Electron Optics and Electron Microscopy. P. W. H A W K E S . Taylor and Francis, London, pp. x v i + 240, 1972. Price: £5.00. Relatively few text books on electron microscopy have appeared in the recent past. Electron microscopists seeking to keep abreast of the recent upsurge of developments in transmission and scanning electron microscopy, have usually to search through the massive volumes of Proceedings of the International or Regional Electron Microscope Conferences which appear every two years. It is refreshing, therefore, to come across a text book which deals with up-todate developments such as high voltage microscopy, energy analysis, transmission scanning microscopy, field emission guns, super-conducting lenses, etc. This book of 240 pages has 5 chapters: (1) Development of the Electron Microscope; (2) The Electron Lens; (3) T h e Electron Microscope; (4) Scanning Electron Microscopy and the Study of Surfaces; (5) Applications. In general the author presents a very well written account of the principles of transmission and scanning electron microscopy with considerable emphasis on the electron optics of these basic instruments in addition to devoting an equal amount of space to the newer developments in these fields. Other sections deal with the attainment of high resolution, applications of the electron microscope, image contrast mechanisms and a brief but highly readable and well illustrated account of the history of the electron microscope. The section on image contrast is unique in that after very briefly considering diffraction contrast the writer presents a detailed account of contrast formation at high resolution where the mechanism depends on spherical aberration and defocussing. The short final chapter on 'Applications' is merely an introduction to the subject but is illustrated with a useful variety of electron micrographs ranging from one of Marton's earliest biological micrographs taken in 1934 to Crewe's recent transmission scanning image of thorium atoms. Most of the book is easy to read but it is only fair to point out that the depth of treatment of some sections, such as the chapter on the electron lens, means that considerable effort is required to assimilate all the information in these detailed presentations. The author does his best to help, however, without relaxing the treatment. For example in the section on image contrast the reader is given the choice of working through 22 pages of theory or a 1 page non-mathematical summary. T h e text is well printed with excellent photographs and line diagrams, and with a hard cover represents good value at £5.00. At the end of each chapter the reader is referred to a very useful selection of standard and recent references with excellent guidance to further reading. The book does not replace the standard texts on electron microscopy but those seeking a shorter account of electron optical aspects of electron microscopy than the standard work by Grivet, or those microscopists wishing to familiarise themselves with current and recent developments in instrumentation, will find this book extremely useful. For this latter reason the book is essential reading for the majority of electron microscopists. S. R. Keown