Where do we go from here?

Microelectron. Reliab., Vol. 34, No. 11, p. 1707, 1994 Copyright 0 1994 Elsevier Science Ltd Printed in Great Britain.All rights reserved

Pergamon

EDITORIAL

fmn Assistant FditOwin4-Lief.

~cenbemquestimthatraliabilityhastalrenmadiff~t~~fmntit~to te.

‘IhFsisevidentfmnrecentarticl~andflanmsetingssuchasthe~~.

including ar@E&ng

smietias that cater to reliability,

w

wtim%

have asked tkm¶elves - are N still

CMngtit

Both n&coal atxi intematicoal g3xw3, espacial& the staxla& orgmizatims, rrw

iaI.ac&xd~us. talk aba& reliability

in terms that are rmchbxadm in cmmtatim than before.

Notmlyhastheso~

lnfluwce~a~arfac~,~t~new’~zulcads’havebeenminedto~~tisbalievedto be the answr in dealing with the nsw kind of ecaunic mvixnrmt w live in.

No-alecanaffard~

to have multiple organizatims staffed that deal with awry&y tasks of quality, reliability, a!xi lcgistic .¶qxxPt.

titainability

?heinpactthatcertaintrade~tshave~twiththanand~todo~iness, in obtr to satisrgr the custcnE?r. Theefforttobringtcgetbr

~changedaa‘w=du=~arw=hes

thevariars~thetareneededto~eacceptable~tsthat~~ticallyIs3~~ far their mtti

life cycle, is mking their way into evwyd3y life.

sin&J haKingtasks mlved seqwntially. m

RIt. this can not be acmrplished &

lMstakestmnuchtime,ccetstmm2chandcbesmtpzvbea

that is acceptable.

?his~~tweintheraliabFlityengineeringfieldwillmtsitattheendofthetablesalyma‘ewd~t mtil everythingis neatly in it8 place befare we sre sllcwed to antribute. willmwsittcgethePfkInstavttoend. m?nt’.

Theteanofengineeringercperts

Sunetimesthis aplnoachhas been labled ‘integrated prxd!xt dewlql-

l%e ckfinitim cm be given as a systematicrgxcach to de&g of p3xxkt-aand their related prwxfws, All el6nmt.s will be cmsidwed fIun onceptim thrwgh disgceal,

incluiing~~~~. including +ity,

cost, echedule, and user requbwnts.

pxdtims and pIKIfitability.

The Izc&uR of this agx%lch strengthensmrpetitive

&mgFmentcum3itinmtis iqxratiw

to properly fbx3 up frmt rmltidisciplirvny

tasksarkItmefit~lmgtemlpaybac~.

H. REIC-E

1707