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Author index to volume 35
Ultramicroscopy 35 (1991) 367-369 North-Holland
367
Author index to volume 35 AI-Khafaji, A., see Rossouw Anderson, V.E., see lllman
35 (1991) 229 35 (1991) 1
Bauer, R., see Frabboni Bonevich, J.E. and L.D. Marks, Electron radiation damage of a-alumina Brrs, E.F., J.L. Hutchison, B. Senger, J,-C. Voegel and R.M. Frank, H R E M study of irradiation damage in h u m a n dental enamel crystals Bullough, P.A. and P.A. Tulloch, Spot-scan imaging of microcrystals of an influenza neuraminidase-antibody fragment complex
35 (1991)265
Camus, P.P., see Melmed Cattermole, D. and R. Henderson, An electronic image drift compensator for electron microscopy Cerva, H., see T h o m a Cherns, D., see Rossouw Crrdova, L., see Lamvik
35 (1991) 161
35 (1991) 305
35 (1991) 131 35 (1991) 277
35 (1991) 35 (1991) 35 (1991) 35(1991)
55 77 229 351
Darst, S.A., see Kubalek Davilla, S.D., see Lamvik De Blasi, C. and D. Manno, Analysis of extended defects in melt-grown GaSe single crystals by convergent beam electron diffraction techniques Dietz, P., P,K. Hansma, K.-H. Herrmann, O. Inacker and H.-D. Lehmann, Atomicforce microscopy of synthetic ultrafiltration membranes in air and under water Drucker, J., M. Krishnamurthy and G. Hembree, Biassed secondary electron imaging of monatomic surface steps on vicinal Si(100) in a U H V STEM
35(1991) 323
Engel, A., see Stemmer
35 (1991) 255
Fedorov, A.A., see Karasev Ferrell, T.L., see lllman Frabboni, S., G. Lulli, P.G. Merli, A. Migliori and R. Bauer, Electron spectroscopic imaging of dopant precipitation and segregation in silicon Frank, R.M., see Brrs
35(1991) 11 35 (1991) 1
Elsevier Science Publishers B.V. (North-Holland)
35 (1991) 295 35 (1991)351
35 (1991) 71
Glaisher, R.W., see Rez Gong, H. and F.W. Schapink, Fine details in satellite H O L Z reflection discs of CBED from a G a A s / A 1 A s multilayer Gribelyuk, M.A., see Karasev Gutakovsky, A.K., see Karasev Hansma, P.K., see Dietz Harada, Y., see Kondo Hawkes, P.W., Vernon Ellis Cosslett (19081990) Hembree, G., see Drucker Henderson, R., C. Raeburn and G. Vigers, A side-entry cold holder for cryo-electron microscopy Henderson, R., see Cattermole Herrmann, K.-H., see Dietz Hirano, H., see Kondo Hohenstein, M., Reconstruction of the exit surface wave function from experimental H R T E M micrographs Hojou, K., see Kushita Horita, Z., T. Sano and M. Nemoto, A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope Howe, J.M., see Shieh Hu, J.J. and F.H. Li, M a x i m u m entropy image deconvolution in high resolution electron microscopy Hutchison, J.L., see Brrs
35 (1991) 65
35 (1991) 171 35 (1991) 11 35 (1991) 11 35 (1991) 155 35 (1991) 111 35 (1991)169 35 (1991) 323
35 35 35 35
(1991) (1991) (1991) (1991)
45 55 155 111
35 (1991) 119 35 (1991)289
35 (1991) 27 35 (1991) 99
35 (1991)339 35(1991)305
35 (1991) 155
35 (1991)265 35 (1991) 305
Illman, B.L., V.E. Anderson, R.J. Warmack and T.L. Ferrell, Energy-loss profiles of transmitted electrons incident on dielectric spheroids Inacker, O., see Dietz Ishibashi, Y., see Kondo Isoda, S., K. Saitoh, S. Moriguchi and T. Kobayashi, Utility test of imaging plate as a high-resolution image-recording material for radiation-sensitive specimens Ito, J., see Tanji
35 (1991) 329 35 (1991) 245
Jing, Z. and F. Sachs, Alignment of tomographic projections using an incomplete set of fiducial markers
35 (1991) 37
35(1991) 1 35 (1991)155 35 (1991) 111
Author index
368 Jordan, I.K., C.J. Rossouw and R. Vincent, Effects of energy filtering in L A C B E D patterns Kanter, Yu.O., see Karasev Karasev, V.Yu., N.A. Kiselev, E.V. Orlova, M.A. Gribelyuk, A.K. Gutakovsky, Yu.O. Kanter, S.M. Pintus, S.V. Rubanov, S.I. Stenin and A.A. Fedorov, H R E M of epitaxial layers in the I n A s / G a A s system Kiselev, N.A., see Karasev Kobayashi, K., see K o n d o Kobayashi, T., see Isoda Kondo, Y., K. Ohi, Y. Ishibashi, H. Hirano, Y. Harada, K. Takayanagi, Y. Tanishiro, K. Kobayashi and K. Yagi, Design and development of an ultrahigh vacuum high-resolution transmission electron microscope Kornberg, R.D., see Kubalek Krishnamurthy, M., see Drucker Kubalek, E.W., R.D. Kornberg and S.A. Darst, Improved transfer of two-dimensional crystals from the a i r / w a t e r interface to specimen support grids for highresolution analysis by electron microscopy Kushita, K.N. and K. Hojou, In situ EELS observation of graphite structure modification due to hydrogen ion irradiation Lamvik, M.K., A.D. Magid, S.D. Davilla and L. Crrdova, Temperature directly affects the rate of irradiation-induced mass loss from phosphatidylcholine multilayers Lehmann, H.-D., see Dietz Li, F.H., see Hu Lulli, G., see Frabboni
35 (1991) 237 35 (1991) 11
35 35 35 35
(1991) 11 (1991)11 (1991) 111 (1991)329
35 (1991) 111 35 (1991) 295 35(1991) 323
35 (1991)295
35 (1991)289
35 35 35 35
(1991) (1991) (1991) (1991)
351 155 339 265
Magid, A.D., see Lamvik Mallett, J.F., see Ostrowski Manno, D., see De Blasi Marks, L.D., see Bonevich Melmed, A.J. and P.P. Camus, Composite thin-film characterization by atom probe field ion microscopy Merli, P.G., see Frabboni Migliori, A., see Frabboni Miller, D.J., Artifacts of specimen charging in X-ray microanalysis in the scanning electron microscope Moriguchi, S., see Isoda
35 35 35 35
(1991) (1991) (1991) (1991)
351 151 71 161
Nemoto, M., see Horita
35 (1991) 27
Ohi, K., see K o n d o Orlova, E.V., see Karasev
35 (1991) 111 35 (1991) 11
35 (1991) 277 35 (1991) 265 35 (1991) 265
35 (1991)357 35 (1991)329
Ostrowski, D. and J.F. Mallett, Active compensation of ambient AC magnetic fields for high-resolution electron microscopy
35 (1991) 151
Perovic, D.D. and G.C. Weatherly, Plan-view diffraction contrast imaging of surface-relaxation effects from strained-layer superlattices Pintus, S.M., see Karasev
35 (1991)271 35 (1991) 11
Raeburn, C., see Henderson Rauf, I.A. and M.G. Walls, A comparative study of microstructure (in ITO films) and techniques (CTEM and STM) Reichelt, R., see Stemmer Rez, P. and R.W. Glaisher, Measurement of energy deposition in transmission electron microscopy Rivacoba, A., see Zabala Rossouw, C.J., A. A1-Khafaji, D. Cherns, J.W. Steeds and R. Touaitia, A treatment of dynamical diffraction for multiply layered structures Rossouw, C.J., see Jordan Rubanov, S.V., see Karasev Sachs, F., see Jing Saitoh, K., see lsoda Sano, T., see Horita Schapink, F.W., see Gong Senger, B., see Brrs Shieh, P.C., C.O. Stanwood and J.M. Howe, Investigation of the atomic structure and visibility of c r y s t a l / a m o r p h o u s interfaces in PdsoSi2o alloy by H R T E M image simulations Shih, W.C. and W.M. Stobbs, The use of the Fresnel Method for the characterisation of a short-period strained G e / S i multilayer. I. Measurement of the average G e / S i volume ratio Shih, W.C. and W.M. Stobbs, The use of the Fresnel Method for the characterisation of a short-period strained G e / S i multilayer. II. Measurement of a layer-thickness irregularity Spence, J.C.H., see Zuo Stanwood, C.O., see Shieh Steeds, J.W., see Rossouw Stemmer, A., R. Reichelt, R. Wyss and A. Engel, Biological structures imaged in a hybrid scanning transmission electron microscope and scanning tunneling microscope Stenin, S.I., see Karasev Stobbs, W.M., see Shih Stobbs, W.M., see Shih
35(1991)
45
35 (1991) 19 35 (1991) 255
35 (1991) 65 35 (1991) 145
35 (1991)229 35 (1991)237 35 (1991) 11 35 35 35 35 35
(1991) 37 (1991) 329 (1991) 27 (1991) 171 (1991)305
35 (1991) 99
35 (1991) 197
35 35 35 35
(1991)217 (1991)185 (1991) 99 (1991)229
35 35 35 35
(1991)255 (1991) 11 (1991) 197 (1991) 217
Author index
Takayanagi, K., see K o n d o Tanishiro, Y., see Kondo Tanji, T., J. Ito and K. Yada, Contrast simulation of high resolution electron holography on surface structures Thoma, S. and H. Cerva, The influence of non-linear interference processes on the H R E M contrast of AIGaAs in (100) projection Touaitia, R., see Rossouw Tulloch, P.A., see Bullough
35 (1991) 77 35 (1991) 229 35 (1991) 131
Vigers, G., see Henderson Vincent, R., see Jordan Voegel, J.-C., see Br6s
35 (1991) 45 35 (1991) 237 35 (1991) 305
Walls, M.G., see Rauf Warmack, R.J., see lllman
35 (1991) 19 35 (1991) 1
35 (1991) 111 35 (1991) 111
35 (1991) 245
369
Weatherly, G.C., see Perovic Wheeler, R., Electropolishing of polycrystalline and single-crystal YBa2Cu307_ ~ for T E M studies Wyss, R., see Stemmer
35 (1991) 59 35 (1991) 255
Yada, K., see Tanji Yagi, K., see Kondo
35 (1991) 245 35 (1991)111
Zabala, N. and A. Rivacoba, Support effects on the surface plasmon modes of small particles Zuo, J.M. and J.C.H. Spence, A u t o m a t e d structure factor refinement from convergent beam patterns
35 (1991) 271
35 (1991) 145
35 (1991) 185
367
Author index to volume 35 AI-Khafaji, A., see Rossouw Anderson, V.E., see lllman
35 (1991) 229 35 (1991) 1
Bauer, R., see Frabboni Bonevich, J.E. and L.D. Marks, Electron radiation damage of a-alumina Brrs, E.F., J.L. Hutchison, B. Senger, J,-C. Voegel and R.M. Frank, H R E M study of irradiation damage in h u m a n dental enamel crystals Bullough, P.A. and P.A. Tulloch, Spot-scan imaging of microcrystals of an influenza neuraminidase-antibody fragment complex
35 (1991)265
Camus, P.P., see Melmed Cattermole, D. and R. Henderson, An electronic image drift compensator for electron microscopy Cerva, H., see T h o m a Cherns, D., see Rossouw Crrdova, L., see Lamvik
35 (1991) 161
35 (1991) 305
35 (1991) 131 35 (1991) 277
35 (1991) 35 (1991) 35 (1991) 35(1991)
55 77 229 351
Darst, S.A., see Kubalek Davilla, S.D., see Lamvik De Blasi, C. and D. Manno, Analysis of extended defects in melt-grown GaSe single crystals by convergent beam electron diffraction techniques Dietz, P., P,K. Hansma, K.-H. Herrmann, O. Inacker and H.-D. Lehmann, Atomicforce microscopy of synthetic ultrafiltration membranes in air and under water Drucker, J., M. Krishnamurthy and G. Hembree, Biassed secondary electron imaging of monatomic surface steps on vicinal Si(100) in a U H V STEM
35(1991) 323
Engel, A., see Stemmer
35 (1991) 255
Fedorov, A.A., see Karasev Ferrell, T.L., see lllman Frabboni, S., G. Lulli, P.G. Merli, A. Migliori and R. Bauer, Electron spectroscopic imaging of dopant precipitation and segregation in silicon Frank, R.M., see Brrs
35(1991) 11 35 (1991) 1
Elsevier Science Publishers B.V. (North-Holland)
35 (1991) 295 35 (1991)351
35 (1991) 71
Glaisher, R.W., see Rez Gong, H. and F.W. Schapink, Fine details in satellite H O L Z reflection discs of CBED from a G a A s / A 1 A s multilayer Gribelyuk, M.A., see Karasev Gutakovsky, A.K., see Karasev Hansma, P.K., see Dietz Harada, Y., see Kondo Hawkes, P.W., Vernon Ellis Cosslett (19081990) Hembree, G., see Drucker Henderson, R., C. Raeburn and G. Vigers, A side-entry cold holder for cryo-electron microscopy Henderson, R., see Cattermole Herrmann, K.-H., see Dietz Hirano, H., see Kondo Hohenstein, M., Reconstruction of the exit surface wave function from experimental H R T E M micrographs Hojou, K., see Kushita Horita, Z., T. Sano and M. Nemoto, A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope Howe, J.M., see Shieh Hu, J.J. and F.H. Li, M a x i m u m entropy image deconvolution in high resolution electron microscopy Hutchison, J.L., see Brrs
35 (1991) 65
35 (1991) 171 35 (1991) 11 35 (1991) 11 35 (1991) 155 35 (1991) 111 35 (1991)169 35 (1991) 323
35 35 35 35
(1991) (1991) (1991) (1991)
45 55 155 111
35 (1991) 119 35 (1991)289
35 (1991) 27 35 (1991) 99
35 (1991)339 35(1991)305
35 (1991) 155
35 (1991)265 35 (1991) 305
Illman, B.L., V.E. Anderson, R.J. Warmack and T.L. Ferrell, Energy-loss profiles of transmitted electrons incident on dielectric spheroids Inacker, O., see Dietz Ishibashi, Y., see Kondo Isoda, S., K. Saitoh, S. Moriguchi and T. Kobayashi, Utility test of imaging plate as a high-resolution image-recording material for radiation-sensitive specimens Ito, J., see Tanji
35 (1991) 329 35 (1991) 245
Jing, Z. and F. Sachs, Alignment of tomographic projections using an incomplete set of fiducial markers
35 (1991) 37
35(1991) 1 35 (1991)155 35 (1991) 111
Author index
368 Jordan, I.K., C.J. Rossouw and R. Vincent, Effects of energy filtering in L A C B E D patterns Kanter, Yu.O., see Karasev Karasev, V.Yu., N.A. Kiselev, E.V. Orlova, M.A. Gribelyuk, A.K. Gutakovsky, Yu.O. Kanter, S.M. Pintus, S.V. Rubanov, S.I. Stenin and A.A. Fedorov, H R E M of epitaxial layers in the I n A s / G a A s system Kiselev, N.A., see Karasev Kobayashi, K., see K o n d o Kobayashi, T., see Isoda Kondo, Y., K. Ohi, Y. Ishibashi, H. Hirano, Y. Harada, K. Takayanagi, Y. Tanishiro, K. Kobayashi and K. Yagi, Design and development of an ultrahigh vacuum high-resolution transmission electron microscope Kornberg, R.D., see Kubalek Krishnamurthy, M., see Drucker Kubalek, E.W., R.D. Kornberg and S.A. Darst, Improved transfer of two-dimensional crystals from the a i r / w a t e r interface to specimen support grids for highresolution analysis by electron microscopy Kushita, K.N. and K. Hojou, In situ EELS observation of graphite structure modification due to hydrogen ion irradiation Lamvik, M.K., A.D. Magid, S.D. Davilla and L. Crrdova, Temperature directly affects the rate of irradiation-induced mass loss from phosphatidylcholine multilayers Lehmann, H.-D., see Dietz Li, F.H., see Hu Lulli, G., see Frabboni
35 (1991) 237 35 (1991) 11
35 35 35 35
(1991) 11 (1991)11 (1991) 111 (1991)329
35 (1991) 111 35 (1991) 295 35(1991) 323
35 (1991)295
35 (1991)289
35 35 35 35
(1991) (1991) (1991) (1991)
351 155 339 265
Magid, A.D., see Lamvik Mallett, J.F., see Ostrowski Manno, D., see De Blasi Marks, L.D., see Bonevich Melmed, A.J. and P.P. Camus, Composite thin-film characterization by atom probe field ion microscopy Merli, P.G., see Frabboni Migliori, A., see Frabboni Miller, D.J., Artifacts of specimen charging in X-ray microanalysis in the scanning electron microscope Moriguchi, S., see Isoda
35 35 35 35
(1991) (1991) (1991) (1991)
351 151 71 161
Nemoto, M., see Horita
35 (1991) 27
Ohi, K., see K o n d o Orlova, E.V., see Karasev
35 (1991) 111 35 (1991) 11
35 (1991) 277 35 (1991) 265 35 (1991) 265
35 (1991)357 35 (1991)329
Ostrowski, D. and J.F. Mallett, Active compensation of ambient AC magnetic fields for high-resolution electron microscopy
35 (1991) 151
Perovic, D.D. and G.C. Weatherly, Plan-view diffraction contrast imaging of surface-relaxation effects from strained-layer superlattices Pintus, S.M., see Karasev
35 (1991)271 35 (1991) 11
Raeburn, C., see Henderson Rauf, I.A. and M.G. Walls, A comparative study of microstructure (in ITO films) and techniques (CTEM and STM) Reichelt, R., see Stemmer Rez, P. and R.W. Glaisher, Measurement of energy deposition in transmission electron microscopy Rivacoba, A., see Zabala Rossouw, C.J., A. A1-Khafaji, D. Cherns, J.W. Steeds and R. Touaitia, A treatment of dynamical diffraction for multiply layered structures Rossouw, C.J., see Jordan Rubanov, S.V., see Karasev Sachs, F., see Jing Saitoh, K., see lsoda Sano, T., see Horita Schapink, F.W., see Gong Senger, B., see Brrs Shieh, P.C., C.O. Stanwood and J.M. Howe, Investigation of the atomic structure and visibility of c r y s t a l / a m o r p h o u s interfaces in PdsoSi2o alloy by H R T E M image simulations Shih, W.C. and W.M. Stobbs, The use of the Fresnel Method for the characterisation of a short-period strained G e / S i multilayer. I. Measurement of the average G e / S i volume ratio Shih, W.C. and W.M. Stobbs, The use of the Fresnel Method for the characterisation of a short-period strained G e / S i multilayer. II. Measurement of a layer-thickness irregularity Spence, J.C.H., see Zuo Stanwood, C.O., see Shieh Steeds, J.W., see Rossouw Stemmer, A., R. Reichelt, R. Wyss and A. Engel, Biological structures imaged in a hybrid scanning transmission electron microscope and scanning tunneling microscope Stenin, S.I., see Karasev Stobbs, W.M., see Shih Stobbs, W.M., see Shih
35(1991)
45
35 (1991) 19 35 (1991) 255
35 (1991) 65 35 (1991) 145
35 (1991)229 35 (1991)237 35 (1991) 11 35 35 35 35 35
(1991) 37 (1991) 329 (1991) 27 (1991) 171 (1991)305
35 (1991) 99
35 (1991) 197
35 35 35 35
(1991)217 (1991)185 (1991) 99 (1991)229
35 35 35 35
(1991)255 (1991) 11 (1991) 197 (1991) 217
Author index
Takayanagi, K., see K o n d o Tanishiro, Y., see Kondo Tanji, T., J. Ito and K. Yada, Contrast simulation of high resolution electron holography on surface structures Thoma, S. and H. Cerva, The influence of non-linear interference processes on the H R E M contrast of AIGaAs in (100) projection Touaitia, R., see Rossouw Tulloch, P.A., see Bullough
35 (1991) 77 35 (1991) 229 35 (1991) 131
Vigers, G., see Henderson Vincent, R., see Jordan Voegel, J.-C., see Br6s
35 (1991) 45 35 (1991) 237 35 (1991) 305
Walls, M.G., see Rauf Warmack, R.J., see lllman
35 (1991) 19 35 (1991) 1
35 (1991) 111 35 (1991) 111
35 (1991) 245
369
Weatherly, G.C., see Perovic Wheeler, R., Electropolishing of polycrystalline and single-crystal YBa2Cu307_ ~ for T E M studies Wyss, R., see Stemmer
35 (1991) 59 35 (1991) 255
Yada, K., see Tanji Yagi, K., see Kondo
35 (1991) 245 35 (1991)111
Zabala, N. and A. Rivacoba, Support effects on the surface plasmon modes of small particles Zuo, J.M. and J.C.H. Spence, A u t o m a t e d structure factor refinement from convergent beam patterns
35 (1991) 271
35 (1991) 145
35 (1991) 185