Trace element spectrometry with plasma source

Spectrochimica Aera, Vol. 458, No. I I, pp. V-VI, Printed in Great Britain.

Pergamon Press plc

1990

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amount of energy to vaporize the elements contained in the sample and a low energy portion providing a sufficient amount of energy to cause the vaporized elements to emit light, and wherein spectroscopic measurement is conducted in the low energy portion, or initiated in the end portion of high energy portion to continue in the low energy portion.

STANDARDIZATION OF SPECTRAL LINES Zoe A Grosser, John B Collins, Ewa Pruszkowski assigned to The Perkin-Elmer Corporation

4902099

A method and apparatus for standardizing spectral line intensities in a spectral monochromator separate an input beam into a sample spectral line characteristic of a sample element, a reference spectral line, a standard spectral line and a background spectral band. At a first point in time an intensity IA of the sample line, a first intensity IRl of the reference line and a first intensity IBl of the background band are measured. At a second point in time an intensity IS of the standard line, a second intensity IR2 of the reference line and a second intensity IB2 of the background. band are measured. An intensity ratio IR defined by the formula See Patent for Mathematical Equation is computed wherein the intensity ratio IR represents a standardized intensity of the sample line compensated for source fluctuations.

TRACE ELEMENT SPECTROMETRY WITH PLASMA SOURCE Yukio Okamoto, Makoto Yasuda, Seiichi Murayama, Masataka ,Koga, Sagamihara, Japan assigned to Hitachi Ltd A plasma trace element spectrometer comprises a microwave generator for generating microwave power, a microwave feeder for guiding and transforming the generated microwave power into microwave power of TEOl mode and supplying the microwave power of TEOl mode, a plasma producer having, at one end, an introduction port for a carrier gas and a sample and at the other end an opening and being cooperative with the supplied microwave power of TEOl mode to produce plasma of the carrier gas and sample introduced through the introduction port, and a spectrometer for analyzing constituent elements of the sample by measuring the produced plasma by way of the opening.

METHOD AND APPARATUS FOR EMISSION SPECTROSCOPIC ANALYSIS Isao Fukui, Shuzo Hayahsi, Takao Miyama, Uji, Japan assigned to Shimadzu Corporation

4925306 ION BOMBARDMENT FURNACE FOR ATOMIC SPECTROSCOPY

Method and apparatus for emisson spectroscopic analysis by spark discharge, wherein each and every one of a number of spark discharges conducted for analysis of a sample comprises a high energy portion providing a sufficient

Richard Sacks, Suzanne L Tanguay assigned to The Regents of the University of Michigan V