Microelectronic circuits

Microelectronic circuits

Classified abstracts 609--610 56. Electrical engineering, electronic circuits, electrical devices 56 Decreasing half-shadows when preparing thin condu...

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Classified abstracts 609--610 56. Electrical engineering, electronic circuits, electrical devices 56 Decreasing half-shadows when preparing thin conducting films. See abstract number 581. 56 Microelectronics: a survey. See abstract number 586. 56 Microelectronic circuits. See abstract number 587. 56 Laser-heated cathode. See abstract number 591. 56 Very high current density electron beams. See abstract number 595.

57. Mechanical engineering 57 609. Method of testing the tensile strength of small samples at temperature up to 1600°C in vacuum. (USSR) A method of testing the tensile strength of microsamples in a neutral gas or in vacuum is described. The samples can be heated up to 1600°C and the capacity of the diffusion pump is sufficient to maintain a vacuum of 10 -4 torr throughout the testing period. Iu E Andrianov et al, Plant Labor (3), 1965, 367, (in Russian).

58. Nucleonics 58:40 610. Hydrogen and helium bubble chambers. (Great Britain) The development of hydrogen, deuterium and helium bubble chambers is reviewed and the factors determining optimum size and magnetic field strength are discussed. The special demands for high vacuum and thermal insulation are stressed. Typical installations, including the Brookhaven 80 in. hydrogen chamber, are briefly described. D F Shaw, Cryogenics, 4 (4), Aug 1964, 193-203.

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