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World class contamination control practices
652
World Abstracts on Microelectronics and Reliability
This paper gives a tutorial on practical techniques for Markov modeling--concentrating on basic concepts, creating representative models, defining measures of reliability and maintainability, getting around the "exponential only" requirement, and using Markov models to make design decisions. The tutorial should be of interest to reliability engineers or managers unfamiliar with the application of Markov modeling to reliability analysis of repairable systems, and those seeking modeling techniques applicable to non-exponential repair times (time-dependent repair rates).
Using internal testing program in testing the telephone subset integrated circuit. ANDRZEJ GRZEGORCZYK, MAREK OSTANEK, PIOTR RUSZKARSKI, EDWARD STOLARSKI and JAREMI WITEWSKI. Electron. Technol. 19 (3/4), 29 (1986). The paper presents operating features of the telephone subset integrated circuit MC 1930 working as a dialler and a tone ringer. Special attention is paid to the testing of the dialler and the tone ringer in the chip by means of the universal tester. The paper presents the solution to improve testability, describes subroutines placed in the internal ROM and evaluates testing efficiency. Sequential test for the ratio of two constant failure rates. DOLUN OKSOY. IEEE Trans. Reliab. R-36, 605 (1987). An exact sequential test is given for two equipments in terms of the ratio of their constant failure rates. The plans are useful for incentives in life testing of these equipments against one another during their constant failure-rate period. The theory and equations for the tables are developed and the related references are included. Three test plans are summarized. First-generation electronic R&M CAE. DONALD D. HALL. IEEE Trans. Reliab. R-36, 495 (1987). First generation reliability and maintainability computer-aided engineering (R&M CAE) tools for electronic development items consist of design analysis functions generally derived from existing CAE simulation and other software. The role of design analysis is to reduce the uncertainty of the estimated R&M predictions by uncovering potential problems in time for them to be corrected. This paper discusses the applicability of design analysis tools throughout the item development cycle. Generic tool types and their parent CAE software are identified and the status of their availability discussed. Electronic warfare coordination module (EWCM): integrating design, R&M, and logistic support analysis. R. E. BIEDENBENDER and D. B. KLINGENSM1TH. Proc. a. Reliab. Maintainab. Syrup., 405 (1988). Two major trends in defense acquisition are (1) greatly increased emphasis on reliability and maintainability (R&M), supportability and related system readiness parameters, such as Operational Availability (A0), and (2) systems and equipments, particularly in the electronics world, which are software intensive. These trends have resulted in new management challenges in terms of (1) integrating support related considerations such as R&M and Logistic Support Analysis (LSA) into design practices, and (2) the development of R&M and LSA
approaches appropriate for software application. This paper describes the actions taken to address these issues in the detailed design phase on the U.S. Navy's Electronic Warfare Coordination Module (EWCM) Program. The authors conclude that this challenge can be met with minimal additional cost given management support and an appropriate integrated design-R&M-LSA approach.
A satellite failure database system. RATHIN NEOGY and CnI-PING SIu. Proc. a. Reliab. Maintainab. Syrup., 422 (1988). A vast amount of failure history is generated over the life cycle of a satellite program. This data, accumulated from production upto and including on orbit operation, is required to be utilized as a management tool to perform certain essential tasks. These tasks, as a minimum; are: performing failure trend and hardware reliability assessment; conducting the troubleshooting of on orbit anomalies as well as failures that occur during system integration and testing; providing a periodic failure status summary for management overview; assessing the effectiveness of corrective actions and evaluating the test effectiveness of programs. In order to perform these tasks effectively, a versatile database management program is required. This paper describes the database, supported by various application programs, to provide easy and rapid access to failure information. The basic systems, utilizing Ashton Tates' dBase III Plus software program, handles over 40M bytes of failure and hardware configuration information in a PC-based system. The system provides a user-friendly interface with good response time and sufficient flexibility in the search for information and to date has proven to be very effective. An analysis of hardware and software availability exemplified on the IBM 3725 communication controller. I B M J. Res. Dev. 32, 268 (1988). Because of the growing commercial, governmental, and scientific requirements for system availability, evaluating this factor has become increasingly important, This paper presents a unified approach to hardware and software availability of a system in the operational phase. The aim is to evaluate the availability in a given time interval, to show how to improve it, and to determine the probability that a specified level is met over the period. The inputs are the failure and repair rates of the system elements, and the functional relationship between them. Field tracking provides the failure and repair data, and Markov-chain techniques make it possible to construct, reduce, and solve the model. Availability is computed by the program package System Availability Estimator (SAVE). The model has been used and validated with actual field data for the IBM 3725 Communication Controller. Simple Bayes test of equality of exponential means. M. M. SHOUKRI. IEEE Trans. Reliab. R-36, 613 (1987). An approximate z2-test statistic tests the homogeneity of scale parameters of several exponential distributions from a Bayes viewpoint under types I and II censoring. The quantiles of the statistic are simulated and found to be very close to the exact quantiles of a )~2distribution.
4. M I C R O E L E C T R O N I C S - -
High density packaging. Connecting the third dimension. MALCOLM BENNETT. N e w Electron., 26 (February 1988). The demand for smaller, lighter, more powerful yet more reliable electronic equipment has led to faster speeds, higher densities, and smaller components--all pointing to a revolution in interconnection and packaging techniques. According to some manufacturers, the next stage on from integrated circuits is integrated equipment where active and
GENERAL
passive components, circuit function and external casing become intimately bound together.
World class contamination control practices. JAMESBURNETT. Semiconductor int., 160 (April 1988). The Class 1 facility designed today must operate profitably to 1999, and be capable of several generations of technology upgrade.
World Abstracts on Microelectronics and Reliability
This paper gives a tutorial on practical techniques for Markov modeling--concentrating on basic concepts, creating representative models, defining measures of reliability and maintainability, getting around the "exponential only" requirement, and using Markov models to make design decisions. The tutorial should be of interest to reliability engineers or managers unfamiliar with the application of Markov modeling to reliability analysis of repairable systems, and those seeking modeling techniques applicable to non-exponential repair times (time-dependent repair rates).
Using internal testing program in testing the telephone subset integrated circuit. ANDRZEJ GRZEGORCZYK, MAREK OSTANEK, PIOTR RUSZKARSKI, EDWARD STOLARSKI and JAREMI WITEWSKI. Electron. Technol. 19 (3/4), 29 (1986). The paper presents operating features of the telephone subset integrated circuit MC 1930 working as a dialler and a tone ringer. Special attention is paid to the testing of the dialler and the tone ringer in the chip by means of the universal tester. The paper presents the solution to improve testability, describes subroutines placed in the internal ROM and evaluates testing efficiency. Sequential test for the ratio of two constant failure rates. DOLUN OKSOY. IEEE Trans. Reliab. R-36, 605 (1987). An exact sequential test is given for two equipments in terms of the ratio of their constant failure rates. The plans are useful for incentives in life testing of these equipments against one another during their constant failure-rate period. The theory and equations for the tables are developed and the related references are included. Three test plans are summarized. First-generation electronic R&M CAE. DONALD D. HALL. IEEE Trans. Reliab. R-36, 495 (1987). First generation reliability and maintainability computer-aided engineering (R&M CAE) tools for electronic development items consist of design analysis functions generally derived from existing CAE simulation and other software. The role of design analysis is to reduce the uncertainty of the estimated R&M predictions by uncovering potential problems in time for them to be corrected. This paper discusses the applicability of design analysis tools throughout the item development cycle. Generic tool types and their parent CAE software are identified and the status of their availability discussed. Electronic warfare coordination module (EWCM): integrating design, R&M, and logistic support analysis. R. E. BIEDENBENDER and D. B. KLINGENSM1TH. Proc. a. Reliab. Maintainab. Syrup., 405 (1988). Two major trends in defense acquisition are (1) greatly increased emphasis on reliability and maintainability (R&M), supportability and related system readiness parameters, such as Operational Availability (A0), and (2) systems and equipments, particularly in the electronics world, which are software intensive. These trends have resulted in new management challenges in terms of (1) integrating support related considerations such as R&M and Logistic Support Analysis (LSA) into design practices, and (2) the development of R&M and LSA
approaches appropriate for software application. This paper describes the actions taken to address these issues in the detailed design phase on the U.S. Navy's Electronic Warfare Coordination Module (EWCM) Program. The authors conclude that this challenge can be met with minimal additional cost given management support and an appropriate integrated design-R&M-LSA approach.
A satellite failure database system. RATHIN NEOGY and CnI-PING SIu. Proc. a. Reliab. Maintainab. Syrup., 422 (1988). A vast amount of failure history is generated over the life cycle of a satellite program. This data, accumulated from production upto and including on orbit operation, is required to be utilized as a management tool to perform certain essential tasks. These tasks, as a minimum; are: performing failure trend and hardware reliability assessment; conducting the troubleshooting of on orbit anomalies as well as failures that occur during system integration and testing; providing a periodic failure status summary for management overview; assessing the effectiveness of corrective actions and evaluating the test effectiveness of programs. In order to perform these tasks effectively, a versatile database management program is required. This paper describes the database, supported by various application programs, to provide easy and rapid access to failure information. The basic systems, utilizing Ashton Tates' dBase III Plus software program, handles over 40M bytes of failure and hardware configuration information in a PC-based system. The system provides a user-friendly interface with good response time and sufficient flexibility in the search for information and to date has proven to be very effective. An analysis of hardware and software availability exemplified on the IBM 3725 communication controller. I B M J. Res. Dev. 32, 268 (1988). Because of the growing commercial, governmental, and scientific requirements for system availability, evaluating this factor has become increasingly important, This paper presents a unified approach to hardware and software availability of a system in the operational phase. The aim is to evaluate the availability in a given time interval, to show how to improve it, and to determine the probability that a specified level is met over the period. The inputs are the failure and repair rates of the system elements, and the functional relationship between them. Field tracking provides the failure and repair data, and Markov-chain techniques make it possible to construct, reduce, and solve the model. Availability is computed by the program package System Availability Estimator (SAVE). The model has been used and validated with actual field data for the IBM 3725 Communication Controller. Simple Bayes test of equality of exponential means. M. M. SHOUKRI. IEEE Trans. Reliab. R-36, 613 (1987). An approximate z2-test statistic tests the homogeneity of scale parameters of several exponential distributions from a Bayes viewpoint under types I and II censoring. The quantiles of the statistic are simulated and found to be very close to the exact quantiles of a )~2distribution.
4. M I C R O E L E C T R O N I C S - -
High density packaging. Connecting the third dimension. MALCOLM BENNETT. N e w Electron., 26 (February 1988). The demand for smaller, lighter, more powerful yet more reliable electronic equipment has led to faster speeds, higher densities, and smaller components--all pointing to a revolution in interconnection and packaging techniques. According to some manufacturers, the next stage on from integrated circuits is integrated equipment where active and
GENERAL
passive components, circuit function and external casing become intimately bound together.
World class contamination control practices. JAMESBURNETT. Semiconductor int., 160 (April 1988). The Class 1 facility designed today must operate profitably to 1999, and be capable of several generations of technology upgrade.