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Improved XRF spectrometer is easy to use
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06/15/2006
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TOOLS & TECHNIQUES UPDATE
fluorescence (ED-XRF) analysis of materials using polarized excitation. It now offers greater accuracy and stability with improved flexibility for use. XEPOS comes equipped with a Si drift detector for lower detection limits, especially in the analysis of light elements. By using additional secondary targets, detection limits for certain elements can be lowered even further.
SEM offers ultrahigh resolution JEOL’s new field-emission scanning electron microscope (SEM) is designed for imaging medical, biological, materials science, and semiconductor samples at the nanoscale. The advanced optics of the JSM-7500F allow specimens up to 200 mm in diameter to be observed at magnifications of up to 1 000 000x. The SEM can achieve a resolution of 1.4 nm at an accelerating voltage of 1 kV or 0.6 nm at 30 kV. A new low-angle backscattered electron detector (LABe) reduces charging to give enhanced surface detail and compositional contrast. A gentle beam mode can be used with accelerating voltages down to 100 V, reducing sample contamination and suppressing charge buildup. A new r-filter also lets the detected energy range of secondary and backscattered electrons to be selected. This allows the user to decide the mode of image contrast: composition, topography, or a mixture of the two. The large chamber of the JSM-7500F has ports for several attachments. The system also allows four live images from a variety of detectors to be compared on screen. Contact: www.jeol.com
The sample plate has 12 sample positions for specimens between 32 mm and 40 mm in diameter. This allows researchers to set up the instrument in automatic analysis mode for unattended operation. The improved software includes an easy-to-use wizard that guides users through method development. Contact: www.spectro.com
SPECTRO Analytical Instruments has updated its XEPOS instrument for energy-dispersive X-ray
58
Oxford Instruments has released the latest version of its INCA microanalysis suite, a platform for X-ray analysis in scanning and transmission electron microscopes. Issue 17 includes new processes and enhancements that improve and simplify the functionality of the software. Quantmap allows the quantitative mapping of samples from data collected using Smartmap. Spectrum Examiner is a tool designed to ensure elements from minor phases in a sample are identified in an intuitive way. INCAFeature has been updated to make sample areas easier to define and edit. The spectrum reconstruction overlay function can be used with transmission electron microscopy for elemental peak analysis. Contact: www.oxford-instruments.com
Accessorize your laser
Probe station provides new field for research A horizontal-field, electromagnet-based probe station has been launched by Lake Shore Cryotronics that is ideal for measuring magnetotransport, electrical, and electro-optical properties of materials or characterizing their dc, radio frequency, or microwave response. The Model EMTTP4 is suitable for studying nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices. The probe station provides field strengths > 0.4 T over a temperature range of 10-450 K. It can be configured with up to four micromanipulated probe arms and can accommodate samples up to 1” in diameter. Electromagnetic fields can be swept quickly from an external source for fast field cycling. Samples can also be rotated through 360° for angular dependent magnetoresistance measurements.
Improved XRF spectrometer is easy to use
Enhanced analysis suite
Field-dependent measurements can be made at room temperature or using liquid nitrogen. Liquid helium is required for cooling samples below 80 K but is not required to cool the magnet, so improving efficiency. Contact: www.lakeshore.com
JULY-AUGUST 2006 | VOLUME 9 | NUMBER 7-8
Newport’s Ultrafast Laser Accessory Kits are designed to help researchers set up ultrafast laser experiments quickly, and contain the fundamental building blocks needed to route the output of an oscillator and amplifier source to an experiment. The kits include mirrors, beamsplitters, waveplates, and lenses optimized for laser wavelengths of 700-930 nm. Several SUPREMA and ULTIMA kinematic mirror mounts are provided along with a selection of optomechanical components. The kits are especially intended to complement Spectra-Physics' Mai Tai, Tsunami, and Spitfire Pro lasers. Contact: www.newport.com
High-power diode lasers A next-generation diode laser platform unveiled by Spectra-Physics makes use of a new epitaxial design, a state-ofthe-art growth process, and device engineering. The new line of 900-980 nm diode laser sources show higher power and efficiency as well as improved reliability. Spectra-Physics report 71% power conversion efficiency (PCE) for 940 nm continuous wave single emitters at 15°C. Single emitters 100 µm wide and 3 mm long designed for 8 W output power applications show 68.5% peak PCE at 25°C. The company expects that the diode lasers will drive new levels of performance in high-power laser systems. Contact: www.spectra-physics.com
06/15/2006
10:50
Page 58
TOOLS & TECHNIQUES UPDATE
fluorescence (ED-XRF) analysis of materials using polarized excitation. It now offers greater accuracy and stability with improved flexibility for use. XEPOS comes equipped with a Si drift detector for lower detection limits, especially in the analysis of light elements. By using additional secondary targets, detection limits for certain elements can be lowered even further.
SEM offers ultrahigh resolution JEOL’s new field-emission scanning electron microscope (SEM) is designed for imaging medical, biological, materials science, and semiconductor samples at the nanoscale. The advanced optics of the JSM-7500F allow specimens up to 200 mm in diameter to be observed at magnifications of up to 1 000 000x. The SEM can achieve a resolution of 1.4 nm at an accelerating voltage of 1 kV or 0.6 nm at 30 kV. A new low-angle backscattered electron detector (LABe) reduces charging to give enhanced surface detail and compositional contrast. A gentle beam mode can be used with accelerating voltages down to 100 V, reducing sample contamination and suppressing charge buildup. A new r-filter also lets the detected energy range of secondary and backscattered electrons to be selected. This allows the user to decide the mode of image contrast: composition, topography, or a mixture of the two. The large chamber of the JSM-7500F has ports for several attachments. The system also allows four live images from a variety of detectors to be compared on screen. Contact: www.jeol.com
The sample plate has 12 sample positions for specimens between 32 mm and 40 mm in diameter. This allows researchers to set up the instrument in automatic analysis mode for unattended operation. The improved software includes an easy-to-use wizard that guides users through method development. Contact: www.spectro.com
SPECTRO Analytical Instruments has updated its XEPOS instrument for energy-dispersive X-ray
58
Oxford Instruments has released the latest version of its INCA microanalysis suite, a platform for X-ray analysis in scanning and transmission electron microscopes. Issue 17 includes new processes and enhancements that improve and simplify the functionality of the software. Quantmap allows the quantitative mapping of samples from data collected using Smartmap. Spectrum Examiner is a tool designed to ensure elements from minor phases in a sample are identified in an intuitive way. INCAFeature has been updated to make sample areas easier to define and edit. The spectrum reconstruction overlay function can be used with transmission electron microscopy for elemental peak analysis. Contact: www.oxford-instruments.com
Accessorize your laser
Probe station provides new field for research A horizontal-field, electromagnet-based probe station has been launched by Lake Shore Cryotronics that is ideal for measuring magnetotransport, electrical, and electro-optical properties of materials or characterizing their dc, radio frequency, or microwave response. The Model EMTTP4 is suitable for studying nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices. The probe station provides field strengths > 0.4 T over a temperature range of 10-450 K. It can be configured with up to four micromanipulated probe arms and can accommodate samples up to 1” in diameter. Electromagnetic fields can be swept quickly from an external source for fast field cycling. Samples can also be rotated through 360° for angular dependent magnetoresistance measurements.
Improved XRF spectrometer is easy to use
Enhanced analysis suite
Field-dependent measurements can be made at room temperature or using liquid nitrogen. Liquid helium is required for cooling samples below 80 K but is not required to cool the magnet, so improving efficiency. Contact: www.lakeshore.com
JULY-AUGUST 2006 | VOLUME 9 | NUMBER 7-8
Newport’s Ultrafast Laser Accessory Kits are designed to help researchers set up ultrafast laser experiments quickly, and contain the fundamental building blocks needed to route the output of an oscillator and amplifier source to an experiment. The kits include mirrors, beamsplitters, waveplates, and lenses optimized for laser wavelengths of 700-930 nm. Several SUPREMA and ULTIMA kinematic mirror mounts are provided along with a selection of optomechanical components. The kits are especially intended to complement Spectra-Physics' Mai Tai, Tsunami, and Spitfire Pro lasers. Contact: www.newport.com
High-power diode lasers A next-generation diode laser platform unveiled by Spectra-Physics makes use of a new epitaxial design, a state-ofthe-art growth process, and device engineering. The new line of 900-980 nm diode laser sources show higher power and efficiency as well as improved reliability. Spectra-Physics report 71% power conversion efficiency (PCE) for 940 nm continuous wave single emitters at 15°C. Single emitters 100 µm wide and 3 mm long designed for 8 W output power applications show 68.5% peak PCE at 25°C. The company expects that the diode lasers will drive new levels of performance in high-power laser systems. Contact: www.spectra-physics.com