Subject index to volume 5

SUBJECT INDEX TO VOLUME 5

Announcements/Reports/Book Reviews/Miscellaneous Abstracts, Dutch Society of Electron Mi5 (1980) croscopy, Utrecht, 1979, Ed. Leene Abstracts, 26th International Field Emission Symposium, Berlin (West), 1979. Ed. Block 5 (1980) Abstracts, 12th Congress of Italian Society of Electron Microscopy, Ancona, 1979, 5 (1980) Eds. Jezequel and ValdrO Announcement on affiliation with EMSA, Silcox 5 (1980) Announcements of coming events 5 (1980) 5 (1980) 5(1980) 5(1980) Survey of high voltage electron microscope operations, Parsons and Ratkowski 5 (1980) Units and conventions in electron microscopy, for use in Ultramicroscopy, Han,kes 5 (1980) Analytical microscopy Background determination in X-ray microanalysis of biological thin sections, Roo. mansand Kuypers Effect of stray magnetic field on image resolution in transmission electron microscopy, Downing and Chiu Electron energy loss spectroscopy: detectable limits for elemental analysis, Joy and Maher Quantitative microanalysis by electron energy loss spectroscopy: two corrections, Stephens QUEST: quantitation using an elemental standardless technique, Bank, Forst and Lam Conventional electroil microscopy Comparison of conventional and scanning transmission electron microscopes, particularly of atom images under dark field," Tanakal Uyeda, Todokoro and Komada Dark field microscopy of the 30S subunit of the E. colt ribosome, Korn Digital reconstruction of bright field phase contrast images from high resolution electron micrographs, Kirkland, Siegel, Uyeda and Fu/iyoshi HREM imaging of atomic structure in highly strained inorganic glass, Schmidt, Hopfe and Scholz

Survey of high voltage electron microscope operations, Parsons and Ratkowski

5 (1980) 209

Cross-sections Diffraction scattering cross-section in high voltage electron microscopy, Bhattacharya and Das Gupta

5 (1980)

87

229

Detectors - photographic and other Imaging unstained proteoglycan aggregates by soft X-ray contact microscopy, Panessa, Warren, Hoffman and Feder Thermo-electric cooling device for low-lightlevel vidicon camera systems, Patterson

363

2 85 227 361 525

Diffraction and optical diffraction Contrast transfer of crystal images in TEM, Ishizuka Diffraction scattering cross-section in high voltage electron microscopy, Bhattaehao,a and Das Gupta Fresnel diffraction in a coherent convergent electron beana, Cowley and Disko Measurement of the phase contrast transfer function and the cross-correlation peak using Young interference fringes, Zemlin and Schiske Rapid method for determining phases in electron diffraction patterns using computer simulation, Nakahara Techniques for convergent-beam electron diffraction, Dowell, Goodman, Johnson and Williams Zone-axis patterns formed by a new doublerocking technique, Eades

209 67

5 (1980) 81

5 (1980) 351 5 (1980) 333

5 (1980) 343 5 (1980) 153

5 (1980) 479

Electron energy loss spectrometry Chemical measurements of radiation damage in organic samples at and below room temperature, Egerton Does removal of hydrogen change the electron energy-loss spectra of DNA bases? Schnabl Electron energy loss spectroscopy: detectable limits for elemental analysis, Joy and Maher Quantitative microanalysis by electron loss spectroscopy: two corrections, Stephens

5 (1980) 223

Image processing, 3D reconstruction Computer modeling study of high resolution

5 (1980)

35

5 (1980) 513

529

75

5 (1980) 267 5 (1980) 215

5 (1980) 55

5 (1980)

75

5 (1980) 469

5 (1980) 139

5 (1980) 275

5 (1980)

9

5 (1980)

71

5 (1980) 521 5 (1980) 147

5 (1980) 333 5 (1980) 343

530 inicroscope images of an~orpbous-tocrystallinc transition boundaries, Krakow Digital reconstruction of bright field phase contrast images from high resolt, tion electron micrographs, Kh'kland, Siegel, Uyeda and FujO,oshi Spatial filtering of electron micrographs of negatively stained a-amylasc crystals, Shelle),, Hillman and McPherson

Subject hldex

5 (1980) 175

5 (1980) 479

5 (1980) 281

Imaging

Effect of stray magnetic field on image resolution in transmission electron microscopy, Downing and Chiu Contrast transfer of crystal images in TEM, Ishizuka Electron optical method for the measure-. ment of the superconducting penetration depth, ValdrE Fresnel diffraction in a coherent convergent electron beam, Cowley and Disko hnaging in scanning microscope, Crewe A "mLxed" type electron interferometer, Mateucci and Pozzi

5 (1980) 351 5 (1980) 55

5 (1980)

19

5 (1980) 469 5 (1980) 131 5 (1980) 219

I nstrum en tation

Abstracts of papers presented at the Annual Conference of the Dutch Society of Electron Microscopy, Utrecht, November 1979, Ed. Leene Abstracts of papers presented at the 26th International Field Emission Symposium, Berlin (West), September, 1979, Ed. Block Correction of the second-order aberrations of uniform field magnetic sectors, Shuman Evaluation of the properties of uniform field magnetic sector spectrometers, Darlington High resolution cold stage for the JEOL 100B and 100C electron microscopes, Hayward and Glaeser Improving the lifetime of electron microscope pointed filaments, Hoelke and Parsons

A "mixed" type electron interferometer, Matteucci and Pozzi Performance of a field emission gun scanning electron microscope column, Venables and Janssen Pre-spectrometer optics in a CTEM/STEM, Johnson Thermo-electric cooling device for lowqightlevel vidicon camera systems, Patterson Methods and techniques Abstracts of papers presented at the Annual Conference of the Dutch Society of Elec-

5 (1980) 87

5 (1980) 229 5 (1980) 45 5 (1980) 429

5 (1980)

3

tron Microscopy, Utrecht, November, 1979, Ed. Leene 5 (1980) Abstracts of papers presented at the 26th International Ficld Emission Symposiunl, Berlin (West), September, 1979, Ed. Block 5 (1980) An electron optical method for the measuremcnt of the superconducting penetration depth, Valdra 5 (1980) High resolution cold stagc for thc JEOL 100B and 100C electron microscopes, ltayward and Glaeser 5 (1980) Improving the lifetime of electron microscope pointed filaments, Hoelke and Parsons 5 (1980) Techniques for convergent-beam electron diffraction. Dowell, Goodman, Johnson and Williams 5 (1980) A rapid method for determining phases in electron diffraction patterns using computer simulation, Nakahara 5 (1980) Measurement of the phase contrast transfer function and the cross-correlation peak using Young interference fringes, Zemlin and Schiske 5 (1980) Imaging unstained proteoglycan aggregates by soft X-ray contact microscopy, Panessa, Warren, Hoffman and Feder 5(1980) QUEST: quantitation using an elemental standardlcss technique, Bank, Forst and Lain 5 (1980) Background determination in X-ray microanalysis of biological thin specimens, Roomans and Kuypers 5 (1980) A new method for optimal resolution electron microscopy of radiation-sensitive specimens, Fufiyoshi, Kobayashi, Ishizuka, Uyeda, Ishida and Harada 5 (1980) Test specimens for a dark field STEM imaging: measuring lattice spacing and electron probe size of a STEM and testing visibility of atoms of various atomic numbers, Ohtsuki 5 (1980)

87

229

19

3 357

9

275

139

267

153

81

459

325

New developments

5 (1980) 357

Zone-axis patterns formed by a new doublerocking technique, Eades

5 (1980)

71

5 (1980) 219 Particle optics - experiments

5 (1980) 297 5 (1980) 163 5 (1980) 215

Depth of field in emission microscopy, Rempfer, Nadakavukaren and Griffith 5 (1980) 449 Evaluation of the properties of uniform field magnetic sector spectrometers, Darlh~gton 5 (1980) 429 Measurement of the phase contrast transfer function and the cross-correlation peak using Young interference fringes, Zemlhl and Schiske 5 (1980) 139 Topographical effects in emission microscopy, Rempfer, Nadakavukaren and Griffith 5 (1980) 437

Subject index Particle optics - theory A computer modeling study of high resolution electron microscope images of amorphousto-crystalline transition boundaries, Krakow 5 (1980) 175 Contrast transfer of crystal images in TEM, lshizuka 5 (1980) 55 Performance of a field emission gun scanning electron microscope column, Venahles and Janssen 5 (1980) 297 Radiation damage Chemical measurements of radiation damage in organic samples at and below room temperature, Egerton Does removal of hydrogen change the electron energy-loss spectra of DNA bases? Sehabl A new method for 9pth~aal resolution electron microscopy of radiation-sensitive specimens, Fuf(voshi, Kobayashi, lshizuka, Ishida and Harada Radiation damage mechanisms in copper phthalocyanine and its chlorinated derivatives, Clark, Chapman, MacLeod and Felv'ier Radition damage of phosphatidylcholine bilayers: Effects of temperature and hydration, Hid Scanning transmission electron microscopy Comparison of conventional and scanning transmission electron microscopes, parti-

5 (1980) 521

5 (1980) 147

5 1980) 459

5 (1980) 195

5 (1980) 505

531

cularly of atOll1 images under dark field, Tanaka, Uyeda, Todokoro and Komoda 5 (1980) 35 hnaging in scanning microscopes, Crewe 5 (1980) 131 Observation of unstained biological macroinolcculcs with the STEM, Ohtsuki 5 (1980) 317 STEM of biological macromoleculcs, Tichelaar, Oostergetel, Haker, Van Heel and Van Bruggen 5 (1980) 27 Test specimens for a dark field STEM imaging: measuring lattice spacing and electron probe size of a STEM and testing visibility of atoms of various atomic numbers, Ohtsuki 5 (1980) 325 Specimen preparation Test specimens for a dark field STEM imaging: measuring lattice spacing and electron probe size of a STEM and testing visibility of atoms of various atomic numbers, Ohtsuki 5 (1980) 325 Spectrometers - auxiliary apparatus Correction of the second-order aberrations of uniform field magnetic sectors, Shaman Evaluation of the properties of uniform field magnetic sector spectrometers, Darlington A "mixed" type electron interferometer,

Matteucci and Pozzi Pre-spectrometer optics in a CTEM/STEM, Johnson Thermo-electric cooling device for low-lightlevel vidicon camera systems, Patterson

5 (1980)

45

5 (1980) 429 5 (1980) 219 5 (1980) 163 5 (1980) 215