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New from Park Scientific Instruments
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Park S c i e n t i f i c I n s t r u m e n t s
Four new instruments for 'Ultrahigh-Resolution Scanning Probe Microscopy' have been announced from Park Scientific Instruments. Ambient Scanning Tunneling Microscope (STM) brings the atomicscale resolution of the STM to simple and convenient operation in air. Ambient Scanning Force Microscope (SFM) allows ultrahigh resolution microscopy of nonconducting surfaces. Combined ambient STM/SFM with shared microscope base brings the features of both techniques to one convenient instrument. Completely integrated uhv STM System expands our uhv STM product line from the uhv-compatible STM component to the complete system. These four new scanning probe microscopy instruments are evidence of the current trend in the field of ultrahigh resolution surface microscopy the extension of the technique to more kinds of information and applications by varying the phenomenon studied and the instrumental approach used.
Scanning force microscope and scanning tunneling microscope for operation in air. Park Scientific Instruments announces a revolution in nanometre-scale imaging of conductors, semiconductors and non-conductors in air: the Scanning Force Microscope, SFM-BD2, and Scanning Tunneling Microscope, STM-SAI. The unique technology underlying the design of these instruments provides greater resolution across a wider range of conditions than the best optical or electron microscopes. The SFM-BD2 achieves nanometre horizontal resolution while the STM-SA1 can resolve atoms. Both instruments attain sub-angstrom height resolution. And all of the images are obtained in air on an ordinary table top. Scanning force microscopy, alternatively called atomic force microscopy, produces topographic images of samples of any conductivity by monitoring the interatomic repulsion between the sample surface and the probe. Scanning tunneling microscopy produces topographic and spectroscopic images by monitoring the tunneling current between sample and probe. All of the images are truly threedimensional with quantitative height information that can be displayed several ways. Imaging with either the SFM-BD2 or STM-SA1 is virtually nondestructive since the sample is not bombarded with high-energy electrons. Because the SFM-BD2 does not involve a tunneling current, it can analyse even non-conducting materials without the need for metallic coating. Also, the SFM-BD2 can image samples in solution, a mode particularly useful for biological samples. The STM-
Image of a Si wafer showing a single defect with a height and diameter of about 500 ,4.
SA1 images metallic and semiconducting surfaces that are stable in air. No surface preparation. No pump-down. Operation of the SFM-BD2 and STM-SA1 is simple and flexible. The process of sample loading and imaging can be completed in only minutes. Image sizes of up to 5/~m x 5/zm can be obtained with the standard scanner, while different areas of the surface can be located by using a two-dimensional coarse translation stage, which has a range of 5 mm in each direction. The SFM-BD2 and STM-SA1 are the latest in Park Scientific Instruments' line of dependable and flexible scanning probe microscopes of the highest quality for research and industrial applications. Further information from: Dr Sung Park Park Scientific Instruments 476 Ellis Street Mountain View CA 94043 USA Tel 41 5 9652976 Fax 41 5 9652946
N e w rotary f e e d t h r o u g h from H u n t i n g t o n M e c h a n i c a l Laboratories A uniquely designed rotary-motion feedthrough that offers vacuum scientists many more options than traditional rotary devices is available now from Huntington Laboratories, Inc. A patented eccentric cam design activates the bellows-sealed rotary motion of the new feedthrough, which is called the VF-118. This enables the hollow shaft to extend from atmosphere straight through to vacuum. The rotatable, straight-through hollow shaft can then in effect be used as an additional coaxial port through which a variety of other functions can be introduced into the vacuum system. The VF-118 can easily be combined with other devices to perform a wide range of secondary functions along with its primary rotary function. Users can mount a second device onto the Vac-U-Flat mounting flange at the atmosphere end of the VF-118 to add, for example, another rotary motion at a different speed or in a different direction, a linear motion, an electrical or instrumentation feedthrough, a liquid or gas feedthrough, a fine beam feedthrough, a cold finger, or any other functional device that can be mounted on a 2.75-in. flange. Thus, users can introduce virtually anything into the vacuum that can be fed through a tube with an inner diameter of 0.245 in.
New rotary feedthrough from Huntington Mechanical Laboratories. 229
Park S c i e n t i f i c I n s t r u m e n t s
Four new instruments for 'Ultrahigh-Resolution Scanning Probe Microscopy' have been announced from Park Scientific Instruments. Ambient Scanning Tunneling Microscope (STM) brings the atomicscale resolution of the STM to simple and convenient operation in air. Ambient Scanning Force Microscope (SFM) allows ultrahigh resolution microscopy of nonconducting surfaces. Combined ambient STM/SFM with shared microscope base brings the features of both techniques to one convenient instrument. Completely integrated uhv STM System expands our uhv STM product line from the uhv-compatible STM component to the complete system. These four new scanning probe microscopy instruments are evidence of the current trend in the field of ultrahigh resolution surface microscopy the extension of the technique to more kinds of information and applications by varying the phenomenon studied and the instrumental approach used.
Scanning force microscope and scanning tunneling microscope for operation in air. Park Scientific Instruments announces a revolution in nanometre-scale imaging of conductors, semiconductors and non-conductors in air: the Scanning Force Microscope, SFM-BD2, and Scanning Tunneling Microscope, STM-SAI. The unique technology underlying the design of these instruments provides greater resolution across a wider range of conditions than the best optical or electron microscopes. The SFM-BD2 achieves nanometre horizontal resolution while the STM-SA1 can resolve atoms. Both instruments attain sub-angstrom height resolution. And all of the images are obtained in air on an ordinary table top. Scanning force microscopy, alternatively called atomic force microscopy, produces topographic images of samples of any conductivity by monitoring the interatomic repulsion between the sample surface and the probe. Scanning tunneling microscopy produces topographic and spectroscopic images by monitoring the tunneling current between sample and probe. All of the images are truly threedimensional with quantitative height information that can be displayed several ways. Imaging with either the SFM-BD2 or STM-SA1 is virtually nondestructive since the sample is not bombarded with high-energy electrons. Because the SFM-BD2 does not involve a tunneling current, it can analyse even non-conducting materials without the need for metallic coating. Also, the SFM-BD2 can image samples in solution, a mode particularly useful for biological samples. The STM-
Image of a Si wafer showing a single defect with a height and diameter of about 500 ,4.
SA1 images metallic and semiconducting surfaces that are stable in air. No surface preparation. No pump-down. Operation of the SFM-BD2 and STM-SA1 is simple and flexible. The process of sample loading and imaging can be completed in only minutes. Image sizes of up to 5/~m x 5/zm can be obtained with the standard scanner, while different areas of the surface can be located by using a two-dimensional coarse translation stage, which has a range of 5 mm in each direction. The SFM-BD2 and STM-SA1 are the latest in Park Scientific Instruments' line of dependable and flexible scanning probe microscopes of the highest quality for research and industrial applications. Further information from: Dr Sung Park Park Scientific Instruments 476 Ellis Street Mountain View CA 94043 USA Tel 41 5 9652976 Fax 41 5 9652946
N e w rotary f e e d t h r o u g h from H u n t i n g t o n M e c h a n i c a l Laboratories A uniquely designed rotary-motion feedthrough that offers vacuum scientists many more options than traditional rotary devices is available now from Huntington Laboratories, Inc. A patented eccentric cam design activates the bellows-sealed rotary motion of the new feedthrough, which is called the VF-118. This enables the hollow shaft to extend from atmosphere straight through to vacuum. The rotatable, straight-through hollow shaft can then in effect be used as an additional coaxial port through which a variety of other functions can be introduced into the vacuum system. The VF-118 can easily be combined with other devices to perform a wide range of secondary functions along with its primary rotary function. Users can mount a second device onto the Vac-U-Flat mounting flange at the atmosphere end of the VF-118 to add, for example, another rotary motion at a different speed or in a different direction, a linear motion, an electrical or instrumentation feedthrough, a liquid or gas feedthrough, a fine beam feedthrough, a cold finger, or any other functional device that can be mounted on a 2.75-in. flange. Thus, users can introduce virtually anything into the vacuum that can be fed through a tube with an inner diameter of 0.245 in.
New rotary feedthrough from Huntington Mechanical Laboratories. 229