- Email: [email protected]
Search-match software
TOOLS & TECHNIQUES UPDATE
Particle size analyzers Mastersizer 2000 and Spraytec are two particle characterization systems from Malvern Instruments. The Mastersizer 2000 is a particle size analyzer that includes an autosampler. This eliminates the need for manual sample preparation, a significant source of error in particle size analysis. An isokinetic sampling system ensures broad size distributions are correctly sampled without loss of either the fine or coarse fractions. Spraytec is a laser diffraction-based analyzer for the particle size characterization of sprays and aerosols. It offers real-time, highspeed measurement of high concentration liquid droplets.
Cameras for microscopy Syncroscopy is releasing a number of high performance cameras to provide quality images and high-speed refresh rates for microscopists. The available range of integrated camera systems includes the three-chip cameras SyncroCOOL 435 from Syncroscopy and the JVC KY-F75. The JVC KY-1030, Nikon DXM1200, and Sony DFW-X700 and SX900 models are single-chip cameras. For real-time images, the company recommends the high-speed refresh rates of the JVC KY-F75 and KY-1030 systems supported by FIREWIRE for the best performance. All the camera systems can be linked to Syncroscopy’s Auto Montage, Syncroscan, and AcQuis imaging packages. Contact: www.syncroscopy.com
Contact: www.malvern.co.uk
Particle standards Whitehouse Scientific is launching an extended range of size standards for calibrating particle size analysis instruments. The National Institute of Standards and Technology (NIST) traceable polydisperse glass microspheres are available in seven overlapping sizes covering the range 0.1-2000 µm. Each grade is produced as a single-shot vial to ensure the minimization of sampling errors during analysis. They are packaged in a variety of weights to suit different particle analysis methods, such as laser diffraction, sieving, and microscopy.
Modular Raman microscopy
Search-match software Crystallographica, the software unit of Oxford Cryosystems, has upgraded its software suite, Crystallographica Search Match (CSM). The program is intended for use with the International Center for Diffraction Data’s Powder Diffraction File, and is the basis for the algorithms behind the PANalytical search-match software, X’Pert HighScore. The package offers a powerful search algorithm for multiphase identification; a fast search using raw data, peak data, or a combination; fully integrated peak search and background subtraction tools; and powder pattern simulation.
A new range of Raman microscopes from Renishaw offer a modular system that can be configured to suit a user’s specific requirements. The inVia systems, from the entrylevel inVia to the fully automated inVia Reflex, offer flexibility, sensitivity, and simplicity of operation. With the advantages of nondestructive testing, spatial resolution of less than 1 µm, and little or no sample preparation, applications of the Raman microscopes include the analysis of polymer coatings, semiconductors, diamond films, composites, and ceramics. The sensitivity of the inVia instruments is achieved through the low signal detection with minimum noise of Renishaw’s RenCam CCD detector. The company’s WiRE™ 2.0 software is used to control microscope operation and data manipulation. It has a fully configurable interface and the data produced is compatible with standard software packages. It is possible to quickly change lasers, while providing full optical path optimization. The inVia Reflex microscope offers automated instrument configuration after switching excitation wavelengths, alignment optimization, and switching to confocal operation. The microscopes are compatible with the whole range of Renishaw’s spectrometers, microscopes, and sampling accessories.
Contact: www.crystallographica.com
Contact: www.renishaw.com
Contact: www.whitehousescientific.com
Variable pressure SEM LEO Electron Microscopy is extending its SUPRA range of high resolution, field emission scanning electron microscopes (FESEMs) to a new variable pressure version, the LEO SUPRA 60VP. The company expects the microscope will find applications in semiconductor and nanoscale technology, including imaging and examining semiconductor wafers up to 8” in diameter, coated glass lenses, ceramic parts, and hard coated tools. The addition of variable pressure capabilities to the LEO SUPRA 60 allows the imaging of nonconducting specimens without prior sample preparation. This means samples can be returned to a production process afterwards. The versatile microscope has a large cylindrical chamber, a refined six-axis motorized stage, and an 8” integrated airlock. In the low voltage range, 1.7 nm resolution is possible at 1 kV and 4.0 nm resolution at 0.1 kV. The high current mode adds further analytical capabilities when needed. Contact: www. leo-em.com
Metallurgical microscope The LX-31 from LECO Corporation is a new inverted metallurgical microscope. Its simple operation is intended for users of every level of expertise. The microscope uses brightfield observation and comes as standard with 5×, 10×, 20×, and 50× objectives on a fourposition revolving nosepiece. A 10× eyepiece offers clear observation images and a broad range of magnifications. Optional objective magnifications are also available. The light intensity adjustment dial, focusing knob, and stage handles have all been placed for comfort and efficiency. The coaxial coarse/fine focus handle allows adjustment without switching hands. Built with a solid-cast Al frame, the LX-31 has a standard trinocular video port, field and aperture diaphragms, and a coaxial mechanical stage with 4” × 2.5” stage travel. Contact: www.leco.com
April 2003
59
Particle size analyzers Mastersizer 2000 and Spraytec are two particle characterization systems from Malvern Instruments. The Mastersizer 2000 is a particle size analyzer that includes an autosampler. This eliminates the need for manual sample preparation, a significant source of error in particle size analysis. An isokinetic sampling system ensures broad size distributions are correctly sampled without loss of either the fine or coarse fractions. Spraytec is a laser diffraction-based analyzer for the particle size characterization of sprays and aerosols. It offers real-time, highspeed measurement of high concentration liquid droplets.
Cameras for microscopy Syncroscopy is releasing a number of high performance cameras to provide quality images and high-speed refresh rates for microscopists. The available range of integrated camera systems includes the three-chip cameras SyncroCOOL 435 from Syncroscopy and the JVC KY-F75. The JVC KY-1030, Nikon DXM1200, and Sony DFW-X700 and SX900 models are single-chip cameras. For real-time images, the company recommends the high-speed refresh rates of the JVC KY-F75 and KY-1030 systems supported by FIREWIRE for the best performance. All the camera systems can be linked to Syncroscopy’s Auto Montage, Syncroscan, and AcQuis imaging packages. Contact: www.syncroscopy.com
Contact: www.malvern.co.uk
Particle standards Whitehouse Scientific is launching an extended range of size standards for calibrating particle size analysis instruments. The National Institute of Standards and Technology (NIST) traceable polydisperse glass microspheres are available in seven overlapping sizes covering the range 0.1-2000 µm. Each grade is produced as a single-shot vial to ensure the minimization of sampling errors during analysis. They are packaged in a variety of weights to suit different particle analysis methods, such as laser diffraction, sieving, and microscopy.
Modular Raman microscopy
Search-match software Crystallographica, the software unit of Oxford Cryosystems, has upgraded its software suite, Crystallographica Search Match (CSM). The program is intended for use with the International Center for Diffraction Data’s Powder Diffraction File, and is the basis for the algorithms behind the PANalytical search-match software, X’Pert HighScore. The package offers a powerful search algorithm for multiphase identification; a fast search using raw data, peak data, or a combination; fully integrated peak search and background subtraction tools; and powder pattern simulation.
A new range of Raman microscopes from Renishaw offer a modular system that can be configured to suit a user’s specific requirements. The inVia systems, from the entrylevel inVia to the fully automated inVia Reflex, offer flexibility, sensitivity, and simplicity of operation. With the advantages of nondestructive testing, spatial resolution of less than 1 µm, and little or no sample preparation, applications of the Raman microscopes include the analysis of polymer coatings, semiconductors, diamond films, composites, and ceramics. The sensitivity of the inVia instruments is achieved through the low signal detection with minimum noise of Renishaw’s RenCam CCD detector. The company’s WiRE™ 2.0 software is used to control microscope operation and data manipulation. It has a fully configurable interface and the data produced is compatible with standard software packages. It is possible to quickly change lasers, while providing full optical path optimization. The inVia Reflex microscope offers automated instrument configuration after switching excitation wavelengths, alignment optimization, and switching to confocal operation. The microscopes are compatible with the whole range of Renishaw’s spectrometers, microscopes, and sampling accessories.
Contact: www.crystallographica.com
Contact: www.renishaw.com
Contact: www.whitehousescientific.com
Variable pressure SEM LEO Electron Microscopy is extending its SUPRA range of high resolution, field emission scanning electron microscopes (FESEMs) to a new variable pressure version, the LEO SUPRA 60VP. The company expects the microscope will find applications in semiconductor and nanoscale technology, including imaging and examining semiconductor wafers up to 8” in diameter, coated glass lenses, ceramic parts, and hard coated tools. The addition of variable pressure capabilities to the LEO SUPRA 60 allows the imaging of nonconducting specimens without prior sample preparation. This means samples can be returned to a production process afterwards. The versatile microscope has a large cylindrical chamber, a refined six-axis motorized stage, and an 8” integrated airlock. In the low voltage range, 1.7 nm resolution is possible at 1 kV and 4.0 nm resolution at 0.1 kV. The high current mode adds further analytical capabilities when needed. Contact: www. leo-em.com
Metallurgical microscope The LX-31 from LECO Corporation is a new inverted metallurgical microscope. Its simple operation is intended for users of every level of expertise. The microscope uses brightfield observation and comes as standard with 5×, 10×, 20×, and 50× objectives on a fourposition revolving nosepiece. A 10× eyepiece offers clear observation images and a broad range of magnifications. Optional objective magnifications are also available. The light intensity adjustment dial, focusing knob, and stage handles have all been placed for comfort and efficiency. The coaxial coarse/fine focus handle allows adjustment without switching hands. Built with a solid-cast Al frame, the LX-31 has a standard trinocular video port, field and aperture diaphragms, and a coaxial mechanical stage with 4” × 2.5” stage travel. Contact: www.leco.com
April 2003
59