- Email: [email protected]
35 ns access with Inmos static RAM
Analyser is portable Two microsystem analysers have been produced by US firm CT Computest for boards built around VLSI components and microprocessors. The model 4000 is a portable unit. The 4500 is a test console for use in a permanent location. Both models test and troubleshoot using incircuit emulation (ICE), signature analysis and time domain analysis, l esting through ICE allows realtime functional testing at system clock speeds. The unit under test is accessed via the microprocessor socket rather than an edge connector. Common test programs resident in PROM can be used. Signature analysis uses stimulus at one end of a data path and monitors output at the other end. ICE generates the stimulus. Time domain analysis is used to measure frequencies, pulses and transitions. Clock operation and software timing loops can be verified with this technique. Pulse widths and cycle times can also be measured. This analysis is used for testing serial I/O and other asynchronous devices.
a processorssocket The microsystem analyser can be used as a standalone instrument for Go/NoGo testing or test routines stored in RaM. It can also be combined with software and a workstation for guidedprobe diagnostics. Here test routines are downloaded from a host computer to the microsystem analyser. It in turn directs the operator's probing through a 20-character display. RS232 communication allows testing and diagnosis over remote sites via a modem. (CT
Computest, PO Box 5552, Titusville, FL 32780, USA. Telex: 5109503000. UK distributor: MTL Microtesting Ltd, Test House, Mill Lane, Alton, Hants GU34 2QG, UK. Tel: (0420) 88022. Telex: 858456 (MTLG))
Automatic ROM learning 'reduces test programming effort' Automatic RaM learning has been included in Fairchild's AFIT 3000C. The AFIT (automatic fault isolation test) 3000C is a digital incircuit test system. With RaM learning, it automatically learns the contents of a RaM known to be good. This reduces the user's test programming effort, says UK distributor MTL Microtesting. The desk-style test system is designed for isolating faults in printed circuit boards. It can test the board for shorts, and each integrated circuit for functionality and drive. The AFIT 3000C combines incircuit test technology with clip access testing. It is intended for programming as well. The operator can write IC programs from scratch. Alternatively, programs
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from the library of programs supplied with the system can be modifed. Modified programs are stored on floppy disc. The AFIT 3000C can download programs for use on the AFIT 1500 benchtop tester. It has a video terminal for viewing and entering information. There is a foot switch for hands-off te sti ng. The system is designed so that power to a board under test is removed between tests and at failures during tests. Prepared programs can be write protected against unwanted changes.
(Fairchild Test Systems Group, 23 Cobham Road, Ferndown Industrial Estate, Wimborne, Dorset BH21 7PE, UK)
35 ns access with Inmos static RAM A static RAM with an access speed of 35 ns has been announced by UK firm Inmos. The IMS1400-35 is a 16k x 1 NMOS RAM. A 35 ns, 4k x 4 static RAM known as the IMS1420-35 will also be available before the end of th the year, says Inmos Director of Marketing, David Sherwood. The IMS1400-35 comes in plastic and ceramic DIPs, at £15.70 and £18.50 respectively. The ceramic chip carrier version is £22.50. These prices are for 100-piece quantities. Inmos says that the maximum power consumption of the RAM is 660 mW. The standby value given is 110 mW. (Inmos Ltd, Whitefriars,
Lewins Mead, Bristol BS1 2NP, UK. Tel: (0272) 290861. Telex: 444723)
100 MHz oscilloscope for ATE from Gould The 100 MHz intelligent oscilloscope announced by Gould in the UK has a built-in IEEE-488 interface. The 5110 oscilloscope makes measurements in the same way as the OS5100. Gould has designed the 5110 to make interfacing as part of an automatic test system easier. The internal circuit board layout is intended to allow a greater degree of automation during manufacture. For triggering, the 5110 includes delay-by events up to 999 999 999 and delay-by time with a resolution of 10 ns up to a maximum of 344 s. Waveform parameters can be measured automatically with the menu control system. Control settings, centre-line voltage and measurement results are displayed alphanumerically. Gould says that the built-in digital storage system can take waveforms with bandwidths up to 100 MHz, and that the sample rate for transient storage can be up to 1 MHz. Two stores of 1024 words each are included. The vertical resolution is specified as 8 bits.
(Gould Instruments Ltd, Roebuck Road, Hainault, I/ford, Essex IG6 3UE, UK. Tel: 01-500 1000. Telex: 263785)
microprocessors and microsystems
a processorssocket The microsystem analyser can be used as a standalone instrument for Go/NoGo testing or test routines stored in RaM. It can also be combined with software and a workstation for guidedprobe diagnostics. Here test routines are downloaded from a host computer to the microsystem analyser. It in turn directs the operator's probing through a 20-character display. RS232 communication allows testing and diagnosis over remote sites via a modem. (CT
Computest, PO Box 5552, Titusville, FL 32780, USA. Telex: 5109503000. UK distributor: MTL Microtesting Ltd, Test House, Mill Lane, Alton, Hants GU34 2QG, UK. Tel: (0420) 88022. Telex: 858456 (MTLG))
Automatic ROM learning 'reduces test programming effort' Automatic RaM learning has been included in Fairchild's AFIT 3000C. The AFIT (automatic fault isolation test) 3000C is a digital incircuit test system. With RaM learning, it automatically learns the contents of a RaM known to be good. This reduces the user's test programming effort, says UK distributor MTL Microtesting. The desk-style test system is designed for isolating faults in printed circuit boards. It can test the board for shorts, and each integrated circuit for functionality and drive. The AFIT 3000C combines incircuit test technology with clip access testing. It is intended for programming as well. The operator can write IC programs from scratch. Alternatively, programs
454
from the library of programs supplied with the system can be modifed. Modified programs are stored on floppy disc. The AFIT 3000C can download programs for use on the AFIT 1500 benchtop tester. It has a video terminal for viewing and entering information. There is a foot switch for hands-off te sti ng. The system is designed so that power to a board under test is removed between tests and at failures during tests. Prepared programs can be write protected against unwanted changes.
(Fairchild Test Systems Group, 23 Cobham Road, Ferndown Industrial Estate, Wimborne, Dorset BH21 7PE, UK)
35 ns access with Inmos static RAM A static RAM with an access speed of 35 ns has been announced by UK firm Inmos. The IMS1400-35 is a 16k x 1 NMOS RAM. A 35 ns, 4k x 4 static RAM known as the IMS1420-35 will also be available before the end of th the year, says Inmos Director of Marketing, David Sherwood. The IMS1400-35 comes in plastic and ceramic DIPs, at £15.70 and £18.50 respectively. The ceramic chip carrier version is £22.50. These prices are for 100-piece quantities. Inmos says that the maximum power consumption of the RAM is 660 mW. The standby value given is 110 mW. (Inmos Ltd, Whitefriars,
Lewins Mead, Bristol BS1 2NP, UK. Tel: (0272) 290861. Telex: 444723)
100 MHz oscilloscope for ATE from Gould The 100 MHz intelligent oscilloscope announced by Gould in the UK has a built-in IEEE-488 interface. The 5110 oscilloscope makes measurements in the same way as the OS5100. Gould has designed the 5110 to make interfacing as part of an automatic test system easier. The internal circuit board layout is intended to allow a greater degree of automation during manufacture. For triggering, the 5110 includes delay-by events up to 999 999 999 and delay-by time with a resolution of 10 ns up to a maximum of 344 s. Waveform parameters can be measured automatically with the menu control system. Control settings, centre-line voltage and measurement results are displayed alphanumerically. Gould says that the built-in digital storage system can take waveforms with bandwidths up to 100 MHz, and that the sample rate for transient storage can be up to 1 MHz. Two stores of 1024 words each are included. The vertical resolution is specified as 8 bits.
(Gould Instruments Ltd, Roebuck Road, Hainault, I/ford, Essex IG6 3UE, UK. Tel: 01-500 1000. Telex: 263785)
microprocessors and microsystems