Theoretical interpretation of the optical constants of thin metallic layers

Classified Abstracts 1121--1122 19:30 1121. The preparation and study of the optical absorption edge o f thin films of gallium arsenide. (France) Films of gallium arsenide were prepared by evaporation on amorphous substrates. The two element sources and the substrates had their temperatures controlled: The optical absorption edge of the films was found to be considerably less steep than that expected from single crystal data. The extension of absorption into the infrared depended on substrate temperature and crystal size. Substrate temperature up to 700°C were investigated but above 550°C the film surface became cloudy before sufficient thickness was reached. (Great Britain) (Author, modified) R. P. Howson, Colloque sur l'optique des couches minces solides, Marseille, 8-15 Sept. 1963, J. Physique (in press). 19 : 30 : 41 1122. Optical Faraday effect in ferrite films. (France) The authors studied the rotation of the plane of polarization of linear polarized light by ferromagnetic and ferrimagnetic films. In addition to nickel, iron, cobalt and their alloys, the materials studied included ferrites of nickel, magnesium, manganese, cobalt, iron and mixed ferrites. The metal films were prepared by cathodic sputtering and most of the ferrite films were produced by oxidation of the sputtered films at elevated temperatures. Use was made of the Faraday effect to study thin film domain structure and magnetic behaviour. While metallic films exhibited the usual positive (right handed) Faraday rotation, all the ferrites showed a negative rotation. This is due to the unique sublattice structure of ferrites and the effect of crystal field splitting on the energy levels. The change from positive to negative rotation is observed as a film of NiFe2 is oxidised to NiFe~O4. (U.S.A.) (Authors, modified) R. L. Coren and M. H. Francombe, Colloque sur l'optique des couches minces solides, Marseille, 8-15 Sept. 1963, J. Physique (in press). 19 : 30 Structure and optical properties of thin solid layers. See Abstr. No. 1147. 19 : 13 Vacuum system for automatic contact microradiography with ultra-soft X-rays. See Abstr. No. 1104. 19 : 30 Multi-dielectric reflecting layers for the ultraviolet interference measurements. See Abstr. No. 1142. 19 : 49 : 30 Ellipsometric investigation of thin SiO2 films obtained by various methods of preparation. See Abstr. No. 1199. 19:30 Influence of surface irregularities on the optical properties of thin layers. See Abstr. No. 1143. 19 : 30 Optical properties and structure of thin layer of magnesium fluoride. See Abstr. No. 1144. 19:30 Measurement of the optical constants of thin layers oflluorides in the extreme ultraviolet. See Abstr. No. 1145. Thin reflection-free inhomogeneons layers.

19:30 See Abstr. No. 1148.

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19 : 30 On the critical constants of metals at wavelengths shorter than their critical wavelength. See Abstr. No. 1149. 19 : 30 Experimental study of an abnormal optical resonance phenomenon in certain metals when in the form of thin layers. See Abstr. No. 1150. 19:30 Measurement of the phase change produced by thin unsupported gold strips. See Abstr. No. 1151. 19:30 Utilization of superposition fringes for the measurement of phase change on reflection of thin films. See Abstr. No. 1152. 19:30 Simultaneous determination of the refraction infleces and thickness of thin solid absorbing layers. See Abstr. No. 1153. 19 : 30 A method for synthesis of design of multilayer structure with prescribed frequency-dependent properties. See Abstr. No. 1154. 19 : 30 Optical properties of evaporated gold in the vacuum ultraviolet from A = 300-2000A. See Abstr. No. 1158. 19 : 41 : 30 Diffnsion of light by thin layers of granulated silver. See Abstr. No. 1160. 19 : 30 On a new interpretation of the optical properties of metals in the form of thin layers. See Abstr. No. 1166. 19 : 30 Theoretical interpretation of the optical constants of thin metallic layers. See Abstr. No. 1167. 19:30 Study of the optical properties of certain metals in the form of thid layers in connexion with their electronic structure. See Abstr. No. 1169. 19 : 30 The angular and spectral distribution of transition radiation from thin silver foils. See Abstr. No. 1170. 19 : 30 : 41 Some observations on the evaporating properties of two component alloys. See Abstr. No. 1171. 19 : 30 Transmittance of thin films in the extreme ultraviolet. See Abstr. No. 1173. 19 : 41 : 30 Improved dielectric films for multilayer coatings and mirror protection. See Abstr. No. 1174. 19 : 30 Apparatus for the controlled deposition of multilayer films. See Abstr. No. 1175. 19 : 30 : 41 Preparation and optical properties of thin layers of gallium arsenide and cadmium telluride. See Abstr. No. 1176.