TOOLS & TECHNIQUES
Electromagnetic materials microwaved Agilent has released SMM, a scanning microwave microscopy mode that combines the electrical m...
Electromagnetic materials microwaved Agilent has released SMM, a scanning microwave microscopy mode that combines the electrical measurement capabilities of a performance network analyzer (PNA) with the spatial resolution of a low-noise (0.5 Å) atomic force microscope (AFM). The SMM mode provides high-resolution characterization of electromagnetic materials. The SMM has a 1.2 aF sensitivity and high spatial and electrical resolution. It can also achieve complex impedance, calibrated capacitance, calibrated dopant density, and topography measurements. The AFM has a large dynamic range and can switch between large (90 mm x 90 mm) and small (9 mm x 9 mm) scanners with 400 nmprecision location mapping. It operates at multiple frequencies and an oxide layer is not required. Contact: www.agilent.com
Turning up the heat Linn High Therm has introduced the FRH-350/600/1100 tube furnace for brazing and annealing under protective gas and vacuum. The insert tube can shift on a sliding frame, enabling samples to be inserted or removed under gas atmospheres in the preheated furnace. This results in extremely short heating and cooling times. The furnace reaches a maximum temperature of 1100 °C and can be used under vacuum up to 600 °C. The tube has an inside diameter of 220 mm and a length of 1000 mm Contact: www.linn.de
Taking the rough with the smooth Carl Zeiss has added a number of new functions to the topography module of its AxioVision microscopy software which will improve roughness and height measurements by stereomicroscopes. Roughness values from unfiltered primary profiles, highpassfiltered roughness profiles, and lowpass-filtered waviness profiles can be determined and the user can draw profile lines in the evaluated image in any direction.
The high position sensor sampling rate of 50 kHz provides a margin for ultra-fast piezo stages with submillisecond response times. Contact: www.physikinstrumente.com
It is also possible to specify the cut-off wavelength for Gaussian filtering of calculated height charts. Carl Zeiss has also introduced ParticleSCAN VP for automated high-resolution particle analysis. The new variable pressure mode enables rapid examination and analysis of non-conducting samples, including particles on paper or polymer filters. Combined with an optional X-Ray analysis tool (EDS) the system can automatically measure, classify, and record sample size, shape, and chemical composition. ParticleSCAN VP can be used on powders and inclusions. Data can be retrospectively reprocessed with refined particle selection criteria, classifications, or statistical characteristics. Images of specific interest can be reviewed offline, remeasured or relocated on the original sample for further analysis if required. Contact: www.zeiss.de
Focusing on energy and the environement FEI Company has released the Titan™ 80-300 environmental transmission electron microscope (ETEM) for chemical research of materials and processes involved in energy and environmental studies. The Titan ETEM can image samples in a controlled gaseous environment for investigations into the fundamental atomic mechanisms of gas-solid reactions, such as carbon nanotube growth, crystal nucleation and growth, and heterogeneous catalysis.
A helping hand for wafer loading NWL200 is a new series of wafer loaders from Nikon for use during microscopic inspection of ultra-thin 100 µm wafers. Edge-chipping detection enables automated inspection of all areas of the wafer with high precision, and edge defects that cause wafer cracking can be removed quickly. The optimised wafer-sensing functions can accurately detect the shape of thin wafers in the cassette and avoids the need to place them manually on the microscope. Contact: www.nikon.com
Dynamic digital linearization eliminates tracking errors when scanning. A trajectory of up to six axes can be obtained even during high-velocity motion on a millisecond time scale.
Titan ETEM delivers high-resolution imaging with gas pressures in the sample chamber as high as a few percent of atmospheric pressure. A gas controller permits precise control of composition as well as pressure and heating and cooling holders provide control over a range of temperatures.
Stage controller for multi-axis nanopositionig E-712 is a new digital piezo stage controller from PI (Physik Instrumente) for multi-axis nanopositioning. It features improved positioning accuracy that reduces motion errors to 0.001% of the travel range.
The ability to select electron beam voltages anywhere between 80 and 300 kV accommodates a wide range of material and imaging conditions. Contact: www.fei.com