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International Society for Hybrid Microelectronics
Mwroelearonics and Reliabzhty
Pergamon Press 1973. Vol. 12, pp. 263-267.
Printed m Great Britain
NOTICES AND CALLS FOR PAPERS THE T H I R D SYMPOSIUM ON RELIABILITY IN ELECTRONICS--BUDAPEST PLEASEnote change of date to 13-16 November 1973 m place of 30 October-2 November as previously given. It will be held m the Bmlding of the Hungarian Academy of Sciences, 1051 Budapest, Roosevelt ter 9.
Scientific programme Papers will be presented in the following areas of reliability: Reliabihty theory Reliability of integrated circuits, electronic and electromechanical components System reliability. The Organizing Committee has accepted more than 80 papers for presentation. In the course of the Symposium subjects of special importance will be discussed in round table talks. The detailed schedule of the Symposium will be published in the Third Circular in October 1973.
Presentation of papers The presentation of papers with an average length of 20 min is envisaged. The lectures will be presented in one of the official languages without simultaneous interpretation. For the discussions interpreters will be at the participants' disposal. Registration Registration fee is U.S. $45, including handling charges, the preprints of the Symposium and an entrance ticket to the Cocktail Party. Registration fee may be transferred to the Symposium account: MNB 232-90171-2494/MTESZ-HTE Relectromc '73, Budapest; or can be paid personally at the registration. The address for all enquiries is as follows: Scientific Society for Telecommunication Organizing Committee of the Symposium on Reliabdlty in Electronics 1372 Budapest Pf. 451 Telephone: 113-027 Telex: 225792 MTESZ/Relectronic '73 Cable address: Relectronic '73 Budapest.
1974 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM Biltmore Hotel, Los Angeles, California 29-31 January 1974 Theme: "New Dimensions in Assurance Technologies" ASSURANCE technologies have developed over the years with the prime objective of helping to solve national problems. From the early concern for the reliablhty of military electronic equipment, the 263
Pergamon Press 1973. Vol. 12, pp. 263-267.
Printed m Great Britain
NOTICES AND CALLS FOR PAPERS THE T H I R D SYMPOSIUM ON RELIABILITY IN ELECTRONICS--BUDAPEST PLEASEnote change of date to 13-16 November 1973 m place of 30 October-2 November as previously given. It will be held m the Bmlding of the Hungarian Academy of Sciences, 1051 Budapest, Roosevelt ter 9.
Scientific programme Papers will be presented in the following areas of reliability: Reliabihty theory Reliability of integrated circuits, electronic and electromechanical components System reliability. The Organizing Committee has accepted more than 80 papers for presentation. In the course of the Symposium subjects of special importance will be discussed in round table talks. The detailed schedule of the Symposium will be published in the Third Circular in October 1973.
Presentation of papers The presentation of papers with an average length of 20 min is envisaged. The lectures will be presented in one of the official languages without simultaneous interpretation. For the discussions interpreters will be at the participants' disposal. Registration Registration fee is U.S. $45, including handling charges, the preprints of the Symposium and an entrance ticket to the Cocktail Party. Registration fee may be transferred to the Symposium account: MNB 232-90171-2494/MTESZ-HTE Relectromc '73, Budapest; or can be paid personally at the registration. The address for all enquiries is as follows: Scientific Society for Telecommunication Organizing Committee of the Symposium on Reliabdlty in Electronics 1372 Budapest Pf. 451 Telephone: 113-027 Telex: 225792 MTESZ/Relectronic '73 Cable address: Relectronic '73 Budapest.
1974 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM Biltmore Hotel, Los Angeles, California 29-31 January 1974 Theme: "New Dimensions in Assurance Technologies" ASSURANCE technologies have developed over the years with the prime objective of helping to solve national problems. From the early concern for the reliablhty of military electronic equipment, the 263