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ESD in silicon integrated circuits
Microelectron. Reliab., Voh 36, No. 4, pp. 563-565, 1996 Copyright @ 1996 Published by Elsevier Science Ltd Printed in Great Britain 0026-2714/96 $15.00+.00
Pergamon
BOOK REVIEWS
ESD IN SILICON INTEGRATED CIRCUITS
AJITH AMERASEKERA
AUTHORS :
CHARVAKA DUVVURY
PUBLISHERS
JOHN WILEY AND SONS LIMITED,
:
Baffins Lane, CHICHESTER, West Sussex,
POI9 IUD,
ENGLAND.
:
PRICE
£ 45.00.
(ISBN O-471-95481-0)
Published
Electrostatic grown of
in importance
transistors
Discharge
(ESD)
as technologies
on a single
chip approach
to ESD events
in semiconductor
operation.
Hence,
the
phenomena
shrink
devices
physics
approaches
Over the years the
physics
conference
in this
the5 million mark,
governing
book
most
of which
design
book
is intended
for
and transistor
should
The coverage
(IC)a
have
The phenomena
related
the realm of normal device
behaviour
are
not
typically
found
Similarly the circuit design issues involve
has
in general
been
also
engineers
books on electronic
published
to graduate
in a number
design.
design and
of papers
and
Reliability
The
book
should
in the field of
the basics presented
in the field of semiconductor
be of
(4)
great
by the chapter headings,
and Test Methods;
(3)
(8)
(6)
interest
563
(5) Failure
Modelling and Characterization;
Conclusions;
is on reliability
as follows:-
Physics and Operation
Design and Layout Requirements;
Issues and Case Studies;
as the emphasis
working
In addition,
students
as instanced
ESD Phenomena
Influence of Processing on ESD;
RELIABILITY",
scientists
modelling.
is extensive, (2)
and
device design.
appeal
of ESD Protection Circuit Elements;
(7)
circuits
proceedings.
Introduction;
Modes,
this
which are not covered
reliability and device/circuit
(i)
integrated
to below 0.5 jam dimensions and the number
there has been much work done in the areas of ESD circuit
involved,
The IC circuit
in
1995
take place outside
in general textbooks on semiconductors. non-standard
:
and Index.
to readers throughout
of
"MICROELECTRONICS
the book.
AND
Pergamon
BOOK REVIEWS
ESD IN SILICON INTEGRATED CIRCUITS
AJITH AMERASEKERA
AUTHORS :
CHARVAKA DUVVURY
PUBLISHERS
JOHN WILEY AND SONS LIMITED,
:
Baffins Lane, CHICHESTER, West Sussex,
POI9 IUD,
ENGLAND.
:
PRICE
£ 45.00.
(ISBN O-471-95481-0)
Published
Electrostatic grown of
in importance
transistors
Discharge
(ESD)
as technologies
on a single
chip approach
to ESD events
in semiconductor
operation.
Hence,
the
phenomena
shrink
devices
physics
approaches
Over the years the
physics
conference
in this
the5 million mark,
governing
book
most
of which
design
book
is intended
for
and transistor
should
The coverage
(IC)a
have
The phenomena
related
the realm of normal device
behaviour
are
not
typically
found
Similarly the circuit design issues involve
has
in general
been
also
engineers
books on electronic
published
to graduate
in a number
design.
design and
of papers
and
Reliability
The
book
should
in the field of
the basics presented
in the field of semiconductor
be of
(4)
great
by the chapter headings,
and Test Methods;
(3)
(8)
(6)
interest
563
(5) Failure
Modelling and Characterization;
Conclusions;
is on reliability
as follows:-
Physics and Operation
Design and Layout Requirements;
Issues and Case Studies;
as the emphasis
working
In addition,
students
as instanced
ESD Phenomena
Influence of Processing on ESD;
RELIABILITY",
scientists
modelling.
is extensive, (2)
and
device design.
appeal
of ESD Protection Circuit Elements;
(7)
circuits
proceedings.
Introduction;
Modes,
this
which are not covered
reliability and device/circuit
(i)
integrated
to below 0.5 jam dimensions and the number
there has been much work done in the areas of ESD circuit
involved,
The IC circuit
in
1995
take place outside
in general textbooks on semiconductors. non-standard
:
and Index.
to readers throughout
of
"MICROELECTRONICS
the book.
AND