transportation systems. A numerical times gives the exact value, e.g. when graphs are example illustrates the results. bipartite. This paper gives for networks (whether arcs are directed or not) a necessary and sufficient Extended tables for the moments of gamma-districondition for the Onaga upper bound to be exact. bution order statistics. U. BALASOORIYAand K. P. HAPUARACHCHI. I E E E Transactions on Reliability Reliabifity analyses for a tr~-~--'anctnced hierarchic 41(2), 256 (1992). This paper tabulates expectations, control system. MmKO VuJoSEVlC et aL I E E E Trans- variances, and covariances of order statistics from a sample of size n from a standard gamma distribution actions on Reliability 41(2), 190 (1992). Mathematical models for reliability calculations of a three-level with shape parameter r. The expected values are for centralized control system are given. The highest level n ~-1(1)10(5)40, and r = 5(!)8; the covariances are is a central control unit; it sends control messages to for n = 15(5)25 and r = 2(1)5.
World Abstracts on Microcleetronics and Reliability
The recursive algorithms require memory O(#vertices 2. #edges), as the recursion depth is limited to (#edges) and at each recursive node a O(#vertices 2) memory is used to represent the network. Thus, the memory requirement of R&P is approximately the same as that of PP-F2TDN and much less than that of the non-recursive Dotson & Gobein algorithm. All three algorithms compute exact numerical reliability, but they can easily be modified to produce symbolic reliability expressions. The parallel algorithms were implemented on a shared-memory parallel computer. The R&P approach should be explored to solve other network reliability problem, such as K-terminal reliability. In R&P, the greedy approach was used in selecting shortest paths in order to locally minimize the number of subproblems. This selection did not consider the effect of reductions on the subproblems to be generated. A unified mobility model for device simalation--II. Temperature dependence of carrier mobility and lifetime. D. B. M. KLAASSEN. Solid-State Electronics 35(7), 961 (1992). In Part I we presented the first physics-based analytical model that unifies the descriptions of majority and minority carrier mobility and that includes screening of the impurities by charge carriers, electron-hole scattering and cluster•ng of impurities. Here the model is extended to include the full temperature dependence of both majority and minority carrier mobility. Based on our model and experimental data on the minority carrier diffusion length as a function of temperature, the temperature dependence of the carrier lifetime is determined. The model is especially suited for device simulation purposes, because the carrier mobility is given as an analytical function of the donor, acceptor, electron and hole concentrations and of the temperature.
peripheral control units which process them and transmit appropriate instructions to the lowest level--terminal units. The following probabilities are defined, modeled, and calculated: • one particular terminal operates • the branch controlled by one peripheral control unit operates • the group (set of statistically identical branches) operates • system operates. Lower confidence bound on the percentage improvement in comparing two failure rates. JOHN E. ANGUS. I E E E Transactions on Reliability 41(2), 239 (1992). It is often necessary to determine whether a design change in a product has actually improved its failure rate, and to compute a lower confidence bound on the percentage of failure rate improvement affected by the change. This paper shows how such a bound can be computed based on certain test data.The main result of the paper is a special case of an equivalent result derived in Lehmann for hypothesis testing and used extensively in applied statistics. However, it is not well-known in its confidence interval form, nor is it extensively reported in reliability methods books, and its derivation is important in reliability testing. Bnyes attribute acceptance-sampling plan. ZHOU Srm~qG and DA-YIN FAN. I E E E Transactions on Reliability 41(2), 307 (1992). This paper briefly reviews an approach for choosing a prior distribution for a Bayes attribute (good/bad) acceptance-sampling plan. A prior is chosen from confidence levels corresponding to classical lower confidence bounds. Where a Bayes plan is acceptable, the sample size can be reduced.
Throughput availability in Markov systems. N. LIMNIOS. I E E E Transactions on Reliability 41(2), 219 On Onaga's upper botmd on the mean values of (1992). This paper develops an explicit formulation probabilistic maximum flows. HIROSHINAGAMOCHI for throughput availability, demand availability, and TOSH1HIDEInxRArd. I E E E Transactions on on-stream availability, availability at a particular Reliability 41(2), 225 (1992). The reliability of level and time, limiting throughput availability, and capacity-limited networks subject to arc failures can mean throughput to first failure, in terms of discrete be evaluated by the mean value of maximum flow. and continuous parameter Markov chains. These Calculating the mean value of maximum flow is measures are particularly adapted to continuous NP-hard. However, the Onaga upper bound some- production or transportation systems. A numerical times gives the exact value, e.g. when graphs are example illustrates the results. bipartite. This paper gives for networks (whether arcs are directed or not) a necessary and sufficient Extended tables for the moments of gamma-districondition for the Onaga upper bound to be exact. bution order statistics. U. BALASOORIYAand K. P. HAPUARACHCHI. I E E E Transactions on Reliability Reliabifity analyses for a tr~-~--'anctnced hierarchic 41(2), 256 (1992). This paper tabulates expectations, control system. MmKO VuJoSEVlC et aL I E E E Trans- variances, and covariances of order statistics from a sample of size n from a standard gamma distribution actions on Reliability 41(2), 190 (1992). Mathematical models for reliability calculations of a three-level with shape parameter r. The expected values are for centralized control system are given. The highest level n ~-1(1)10(5)40, and r = 5(!)8; the covariances are is a central control unit; it sends control messages to for n = 15(5)25 and r = 2(1)5.