Temperature-tolerant DC converters

Temperature-tolerant DC converters DC-to-DC converters designed to operate in temperatures up to 70'~C without derating are being manufactured by Swiss company Fabrimex. The DC Series consists of low-profile (10 mm) 6 W converters which incorporate ~T filters and provide 500 V DC input-to-output isolation. The converters are housed in shielded metal cases (51 m m . i 51 mm) to reduce radiated radiofrequency interference. They are available for 5, 12, 24 or 48 V nominal inputs and 5, 12, 15, _+ 12 or _+ 15 V nominal outputs. (Fabrimex AG, Kirchenweg 5, CH-8032 Zurich, Switzerland. UK distributor: Powerline Electronics Ltd, 5 Nimrod Way, Elgar Road, Reading, Berks RG20EB, UK. Tel: (0734) 868567)

Cartridge controller is Q-bus compatiMe The MSV05 is a 0.25 in cartridge controller made by US company Micro Technology. Designed for true compatibility with the DEC Qbus, the controller supports 22-bit addressing. It also has an extended mode of operation compatible with streaming drives. The MSV05 can store and retrieve 45 Mbyte of data in just over 9 min, claim the manufacturers. This involves using a QIC02 cartridge tape drive interface, the DEC standard backup utility (BUP) under RS-11, and backup and restore utility (BRU) under RSXl 1 M. DEC control is built into the MSV05 hardware; no software patches are required for TSVO5 emulation, says Micro Technology, and the controller can also run DEC diagnostics. The device includes a 16 kbyte buffer and block-mode DMA with an enhanced data path. (Micro Technology Inc., 1620 Miraloma Avenue, Placentia, CA 92670, USA. UK distributor: Unit-C Ltd, Dominion Way West, Broadwater, Worthing, Sussex BN`14 8NT, UK. Tel: (0903) 205233)

Logic mmlyser is dodgnel for 10 ns r e i n Gould has launched a series of logic analysers which, says the company, makes it unnecessary to compromise between number of channels and bandwidth in tests on high-speed digital systems. The K205 logic analyser is available as either a 3 2 - o r 48-channel unit with optional disc storage. According to Gould, the instrument provides 10ns resolution on all channels, making it suitable for solving design problems involving high-speed devices such as bit-slice microprocessors, emitter-coupled logic circuits, gate arrays and discrete logic systems. The K205 has 16 independent triggering decision levels with four commands in each level. Up to four decisions may be made during each 20 ns period, allowing difficult logic problems to be located by selectively triggering on a unique event. Gould claims that the triggering technique employed, known as Trace Control, is 150% faster than any comparable selection scheme. The K205's tolerance-compare

I(205 logic analyser

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function allows high-speed analysis of logic circuits by comparing timing sequences with stored references, to eliminate the sampling-error differences inherem. in asynchronous analysis. Reference data can be ~tored automaticall~ via an t/O port, either by testing e known good circuit or by stofingthe manually edited result o~: ar~ incorrect circ~it, Also incorporated are: a glitchmode feature, which displays transient noise on all channels for rapid identification of race or noise problems; a latching scheme, which maintains full channel width and memory depth when the instrument is ir~ the glitch mode; thre(, separate measurement input sec-tions, each with selectable internal o~ external clocking; and a 'help' key~ A number of peripherals are available for the K205, including disc subsystems, remote diagnostic communicators, and disassembiers. (Go~,'!d Electronics Ltd, Roebuck Road, Hainault, /Iford, Essex IG6 3U~, UK. Tel: 0"1.500 1000!