- Email: [email protected]
3rd Interdisciplinary surface science conference
Vacuum News rapid during the next 5 years. SaJes of LEDs, gas discharge displays, liquid crystals, plasma panels and cathode ray tubes in particutar will expand rapidly up to 1980. New display technologies such as dc electroluminescence and electrochromic are also likely to be introduced into commercial applications during the coming years. Vending equipment and consumer electronics will make major contributions towards the growth in display markets. Display devices are crucial to many future electronics applications. The 200 page report provides a valuable background to these developments. It has been produced on a multi-client basis which ensures an unbiased appraisal at a fraction of the cost of an in-house produced report. Circle number 67 on Reader Enquiry Service card
Edwards catalogue A new catalogue of Edwards products is now available. It includes all the new items which have been added to our range of high vacuum equipment and contains particulars of high vacuum pumps, instruments and accessories, together with details of plant for vacuum coating and freeze-drying. We have also included our range of cryogenic containers and accessories. Edwards High Vacuum Circle number 68 on Reader Enquiry Service card
Vacuum technology terms Publication of BS 2951 Glossary of terms for vacuum technology Part 2 Terms of specific application now completes the revision of BS 2951 1958. Sections 1-5 of the 1958 standard were superseded when Part 1 1969 was published and the remaining Section 6 of the 1958 edition has now been replaced by the publication of Part 2 1975. The new standard has provided a much wider
Conferences
and
group
The application of vacuum to industrial processes covers an extremely wide field and the terms included relate to such processes linked with electronic, chemical, food, clothing, jewellery, photographic, nuclear, metallurgical, welding and p~ckaging disciplines to name but a few. BS 2951 recognizes that many disciplines make use of vacuum technology and where such disciplines have their own glossary of terms, care has been taken not to duplicate such terms unless they are considered to be entirely dependent on a vacuum technique. In the same way that Part 1 has been used as a basis for the preparation of several parts of a draft International Standard DIS 3529, it is hoped that Part 2 will also be a strong influence in the preparation of an equivalent ISO standard in the future. Copies of BS 2951 Part 2 are available from BSI Sales Department, 101 Pentonville Road, London N1 9ND.
Other recent British Standards Institution publications are:
International Computer Language--8S 3527. World Electricity Supplies--a booklet which has an introduction and notes in French and German as well as English and gives details of the supply sources, household, commercial and industrial voltages, voltage tolerances and frequencies of 148 countries throughout the world. Environmental Testing of Optical Devices--BS 5275. Sl units and recommendations for the use of their multiples and of certain other un/ts--BS 5555.
activities
The Sixth Czechoslovak conference on Electronics
and Vacuum Physics To be held in Bratislava from 23 to 26 August 1976. Information from Marian Vesel~, Dept of Microelectronics, Slovak Technical University, Vazavova 5, 88019 Bratislava, Czechoslovakia.
Varian a n n o u n c e s second annual leak d e t e c t i o n
seminar workshop Varian Lexington Vacuum Division is sponsoring their Second Annual Leak Detection Seminar/Workshop at the Marriott Hotel in Newton, Ma, 2, 3, 4 June 1976 The programme is addressed to engineers and technicians concerned with leak checking functions in industrial plants and in laboratories. It will cover the theory and practice of several methods of leak detection, with emphasis on the use of manual and automated helium mass spectrometer leak detectors. There will be hands-on workshops and demonstration sessions. Among the topics to be covered are the latest methods of leak detection, approaches to leak testing large systems, leak detection of sealed parts, and techniques used in industrial leak detection. Approaches to automation will be evaluated. Workshops and demonstrations will treat testing techniques, preventive maintenance, tuning and calibration, and solutions to problems encountered in specific applications.
coverage of terms and definitions for specific vacuum applications and these are grouped into vacuum coating and allied techniques, vacuum processing and fabrication of materials and vacuum instrumentation for surface studies.
Invited guest lecturers from industry will join the Varian staff as the seminar faculty. Time for personal conferences with these leak detection experts and a tour of the Varian plant in nearby Lexington are also included in the programme. The seminar fee of S295 covers the three days of seminar proceedings, printed notes and lunches. Reservations and inquiries should be addressed to Varian Leak Detection Seminar Registrar, 611 Hansen Way, Palo Alto, Ca, 94303, (415) 493-4000, Ext 3043.
3rd Interdisciplinary surface science c o n f e r e n c e A Third Interdisciplinary Surface Conference is to be held at the University of York from 27-30 March 1977. Previous conferences in this series were held at York in 1972 and Warwick in 1975 (the latter is published in Vol 53 of Surface Science 1975). The main subject matter of the conference will be studies of well characterized clean surfaces and adsorption on such surfaces and both invited and contributed papers will be included under this general topic. In addition a small number of invited papers on broader aspects of surface science wirl be included. The conference is organised by the Thin Films and Surfaces Group of The Institute of Physics with the co-sponsorship of the Vacuum Group of The Institute of Physics and the Surface Reactivity and Catalysis Group of the Faraday Division of the Chemical Society. 117
Vacuum News A second notice and call for papers will be issued in May 1976. Enquiries about the conference should be sent to the Conference Organiser, Dr D P Woodruff, Department of Physics, University of Warwick, Coventry, Warwickshire CV4 7AL.
European Physical Society--Condensed Matter Divisional Conference The Solid State Physics Sub-Committee of The Institute of Physics is arranging a European Physical Society--Condensed Matter Divisional Conference at the University of Leeds from 26-29 July 1977. The conference will have a dual theme--Molecular Solids/Electron Transport. This notice is made to ensure inclusion in diaries and calendars of meetings. A further notice and call for papers will be issued in July 1976.
T h e O p e r a t i o n o f I n s t r u m e n t s in A d v e r s e Environments A two day non-residential conference on 'The Operation of Instruments in Adverse Environments' is to be held in London on the 4-5 October 1976. The conference is being sponsored jointly by the Materials end Testing Group of The Institute of Physics and The Institute of Measurement and Control. Instrumentation performs the vital information gathering role in many key areas from process control in industry to fundamental scientific research and as the general level of technology rises and new environments are explored and exploited the instrumentation specialist is continually required to make measurements in increasingly hostile operating conditions. The conference will look at the problems currently posed for both the designers and the users of instrumentation by a wide range of these adverse environments, and preference will be given in the proceedings to those papers thought to make a significant practical contribution to the making of measurements in such conditions.
The purpose of the meeting is to inform participants of the present state of scanning electron transmission microscopy, either as attachments to conventional TEM's or SEM's or as purpose-built instruments. The majority of the meeting will be taken up by invited speakers, but there will be a small amount of time for contributions. Invited speakers will include : Professor Burge (Queen Elizabeth College, London) ; Dr Ray (AEI, Scientific Apparatus Division) ; Dr Langmore (MRC, Cambridge) ; Dr Willasch (Siemens AG) ; Dr Swift (Unilever). Conference Secretary: K Anderson, AEI, Scientific Apparatus Division, Barton Dock Road, Urmston, Manchester. Microanalytical Techniques The Electron Microscopy and Analysis Group of The Institute of Physics is arranging a conference on Microanalytical techniques to be held at the University of Liverpool on 22-24 September 1976. There are now a considerable number of physical techniques capable of providing analysis from small areas of a specimen (less than 20/~m in diameter and the object of this meeting is to bring together workers using these different techniques. The emphasis of the meeting will be on recent developments and on quantitative analysis. Techniques to be covered will include X-ray microanalysis in both the SEM and the TEM, auger emission spectroscopy, transmission energy loss analysis, imaging secondary ion mass spectroscopy, proton and other nuclear micro-beam techniques. It is planned to have a number of invited papers reviewing the current state of the various techniques in addition to contributed papers. Enquiries about contributions should be addressed to the Conference Secretary, Dr H E Bishop, Materials Development Division, Building 338.4, AERE Harwell, Didcot, Oxon OX11 0RA. Further details will be available in the spring of 1976 from the Meetings Officer ,The Institute of Physics, 47 Belgrave Square, London SW1X 8QX.
The four major sessions of the conference will be introduced by papers from invited speakers and it is hoped that these and the contributed papers will stimulate discussion and the exchange of views and ideas between the designers, users and manufacturers of instrumentation attending.
The Fourth Symposium
One major session will deal with the offshore and marine environments which are currently of such great interest, while other sessions will include papers on humid and corrosive environments, space, extremes of temperature, high radiation fluxes (nuclear and e-m), dusty and flammable conditions, shock and vibration.
Scope:
Offers of contributions should be sent to the Conference Secretary: J Knight, Royal Aircraft Establishment, Bramshot Golf House, Fleet, Aldershot, Hants, UK, not later than 1 July 1976 and should include an outline of 300-500 words which will be reproduced in the Conference Handbook. The full proceedings of the conference will be published and issued to all those attending at a later date.
In vited speakem:
Further details of the conference programme and registration forms will be available in due course from : The Meetings Officer, The Institute of Physics, 47 Belgrave Square, London SW1X 8QX.
Advisory board:
E l e c t r o n M i c r o s c o p y and A n a l y s i s G r o u p o f t h e I n s t i t u t e o f Physics One day meeting on Scanning Transmission Electron Microscopy, 5 May 1976, Imperial College, London. 118
on Physics and Chemistry of Surfaces. Organized by the Netherlands Vacuum Society, NEVAC. To be held at the University of Technology, Eindhoven, The Netherlands on 23-25 June 1976. The relationships between the geometrical structure, the electronic properties and the chemical composition of surfaces. Interaction of neutral and charged particles with well-defined surfaces, the emphasis being on phenomena rather than on experimental methods. A Blandin, University of Paris-Sud, Orsay ; A L Boers, University of Groningen, Groningen; G Ehrlich, University of Illinois, Urbana-Champaign ; R W Joyner, University of Bradford, Bradford; T E Madey, National Bureau of Standards, Washington DC; W M~nch, University of Duisburg, Duisburg; J C Phillips, Bell Laboratories, Murray Hill. R Castaing, University of Paris-Sud, Orsay; H D Hagstrum, Bell Laboratories, Murray Hill; R Haul, University of Technology, Hannover; J W Linnett, University of Cambridge, Cambridge; A Venema, Phillips Research Laboratories, Eindhoven.
Paper selection committee: M J Sparnaay, Chairman, Philips Research Laboratories, Eindhoven ; A Benninghoven, University of Munster, Munster;
Edwards catalogue A new catalogue of Edwards products is now available. It includes all the new items which have been added to our range of high vacuum equipment and contains particulars of high vacuum pumps, instruments and accessories, together with details of plant for vacuum coating and freeze-drying. We have also included our range of cryogenic containers and accessories. Edwards High Vacuum Circle number 68 on Reader Enquiry Service card
Vacuum technology terms Publication of BS 2951 Glossary of terms for vacuum technology Part 2 Terms of specific application now completes the revision of BS 2951 1958. Sections 1-5 of the 1958 standard were superseded when Part 1 1969 was published and the remaining Section 6 of the 1958 edition has now been replaced by the publication of Part 2 1975. The new standard has provided a much wider
Conferences
and
group
The application of vacuum to industrial processes covers an extremely wide field and the terms included relate to such processes linked with electronic, chemical, food, clothing, jewellery, photographic, nuclear, metallurgical, welding and p~ckaging disciplines to name but a few. BS 2951 recognizes that many disciplines make use of vacuum technology and where such disciplines have their own glossary of terms, care has been taken not to duplicate such terms unless they are considered to be entirely dependent on a vacuum technique. In the same way that Part 1 has been used as a basis for the preparation of several parts of a draft International Standard DIS 3529, it is hoped that Part 2 will also be a strong influence in the preparation of an equivalent ISO standard in the future. Copies of BS 2951 Part 2 are available from BSI Sales Department, 101 Pentonville Road, London N1 9ND.
Other recent British Standards Institution publications are:
International Computer Language--8S 3527. World Electricity Supplies--a booklet which has an introduction and notes in French and German as well as English and gives details of the supply sources, household, commercial and industrial voltages, voltage tolerances and frequencies of 148 countries throughout the world. Environmental Testing of Optical Devices--BS 5275. Sl units and recommendations for the use of their multiples and of certain other un/ts--BS 5555.
activities
The Sixth Czechoslovak conference on Electronics
and Vacuum Physics To be held in Bratislava from 23 to 26 August 1976. Information from Marian Vesel~, Dept of Microelectronics, Slovak Technical University, Vazavova 5, 88019 Bratislava, Czechoslovakia.
Varian a n n o u n c e s second annual leak d e t e c t i o n
seminar workshop Varian Lexington Vacuum Division is sponsoring their Second Annual Leak Detection Seminar/Workshop at the Marriott Hotel in Newton, Ma, 2, 3, 4 June 1976 The programme is addressed to engineers and technicians concerned with leak checking functions in industrial plants and in laboratories. It will cover the theory and practice of several methods of leak detection, with emphasis on the use of manual and automated helium mass spectrometer leak detectors. There will be hands-on workshops and demonstration sessions. Among the topics to be covered are the latest methods of leak detection, approaches to leak testing large systems, leak detection of sealed parts, and techniques used in industrial leak detection. Approaches to automation will be evaluated. Workshops and demonstrations will treat testing techniques, preventive maintenance, tuning and calibration, and solutions to problems encountered in specific applications.
coverage of terms and definitions for specific vacuum applications and these are grouped into vacuum coating and allied techniques, vacuum processing and fabrication of materials and vacuum instrumentation for surface studies.
Invited guest lecturers from industry will join the Varian staff as the seminar faculty. Time for personal conferences with these leak detection experts and a tour of the Varian plant in nearby Lexington are also included in the programme. The seminar fee of S295 covers the three days of seminar proceedings, printed notes and lunches. Reservations and inquiries should be addressed to Varian Leak Detection Seminar Registrar, 611 Hansen Way, Palo Alto, Ca, 94303, (415) 493-4000, Ext 3043.
3rd Interdisciplinary surface science c o n f e r e n c e A Third Interdisciplinary Surface Conference is to be held at the University of York from 27-30 March 1977. Previous conferences in this series were held at York in 1972 and Warwick in 1975 (the latter is published in Vol 53 of Surface Science 1975). The main subject matter of the conference will be studies of well characterized clean surfaces and adsorption on such surfaces and both invited and contributed papers will be included under this general topic. In addition a small number of invited papers on broader aspects of surface science wirl be included. The conference is organised by the Thin Films and Surfaces Group of The Institute of Physics with the co-sponsorship of the Vacuum Group of The Institute of Physics and the Surface Reactivity and Catalysis Group of the Faraday Division of the Chemical Society. 117
Vacuum News A second notice and call for papers will be issued in May 1976. Enquiries about the conference should be sent to the Conference Organiser, Dr D P Woodruff, Department of Physics, University of Warwick, Coventry, Warwickshire CV4 7AL.
European Physical Society--Condensed Matter Divisional Conference The Solid State Physics Sub-Committee of The Institute of Physics is arranging a European Physical Society--Condensed Matter Divisional Conference at the University of Leeds from 26-29 July 1977. The conference will have a dual theme--Molecular Solids/Electron Transport. This notice is made to ensure inclusion in diaries and calendars of meetings. A further notice and call for papers will be issued in July 1976.
T h e O p e r a t i o n o f I n s t r u m e n t s in A d v e r s e Environments A two day non-residential conference on 'The Operation of Instruments in Adverse Environments' is to be held in London on the 4-5 October 1976. The conference is being sponsored jointly by the Materials end Testing Group of The Institute of Physics and The Institute of Measurement and Control. Instrumentation performs the vital information gathering role in many key areas from process control in industry to fundamental scientific research and as the general level of technology rises and new environments are explored and exploited the instrumentation specialist is continually required to make measurements in increasingly hostile operating conditions. The conference will look at the problems currently posed for both the designers and the users of instrumentation by a wide range of these adverse environments, and preference will be given in the proceedings to those papers thought to make a significant practical contribution to the making of measurements in such conditions.
The purpose of the meeting is to inform participants of the present state of scanning electron transmission microscopy, either as attachments to conventional TEM's or SEM's or as purpose-built instruments. The majority of the meeting will be taken up by invited speakers, but there will be a small amount of time for contributions. Invited speakers will include : Professor Burge (Queen Elizabeth College, London) ; Dr Ray (AEI, Scientific Apparatus Division) ; Dr Langmore (MRC, Cambridge) ; Dr Willasch (Siemens AG) ; Dr Swift (Unilever). Conference Secretary: K Anderson, AEI, Scientific Apparatus Division, Barton Dock Road, Urmston, Manchester. Microanalytical Techniques The Electron Microscopy and Analysis Group of The Institute of Physics is arranging a conference on Microanalytical techniques to be held at the University of Liverpool on 22-24 September 1976. There are now a considerable number of physical techniques capable of providing analysis from small areas of a specimen (less than 20/~m in diameter and the object of this meeting is to bring together workers using these different techniques. The emphasis of the meeting will be on recent developments and on quantitative analysis. Techniques to be covered will include X-ray microanalysis in both the SEM and the TEM, auger emission spectroscopy, transmission energy loss analysis, imaging secondary ion mass spectroscopy, proton and other nuclear micro-beam techniques. It is planned to have a number of invited papers reviewing the current state of the various techniques in addition to contributed papers. Enquiries about contributions should be addressed to the Conference Secretary, Dr H E Bishop, Materials Development Division, Building 338.4, AERE Harwell, Didcot, Oxon OX11 0RA. Further details will be available in the spring of 1976 from the Meetings Officer ,The Institute of Physics, 47 Belgrave Square, London SW1X 8QX.
The four major sessions of the conference will be introduced by papers from invited speakers and it is hoped that these and the contributed papers will stimulate discussion and the exchange of views and ideas between the designers, users and manufacturers of instrumentation attending.
The Fourth Symposium
One major session will deal with the offshore and marine environments which are currently of such great interest, while other sessions will include papers on humid and corrosive environments, space, extremes of temperature, high radiation fluxes (nuclear and e-m), dusty and flammable conditions, shock and vibration.
Scope:
Offers of contributions should be sent to the Conference Secretary: J Knight, Royal Aircraft Establishment, Bramshot Golf House, Fleet, Aldershot, Hants, UK, not later than 1 July 1976 and should include an outline of 300-500 words which will be reproduced in the Conference Handbook. The full proceedings of the conference will be published and issued to all those attending at a later date.
In vited speakem:
Further details of the conference programme and registration forms will be available in due course from : The Meetings Officer, The Institute of Physics, 47 Belgrave Square, London SW1X 8QX.
Advisory board:
E l e c t r o n M i c r o s c o p y and A n a l y s i s G r o u p o f t h e I n s t i t u t e o f Physics One day meeting on Scanning Transmission Electron Microscopy, 5 May 1976, Imperial College, London. 118
on Physics and Chemistry of Surfaces. Organized by the Netherlands Vacuum Society, NEVAC. To be held at the University of Technology, Eindhoven, The Netherlands on 23-25 June 1976. The relationships between the geometrical structure, the electronic properties and the chemical composition of surfaces. Interaction of neutral and charged particles with well-defined surfaces, the emphasis being on phenomena rather than on experimental methods. A Blandin, University of Paris-Sud, Orsay ; A L Boers, University of Groningen, Groningen; G Ehrlich, University of Illinois, Urbana-Champaign ; R W Joyner, University of Bradford, Bradford; T E Madey, National Bureau of Standards, Washington DC; W M~nch, University of Duisburg, Duisburg; J C Phillips, Bell Laboratories, Murray Hill. R Castaing, University of Paris-Sud, Orsay; H D Hagstrum, Bell Laboratories, Murray Hill; R Haul, University of Technology, Hannover; J W Linnett, University of Cambridge, Cambridge; A Venema, Phillips Research Laboratories, Eindhoven.
Paper selection committee: M J Sparnaay, Chairman, Philips Research Laboratories, Eindhoven ; A Benninghoven, University of Munster, Munster;