Subject index to volume 4

Subject index to volume 4

SUBJECT I N D E X TO V O L U M E 4 Announcements~Reports~Book reviews/ Miscellaneous Abstracts, Dutch Society of Ffcctron Microscopy, Amsterdam 1978,...

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SUBJECT I N D E X TO V O L U M E 4

Announcements~Reports~Book reviews/ Miscellaneous Abstracts, Dutch Society of Ffcctron Microscopy, Amsterdam 1978, Ed. ItPoldritlgh Abstracts, 25th International Field l-nfission Syml)osium, Albuquerque 1978, Ed. Patlitz Abstracts, International Symposium on ln-Situ High Voltage Electron Microscopy, Halle 1979, Ed. Bethge Announcenlents of conling events

Announcement EMAG 79 Announcement SEM 1979 Announcement Workshop on Analytical Electron Microscopy (EMSA/MAS) Comment on editorial, Hawkes Report, Direct imaging of atoms in crystals and molecules, Beer and Ottensmeyer Report, The SCANDEM meetings - EM activities in Scandinavia, Johansen Report, Meeting of electron microscopy section of Swiss Society for Optics and Electron Microscopy, Gunther Selected responses to editorial, Hawkes. Lambert. Proll and Roy Analytical microscopy Effect of lens aberrations on lattice images of spinodally decomposed alloys, Spence, Cowley and Gronsky Electron-beam-induced damage of organic solids: implications for analytical electron microscopy, lsaacson Experimental determination of detection limits and calibration constants for energy-dispersive X-ray analysis using thin l'tim frozen hydrated specimens, Hutchinson and Borek Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope, Chapman, Waddell, Batson and Ferrier Radiation damage of purple membrane at low temperature, Hayward and Glaeser

Contamination Contamination as a psychological problem, Isaacson, KopJ; Ohtsuki and Utlaut Conventional electron microscopy Calculations of electron optical high resolution images, Hillebrand. Neumann attd Heydenreich Dark field and brightfield techniques for electron microscopic observation of atomic steps on MgO single crystal surfaces, Lchmpfuhl attd Uchida Electron diffraction studies of the pcptidoglycan bacterial cell wails, Formanek and Rauscher Improving a conventional transmission electron microscope for high resolution, Oikawa, Kimura. Hojou, Baba and Kana.va

4 (1979) 113

4 (1979) 361

4(1979) 4(1979) 4 (1979) 4(1979) 4(1979) 4 (1979) 4 (1979)

255 111 253 357 483 251 109

4(1979) 110 4 (1979) 249

Cross-sections Monte-Carlo calculations on electron multiple scattering in amorphot:s or polycrystalline targets, Soum, Arnal, Balladore, Jouffrey and Verdier Determination of partial and total scattering cross-sections for high energy electrons in the range 1.2-3 MeV, Marth~ez, Balladore and Trinquier K-shell ionization cross-sections for use in microanalysis, Egerton

4(1979) 481 4(1979) 105

4 (1979)107 4(1979) 355

Detectors - photographic and other An acquisition, storage, display and processing system for electron loss spectra, Egerton and Kenway

4 (1979) 429

4(1979) 193

Diffraction and optical diffraction Coherent interference in convergentbeam electron diffraction and shadow imaging, Cowley Detection of thin intergranular films by electron microscopy, Clarke Low-dose electron image reconstruction of negatively stained contractile sheath from bacillus subtillus (PBS-Z), Cremers, Fischer, Schilstra and Mellema A simple method of optical filtration, Gil~v

4(1979) 233

4 (1979) 283 4(1979) 201

488

4(1979)

97

4(1979) 305

4 (1979) 275

4 (1979) 337

4 (1979) 473

4 (1979) 451

4 (1979) 211 4 (1979) 169

4 (1979) 221

4 (1979) 435 4 (1979) 33

4 (1979) 395 4 (1979) 323

Subject index Electron energy loss spectrometry An acquisition, storage, display and processing system for electron energy loss spectra, Egerton and Ken way Experimental determination of detection limits and calibration constants for energy-dispersive X-ray analysis using thin film frozen hydrated specimens, Hutchinson and Borek K-shell ionization cross-sections for use in microanalysis, Egerton Uniqueness and the inversion problem of incoherent multiple scattering, Spence Image processing, 3D reconstruction Addendum to "Reconstruction of glutamine synthetase using computer averaging", bYank, Goldfarb, Eisenberg and Baker Digital image processing: the Semper system, Saxton, Pitt and Horner Low-dose electron image reconstruction of negatively stained contractile phage sheath from bacillus subtillus (PBS-Z), Cremers, Fischer, Schilstra and Mellema Reconstruction of a chromosome model from its projections, Bahr, Boccia, Engler, Robb, Jurkevich and Petty Reconstruction of a helical structure from projections applied to a phage tail, Cremers, Fischer and Mellema A simple method of optical filtration, Gilfiv Uniqueness and the inversion problem of incoherent multiple scattering, Spence Imaging Bright-field imaging of single heavy atoms in an electron microscope with superconducting lens system, Formanek and Knapek Coherent interference in convergent-beam electron diffraction and shadow imaging, Co wley Computer modeling of high resolution transmission electron microscope images of the (001) Au film surface, Krakow Computer simulation of image contrast of clustered atoms on amorphous support film lbr high resolution electron microscopy, Oikawa, Ho/ou and Kanaya Darkfield and brightfield technqiues for electron microscopic observation of atomic steps on MgO single crystal surfaces, Lehmpfuhl and Uchida Detection of thin intergranular films by electron microscopy, Clarke

4(1979) 221

4(1979) 233 4 (1979) 169 4 (1979)

9

(1979) 247 3(1979) 343

4 (1979) 395

4(1979)

45

4 (1979) 91 4 (1979) 323 4(1979)

9

4 (1979) 77

4 (1979) 435

4(1979)

55

4 (1979) 181

4(1979) 275 4 (1979) 33

Low-dose electron image reconstruction of negatively stained contractile phage sheath from bacillus subtillus (PBS-Z), Cremers, Fischer, Schilstra and Mellema Phase and amplitude contrast in electron microscopy of stained biological objects, Cowley attd Bridges Possibilities of heavy atom discrimination using single-sideband techniques, Downing Signal-to-noise enhancement by superposition of brightfield images obtained under different illumination tilts, Kunath Structure imaging of incommensurate tunnel structures of the compounds A I -pCr2Se4-p (A = Ba, Eu) using thin sections prepared by microtomy, Van Dyck, Van Landto,t, Jellinek and A melinckx Instrumentation An acquisition, storage, display and processing system for electron energy loss spectra, Egerton and Kenway Improving a conventional transmission electron microscope for high resolution, Oikawa, Kimura, Ho]ou, Baba and Kanaya

489

4 (1979)395

4(1979)'419

4 (1979)

13

4 (1979)

3

4(1979) 467

4(1979) 221

4(1979) 473

Methods and techniques Butvar B-98 as a thin support fihn, Handley and Olsen 4 (1979) 479 Calculation of electron optical high resolution images, Hillebrand, Neumann and Heydenreich 4(1979) 305 Detection of thin intergranul'.,r fihns by electron microscopy, Clarke 4 (1979) 33 Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope, Chapman, Waddell, Batson and Ferrier 4(1979) 283 Low-noise boron supports for high resolution electron microscopy, Dorignac, Maclachlan attd Jouffrey 4(1979) 85 Phase and amplitude contrast in electron microscopy of stained biological objects, Co wley and Bridges 4 (1979) 419 Possibilities of heavy atom discrimination using single-sideband techniques, Downing 4 (1979) 13 A practical procedure for alignment of a high resolution electron microscope, Zemlin 4 (1979) 241 Preparation of hydroplfilie, single crystalline specimen supports of graphite oxide, Formanek 4 (1979) 227 Reconstruction of a chromosome model from its projections, Bahr, Boccia, Engler, Robb, Jurkevich and Petty 4 (1979) 45

Sub/ect hldex

490

Reconstruction of a helical structure from projections applied to a phage tail, O'emers, Fischer and Mellema 4 (1979) 91 Signal-to-noise enhancement by superposition of bright field images obtained under different illumination tilts, Kunath 4 (1979) 3 New developments Bright-field imaging of single heavy atoms in an electron microscope with superconducting lens system, Formanek and Knapek Low-noise boron supports for high resolution electron microscopy, Dorignae, Maclachlan and Jouffrey Photoelectron emission microscopy of biological tissue: the influence of glutaraldchyde and heavy metals or biligrafin on the emission image of chicken liver in methacrylate, Grund, Eichberg and Engel A practical procedure lbr alignment of a high resolution electron microscope, Zemlin Signal-to-noise enhancement by superposition of bright-field images obtained under different illumination tilts, Kunath Particle optics - experiments The effect of lens aberrations on lattice images of spinodally decomposed alloys, Spence, Cowley and Gronsky Particle optics - theory Computer simulation of image contrast of clustered atoms on amorphous support film for high resolution electron microscopy, Oikawa, Ho/ou and Kanaya Radiation damage Contamination as a psychological problem, Isaacson, Kopf, OhtsuM and Utlaut Electron-beam-induced damage of organic solids: implications for analytical electron microscopy, Isaacson

4 (1979) 77

4 (1979) 85

4 (1979) 293

4 (1979) 241

4 (1979)

3

4 (1979) 429

4 (1979) 181

4 (1979) 97

4(1979) 193

Elemental loss during electron beam irradiation, Delgado and Hutchh~son Low-dose electron image reconstruction of negatively stained contractile ph,-ige sheath from bacillus subtillus (PBS-Z), Cremers, Fischer, Schilstra and Mellema Radiation damage of purple membrane at low temperature, Hayward and Glaeser Scanning electron microscopy High resolution SEM of bacterial virus T7, Panessa- Warren and Broers Scanning electron microscope and optical microscope studies of the topography of some etched steel structures, Osterhmd and Vingsbo Scanning transmission electron microscopy Adjustment of a STEM instrument by use of shadow images, Cowley Atomic imaging using the dark-field annular detector in tile STEM, Isaacson, Kopf, Ohtsuki and Utlaut Electron diffraction studies of the peptidoglycan bacterial cell walls, Formanek and Rauscher Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope, Chapman, Waddell, Batson and Ferrier

4 (1979) 163

4(1979) 395 4 (1979) 201

4(1979) 317

4(1979) 155

4(1979) 413

4 (1979) 101

4 (1979) 337

4(1979) 283

Specimen preparation Butvar B-98 as a thin support film, Handley and Olsen Low-noise boron supports for high resolution electron microscopy, Dorigizac, Maclachlan and Jouffrey Preparation of hydrophilic, single crystalline specimen supports of graphite oxide, Formanek

4 (1979) 227

Spectrometers - auxiliary apparatus An acquisition, storage, display and processing system for electron energy loss spectra, Egerton and Kenway

4 (1979) 221

4 (1979) 479

4 (1979) 85