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43rd Annual Conference on Physical Electronics
and Related Phenomena, X(1983) 97-QB Elsevier Science Publishers B.V., Amsterdam - Printed in The Netherlands
Jownal of Electron Spectroscopy
Announcements 43rd
ANNUAL
CONFERENCE
ON PHYSICAL
ELECTRONICS
Annual Conference on Physical Electronics will be held at The Bishop’s Lodge, Sante Fe, New Mexico, U.S.A., June 20-22, 1983. The Conference Committee invites the submission of experimental and theoretical papers concerned with the physics and chemistry of solid surfaces and interfaces. Such papers may relate to the electronic, crystallographic or electronic structure of surfaces and interfaces as obtained by electron diffraction and by various optical and electron spectroscopies. Both the static and dynamic properties of surfaces, which are clean or incorporate known foreign atoms, are of interest. Papers which present new methods of surface analysis and characterization are also acceptable. The emphasis of the conference, however, is on the description of surface and interface properties and processes at a fundamental atomic molecular level. Further details of the conference including a detailed statement of paper selection criteria and abstract format can be obtained from the Local Chairman, Dr. R.L. Schwoebel, Code 1110, Sandia National Laboratories, Albuquerque, NM 87185, U.S.A. The deadline for the receipt of the abstracts is May 2,1983. The
43rd
\
5th SYMPOSIUM ON APPLIED SURFACE ANALYSIS The 5th Symposium on Applied Surface Analysis will be held on 8-10 June, 1983, at the University of Dayton, Dayton, OH, U.S.A. Topics will include, but are not limited to, corrosion and oxidation, adhesion and composites, electronics devices, energy conversion, thin films, thermionic emission, catalysis, and measurement techniques. The Symposium will consist of both invited and contributed papers. The proceedings will be published in a special issue of “Applications of Surface Science”. The symposium will be preceded by a twoday short course “Techniques for Surface Analysis” on 6-7 June, 1983. Participants who intend to present a paper should submit an abstract by 1 April, 1983, and indicate of they intend to submit a full length paper for publication in the Proceedings. Abstracts must be suitable for reproduction and typed on a single page (8?4” x 11” with 1” border) with headings that include title, author’s name, affiliation, and address. The name of the person presenting the paper should be underlined. Manuscripts to be included in the Proceedings are due at the Symposium. Abstracts should be sent to and further information can be obtained from either of the following: Dr. John T. Grant Research Institute, University of Dayton, U.S.A.
Dr. James S. Murday Naval Research Laboratory, Washington, DC 20375, U.S.A.
Jownal of Electron Spectroscopy
Announcements 43rd
ANNUAL
CONFERENCE
ON PHYSICAL
ELECTRONICS
Annual Conference on Physical Electronics will be held at The Bishop’s Lodge, Sante Fe, New Mexico, U.S.A., June 20-22, 1983. The Conference Committee invites the submission of experimental and theoretical papers concerned with the physics and chemistry of solid surfaces and interfaces. Such papers may relate to the electronic, crystallographic or electronic structure of surfaces and interfaces as obtained by electron diffraction and by various optical and electron spectroscopies. Both the static and dynamic properties of surfaces, which are clean or incorporate known foreign atoms, are of interest. Papers which present new methods of surface analysis and characterization are also acceptable. The emphasis of the conference, however, is on the description of surface and interface properties and processes at a fundamental atomic molecular level. Further details of the conference including a detailed statement of paper selection criteria and abstract format can be obtained from the Local Chairman, Dr. R.L. Schwoebel, Code 1110, Sandia National Laboratories, Albuquerque, NM 87185, U.S.A. The deadline for the receipt of the abstracts is May 2,1983. The
43rd
\
5th SYMPOSIUM ON APPLIED SURFACE ANALYSIS The 5th Symposium on Applied Surface Analysis will be held on 8-10 June, 1983, at the University of Dayton, Dayton, OH, U.S.A. Topics will include, but are not limited to, corrosion and oxidation, adhesion and composites, electronics devices, energy conversion, thin films, thermionic emission, catalysis, and measurement techniques. The Symposium will consist of both invited and contributed papers. The proceedings will be published in a special issue of “Applications of Surface Science”. The symposium will be preceded by a twoday short course “Techniques for Surface Analysis” on 6-7 June, 1983. Participants who intend to present a paper should submit an abstract by 1 April, 1983, and indicate of they intend to submit a full length paper for publication in the Proceedings. Abstracts must be suitable for reproduction and typed on a single page (8?4” x 11” with 1” border) with headings that include title, author’s name, affiliation, and address. The name of the person presenting the paper should be underlined. Manuscripts to be included in the Proceedings are due at the Symposium. Abstracts should be sent to and further information can be obtained from either of the following: Dr. John T. Grant Research Institute, University of Dayton, U.S.A.
Dr. James S. Murday Naval Research Laboratory, Washington, DC 20375, U.S.A.